Extended focused image in white light scanning interference microscopy
We propose a method to obtain a fringe-free extended focused image in white light scanning interference microscopy based on processing the stack of images over a range within the coherence length of the source. © 2019 The Author(s).
- Autores:
-
Altamar-Mercado, Hernando
Patiño-Vanegas, Alberto
Marrugo, Andrés G.
- Tipo de recurso:
- Fecha de publicación:
- 2019
- Institución:
- Universidad Tecnológica de Bolívar
- Repositorio:
- Repositorio Institucional UTB
- Idioma:
- eng
- OAI Identifier:
- oai:repositorio.utb.edu.co:20.500.12585/12241
- Acceso en línea:
- https://hdl.handle.net/20.500.12585/12241
- Palabra clave:
- Interferometry;
Interference Microscopy;
Surface Topography
LEMB
- Rights
- openAccess
- License
- http://creativecommons.org/licenses/by-nc-nd/4.0/