Measuring material thickness variations through tri-aperture DSPI
A configuration for the measurement of thickness changes in materials through one-shot digital speckle pattern interferometry (DSPI) was developed. The phase maps calculation was made by adding carrier fringes by the multiple aperture principle and Fourier Transform Method (FTM). With this setup, in...
- Autores:
-
Sanchez Barrera, Estiven
Ealo Cuello, Joao Luis
- Tipo de recurso:
- Fecha de publicación:
- 2023
- Institución:
- Universidad Tecnológica de Bolívar
- Repositorio:
- Repositorio Institucional UTB
- Idioma:
- eng
- OAI Identifier:
- oai:repositorio.utb.edu.co:20.500.12585/12091
- Acceso en línea:
- https://hdl.handle.net/20.500.12585/12091
- Palabra clave:
- DSPI
Carrier Fringes
Fourier Transform Method
Multiple Aperture
Thickness Variations.
LEMB
- Rights
- restrictedAccess
- License
- http://purl.org/coar/access_right/c_16ec
| id |
UTB2_84ceb9448fe873f36cfd38d9b3e91b77 |
|---|---|
| oai_identifier_str |
oai:repositorio.utb.edu.co:20.500.12585/12091 |
| network_acronym_str |
UTB2 |
| network_name_str |
Repositorio Institucional UTB |
| repository_id_str |
|
| dc.title.spa.fl_str_mv |
Measuring material thickness variations through tri-aperture DSPI |
| title |
Measuring material thickness variations through tri-aperture DSPI |
| spellingShingle |
Measuring material thickness variations through tri-aperture DSPI DSPI Carrier Fringes Fourier Transform Method Multiple Aperture Thickness Variations. LEMB |
| title_short |
Measuring material thickness variations through tri-aperture DSPI |
| title_full |
Measuring material thickness variations through tri-aperture DSPI |
| title_fullStr |
Measuring material thickness variations through tri-aperture DSPI |
| title_full_unstemmed |
Measuring material thickness variations through tri-aperture DSPI |
| title_sort |
Measuring material thickness variations through tri-aperture DSPI |
| dc.creator.fl_str_mv |
Sanchez Barrera, Estiven Ealo Cuello, Joao Luis |
| dc.contributor.author.none.fl_str_mv |
Sanchez Barrera, Estiven Ealo Cuello, Joao Luis |
| dc.subject.keywords.spa.fl_str_mv |
DSPI Carrier Fringes Fourier Transform Method Multiple Aperture Thickness Variations. |
| topic |
DSPI Carrier Fringes Fourier Transform Method Multiple Aperture Thickness Variations. LEMB |
| dc.subject.armarc.none.fl_str_mv |
LEMB |
| description |
A configuration for the measurement of thickness changes in materials through one-shot digital speckle pattern interferometry (DSPI) was developed. The phase maps calculation was made by adding carrier fringes by the multiple aperture principle and Fourier Transform Method (FTM). With this setup, interferometry configurations verified that the simultaneous and instantaneous visualization of two opposite faces of a surface is possible. In addition, the combination of the simultaneous results obtained from both sides of the material makes it possible to determine displacements with greater sensitivity or to identify changes in their thickness. The validation and demonstrative tests were carried out with a 1-mm thick aluminum plate with a 5-mm diameter through hole coated. Thickness changes until 2 μm was measured. |
| publishDate |
2023 |
| dc.date.accessioned.none.fl_str_mv |
2023-06-30T18:43:43Z |
| dc.date.available.none.fl_str_mv |
2023-06-30T18:43:43Z |
| dc.date.issued.none.fl_str_mv |
2023-06-15 |
| dc.date.submitted.none.fl_str_mv |
2023-06-30 |
| dc.type.coarversion.fl_str_mv |
http://purl.org/coar/version/c_970fb48d4fbd8a85 |
| dc.type.driver.spa.fl_str_mv |
info:eu-repo/semantics/article |
| dc.type.hasversion.spa.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
| dc.type.spa.spa.fl_str_mv |
http://purl.org/coar/resource_type/c_2df8fbb1 |
| status_str |
publishedVersion |
| dc.identifier.citation.spa.fl_str_mv |
Estiven Sánchez Barrera and Joao Luis Ealo Cuello "Measuring material thickness variations through tri-aperture DSPI", Proc. SPIE 12524, Dimensional Optical Metrology and Inspection for Practical Applications XII , 125240C (15 June 2023); https://doi.org/10.1117/12.2663667 |
| dc.identifier.uri.none.fl_str_mv |
