Physical-aware pattern selection for stuck-at faults
The stuck-at faults are basic faults that fail the chips. Various defects in the circuit can develop into stuck-at faults. To detect more defects caused by stuck-at faults, some of the fault sites may need to be detected multiple times. Thus, the existing pattern generation techniques provide N-dete...
- Autores:
- Tipo de recurso:
- Fecha de publicación:
- 2017
- Institución:
- Universidad Tecnológica de Bolívar
- Repositorio:
- Repositorio Institucional UTB
- Idioma:
- eng
- OAI Identifier:
- oai:repositorio.utb.edu.co:20.500.12585/8935
- Acceso en línea:
- https://hdl.handle.net/20.500.12585/8935
- Palabra clave:
- Defects
Testing
Basic faults
Characteristics of defect
Defect detection
Detecting defects
Pattern Generation
Pattern selection
Stuck-at faults
Test pattern selections
Fault detection
- Rights
- restrictedAccess
- License
- http://creativecommons.org/licenses/by-nc-nd/4.0/