Extended focused image in white light scanning interference microscopy
We propose a method to obtain a fringe-free extended focused image in white light scanning interference microscopy based on processing the stack of images over a range within the coherence length of the source. © 2019 The Author(s).
- Autores:
-
Altamar-Mercado, Hernando
Patiño-Vanegas, Alberto
Marrugo, Andrés G.
- Tipo de recurso:
- Fecha de publicación:
- 2019
- Institución:
- Universidad Tecnológica de Bolívar
- Repositorio:
- Repositorio Institucional UTB
- Idioma:
- eng
- OAI Identifier:
- oai:repositorio.utb.edu.co:20.500.12585/12241
- Acceso en línea:
- https://hdl.handle.net/20.500.12585/12241
- Palabra clave:
- Interferometry;
Interference Microscopy;
Surface Topography
LEMB
- Rights
- openAccess
- License
- http://creativecommons.org/licenses/by-nc-nd/4.0/
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| dc.title.spa.fl_str_mv |
Extended focused image in white light scanning interference microscopy |
| title |
Extended focused image in white light scanning interference microscopy |
| spellingShingle |
Extended focused image in white light scanning interference microscopy Interferometry; Interference Microscopy; Surface Topography LEMB |
| title_short |
Extended focused image in white light scanning interference microscopy |
| title_full |
Extended focused image in white light scanning interference microscopy |
| title_fullStr |
Extended focused image in white light scanning interference microscopy |
| title_full_unstemmed |
Extended focused image in white light scanning interference microscopy |
| title_sort |
Extended focused image in white light scanning interference microscopy |
| dc.creator.fl_str_mv |
Altamar-Mercado, Hernando Patiño-Vanegas, Alberto Marrugo, Andrés G. |
| dc.contributor.author.none.fl_str_mv |
Altamar-Mercado, Hernando Patiño-Vanegas, Alberto Marrugo, Andrés G. |
| dc.subject.keywords.spa.fl_str_mv |
Interferometry; Interference Microscopy; Surface Topography |
| topic |
Interferometry; Interference Microscopy; Surface Topography LEMB |
| dc.subject.armarc.none.fl_str_mv |
LEMB |
| description |
We propose a method to obtain a fringe-free extended focused image in white light scanning interference microscopy based on processing the stack of images over a range within the coherence length of the source. © 2019 The Author(s). |
| publishDate |
2019 |
| dc.date.issued.none.fl_str_mv |
2019 |
| dc.date.accessioned.none.fl_str_mv |
2023-07-19T21:26:04Z |
| dc.date.available.none.fl_str_mv |
2023-07-19T21:26:04Z |
| dc.date.submitted.none.fl_str_mv |
2023 |
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| dc.identifier.citation.spa.fl_str_mv |
Altamar-Mercado, H., Patiño-Vanegas, A., & Marrugo, A. G. (2019, June). Extended focused image in white light scanning interference microscopy. In Imaging Systems and Applications (pp. ITh1C-3). Optica Publishing Group. |
| dc.identifier.uri.none.fl_str_mv |
https://hdl.handle.net/20.500.12585/12241 |
| dc.identifier.doi.none.fl_str_mv |
Altamar-Mercado, H., Patiño-Vanegas, A., & Marrugo, A. G. (2019, June). Extended focused image in white light scanning interference microscopy. In Imaging Systems and Applications (pp. ITh1C-3). Optica Publishing Group. |
| dc.identifier.instname.spa.fl_str_mv |
Universidad Tecnológica de Bolívar |
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Repositorio Universidad Tecnológica de Bolívar |
| identifier_str_mv |
Altamar-Mercado, H., Patiño-Vanegas, A., & Marrugo, A. G. (2019, June). Extended focused image in white light scanning interference microscopy. In Imaging Systems and Applications (pp. ITh1C-3). Optica Publishing Group. Universidad Tecnológica de Bolívar Repositorio Universidad Tecnológica de Bolívar |
| url |
https://hdl.handle.net/20.500.12585/12241 |
| dc.language.iso.spa.fl_str_mv |
eng |
| language |
eng |
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info:eu-repo/semantics/openAccess |
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Attribution-NonCommercial-NoDerivatives 4.0 Internacional |
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http://creativecommons.org/licenses/by-nc-nd/4.0/ Attribution-NonCommercial-NoDerivatives 4.0 Internacional http://purl.org/coar/access_right/c_abf2 |
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openAccess |
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application/pdf |
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Cartagena de Indias |
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Optics InfoBase Conference Papers |
| institution |
Universidad Tecnológica de Bolívar |
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Altamar-Mercado, Hernando751d5a9b-eb39-4733-81d6-7d5eb0368195Patiño-Vanegas, Albertoed3ee444-6afd-4230-9ab9-5b0212fa21e6Marrugo, Andrés G.00746131-f46c-4d8c-9c02-514385d7b36e2023-07-19T21:26:04Z2023-07-19T21:26:04Z20192023Altamar-Mercado, H., Patiño-Vanegas, A., & Marrugo, A. G. (2019, June). Extended focused image in white light scanning interference microscopy. In Imaging Systems and Applications (pp. ITh1C-3). Optica Publishing Group.https://hdl.handle.net/20.500.12585/12241Altamar-Mercado, H., Patiño-Vanegas, A., & Marrugo, A. G. (2019, June). Extended focused image in white light scanning interference microscopy. In Imaging Systems and Applications (pp. ITh1C-3). Optica Publishing Group.Universidad Tecnológica de BolívarRepositorio Universidad Tecnológica de BolívarWe propose a method to obtain a fringe-free extended focused image in white light scanning interference microscopy based on processing the stack of images over a range within the coherence length of the source. © 2019 The Author(s).application/pdfenghttp://creativecommons.org/licenses/by-nc-nd/4.0/info:eu-repo/semantics/openAccessAttribution-NonCommercial-NoDerivatives 4.0 Internacionalhttp://purl.org/coar/access_right/c_abf2Optics InfoBase Conference PapersExtended focused image in white light scanning interference microscopyinfo:eu-repo/semantics/articleinfo:eu-repo/semantics/drafthttp://purl.org/coar/resource_type/c_6501http://purl.org/coar/version/c_b1a7d7d4d402bccehttp://purl.org/coar/resource_type/c_2df8fbb1Interferometry;Interference Microscopy;Surface TopographyLEMBCartagena de IndiasAltamar-Mercado, H., Patiño-Vanegas, A., Marrugo, A.G. Robust 3D surface recovery by applying a focus criterion in white light scanning interference microscopy (2019) Applied Optics, 58 (5), pp. A101-A111. Cited 10 times. https://www.osapublishing.org/ao/abstract.cfm?uri=ao-58-5-A101 doi: 10.1364/AO.58.00A101Altamar-Mercado, H., Patiño-Vanegas, A., Marrugo, A.G. Adaptive filtering of interference fringes by polar transformation and empirical mode decomposition (2018) Optics InfoBase Conference Papers, Part F123-LAOP 2018. ISBN: 978-194358049-1 doi: 10.1364/LAOP.2018.W4C.4Wang, Z., Bovik, A.C. A universal image quality index (Open Access) (2002) IEEE Signal Processing Letters, 9 (3), pp. 81-84. 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