https://hdl.handle.net/20.500.12585/12091 |
| dc.identifier.doi.none.fl_str_mv |
10.1117/12.2663667 |
| dc.identifier.instname.spa.fl_str_mv |
Universidad Tecnológica de Bolívar |
| dc.identifier.reponame.spa.fl_str_mv |
Repositorio Universidad Tecnológica de Bolívar |
| identifier_str_mv |
Estiven Sánchez Barrera and Joao Luis Ealo Cuello "Measuring material thickness variations through tri-aperture DSPI", Proc. SPIE 12524, Dimensional Optical Metrology and Inspection for Practical Applications XII , 125240C (15 June 2023); https://doi.org/10.1117/12.2663667 10.1117/12.2663667 Universidad Tecnológica de Bolívar Repositorio Universidad Tecnológica de Bolívar |
| url |
https://hdl.handle.net/20.500.12585/12091 |
| dc.language.iso.spa.fl_str_mv |
eng |
| language |
eng |
| dc.rights.coar.fl_str_mv |
http://purl.org/coar/access_right/c_16ec |
| dc.rights.accessrights.spa.fl_str_mv |
info:eu-repo/semantics/restrictedAccess |
| eu_rights_str_mv |
restrictedAccess |
| rights_invalid_str_mv |
http://purl.org/coar/access_right/c_16ec |
| dc.format.extent.none.fl_str_mv |
9 |
| dc.format.mimetype.spa.fl_str_mv |
application/pdf |
| dc.publisher.place.spa.fl_str_mv |
Cartagena de Indias |
| dc.publisher.sede.spa.fl_str_mv |
Campus Tecnológico |
| dc.source.spa.fl_str_mv |
Proceedings of SPIE, the International Society for Optical Engineering. |
| institution |
Universidad Tecnológica de Bolívar |
| bitstream.url.fl_str_mv |
https://repositorio.utb.edu.co/bitstream/20.500.12585/12091/1/125240C.pdf https://repositorio.utb.edu.co/bitstream/20.500.12585/12091/2/license.txt https://repositorio.utb.edu.co/bitstream/20.500.12585/12091/3/125240C.pdf.txt https://repositorio.utb.edu.co/bitstream/20.500.12585/12091/4/125240C.pdf.jpg |
| bitstream.checksum.fl_str_mv |
8c17b478d1d10bdb8c60ec2c1b359145 e20ad307a1c5f3f25af9304a7a7c86b6 86816baa34cc64adc2156a2875c55d25 36bc7feaf8071c7cea35476b30908b58 |
| bitstream.checksumAlgorithm.fl_str_mv |
MD5 MD5 MD5 MD5 |
| repository.name.fl_str_mv |
Repositorio Institucional UTB |
| repository.mail.fl_str_mv |
repositorioutb@utb.edu.co |
| _version_ |
1808397617709711360 |
| spelling |
Sanchez Barrera, Estiven14739caf-52a7-40df-8087-9dfc3ed54b58Ealo Cuello, Joao Luis2b294d78-0375-4f1b-98d7-447243ee1d5d2023-06-30T18:43:43Z2023-06-30T18:43:43Z2023-06-152023-06-30Estiven Sánchez Barrera and Joao Luis Ealo Cuello "Measuring material thickness variations through tri-aperture DSPI", Proc. SPIE 12524, Dimensional Optical Metrology and Inspection for Practical Applications XII , 125240C (15 June 2023); https://doi.org/10.1117/12.2663667https://hdl.handle.net/20.500.12585/1209110.1117/12.2663667Universidad Tecnológica de BolívarRepositorio Universidad Tecnológica de BolívarA configuration for the measurement of thickness changes in materials through one-shot digital speckle pattern interferometry (DSPI) was developed. The phase maps calculation was made by adding carrier fringes by the multiple aperture principle and Fourier Transform Method (FTM). With this setup, interferometry configurations verified that the simultaneous and instantaneous visualization of two opposite faces of a surface is possible. In addition, the combination of the simultaneous results obtained from both sides of the material makes it possible to determine displacements with greater sensitivity or to identify changes in their thickness. The validation and demonstrative tests were carried out with a 1-mm thick aluminum plate with a 5-mm diameter through hole coated. Thickness changes until 2 μm was measured.Universidad Tecnológica de Bolívar9application/pdfengProceedings of SPIE, the International Society for Optical Engineering.Measuring material thickness variations through tri-aperture DSPIinfo:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionhttp://purl.org/coar/resource_type/c_2df8fbb1http://purl.org/coar/version/c_970fb48d4fbd8a85DSPICarrier FringesFourier Transform MethodMultiple ApertureThickness Variations.LEMBinfo:eu-repo/semantics/restrictedAccesshttp://purl.org/coar/access_right/c_16ecCartagena de IndiasCampus TecnológicoPúblico generalM. P. Georges, C. Thizy, F. Languy, and J.-F. Vandenrijt, “An overview of interferometric metrology and NDT techniques and applications for the aerospace industry,” SPIE Proceedings, Aug 2016M. P. Georges, C. Thizy, F. Languy, and J.-F. Vandenrijt, “An overview of interferometric metrology and NDT techniques and applications for the aerospace industry,” SPIE Proceedings, Aug 2016M. R. Viotti and A. Albertazzi, Robust speckle metrology: techniques for stress analysis and NDT. Spie Press, 2014. https://doi.org/10.1117/3.1002651M. R. Viotti and A. Albertazzi, Robust speckle metrology: techniques for stress analysis and NDT. Spie Press, 2014. https://doi.org/10.1117/3.1002651P. de Groot, Phase Shifting Interferometry. Berlin, Heidelberg: Springer Berlin Heidelberg, 2011, pp. 167–186.P. de Groot, Phase Shifting Interferometry. Berlin, Heidelberg: Springer Berlin Heidelberg, 2011, pp. 167–186.J. Wyant, “Interferometry — overview,” in Encyclopedia of Modern Optics, R. D. Guenther, Ed. Oxford: Elsevier, 2005, pp. 351–356. https://doi.org/10.1016/B0-12-369395-0/00693-X Google ScholarK. Creath and J. Schmit, “N-point spatial phase-measurement techniques for non-destructive testing,” Optics and Lasers in Engineering, vol. 24, no. 5-6, p. 365–379, May 1996. https://doi.org/10.1016/0143-8166(95)00096-8 Google ScholarK. Creath and G. Goldstein, “Dynamic quantitative phase imaging for biological objects using a pixelated phase mask,” Biomedical Optics Express, vol. 3, no. 11, p. 2866, Oct 2012. https://doi.org/10.1364/BOE.3.002866 Google ScholarM. Takeda, H. Ina, and S. Kobayashi, “Fourier-transform method of fringe-pattern analysis for computer- based topography and interferometry,” Journal of the Optical Society of America, vol. 72, no. 1, p. 156, Jan 1982. https://doi.org/10.1364/JOSA.72.000156 Google ScholarB. Bhaduri, “Direct measurement of curvature and twist using two-channel double-aperture digital shearography,” Optical Engineering, vol. 49, no. 3, p. 033604, Mar 2010. https://doi.org/10.1117/1.3359470 Google ScholarE. S. Barrera, A. V. Fantin, D. P. Willemann, M. E. Benedet, and A. Albertazzi Gonçalves Jr., “Multiple-aperture one-shot shearography for simultaneous measurements in three shearing directions,” Optics and Lasers in Engineering, vol. 111, no. 0143-8166, p. 86–92, Dec 2018. https://doi.org/10.1016/j.optlaseng.2018.07.018 Google ScholarE. S. Barrera, J. L. Ealo, “Measuring material thickness changes through tri-aperture digital speckle pattern interferometry,” Opt. Eng. 62(1) 014108, 31 January 2023. https://doi.org/10.1117/1.OE.62.1.014108 Google ScholarB. Bhaduri, N. K. Mohan, M. P. Kothiyal, and R. S. Sirohi, “Use of spatial phase shifting technique in digital speckle pattern interferometry (DSPI) and Digital Shearography (DS),” Optics Express, vol. 14, no. 24, p. 11598, Nov 2006. https://doi.org/10.1364/OE.14.011598 Google ScholarG.-W. Chang, Y.-H. Lin, and Z.-M. Yeh, “White light interferometric profile measurement system using spectral coherence,” in Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS VI, A. L. Hartzell, and R. Ramesham, Eds., vol. 6463, International Society for Optics and Photonics. SPIE, 2007, pp. 164 – 174. Google Scholarhttp://purl.org/coar/resource_type/c_c94fORIGINAL125240C.pdf125240C.pdfArtículo principalapplication/pdf587693https://repositorio.utb.edu.co/bitstream/20.500.12585/12091/1/125240C.pdf8c17b478d1d10bdb8c60ec2c1b359145MD51LICENSElicense.txtlicense.txttext/plain; charset=utf-83182https://repositorio.utb.edu.co/bitstream/20.500.12585/12091/2/license.txte20ad307a1c5f3f25af9304a7a7c86b6MD52TEXT125240C.pdf.txt125240C.pdf.txtExtracted texttext/plain21610https://repositorio.utb.edu.co/bitstream/20.500.12585/12091/3/125240C.pdf.txt86816baa34cc64adc2156a2875c55d25MD53THUMBNAIL125240C.pdf.jpg125240C.pdf.jpgGenerated Thumbnailimage/jpeg5506https://repositorio.utb.edu.co/bitstream/20.500.12585/12091/4/125240C.pdf.jpg36bc7feaf8071c7cea35476b30908b58MD5420.500.12585/12091oai:repositorio.utb.edu.co:20.500.12585/120912023-07-01 00:17:56.11Repositorio Institucional UTBrepositorioutb@utb.edu.coQXV0b3Jpem8gKGF1dG9yaXphbW9zKSBhIGxhIEJpYmxpb3RlY2EgZGUgbGEgSW5zdGl0dWNpw7NuIHBhcmEgcXVlIGluY2x1eWEgdW5hIGNvcGlhLCBpbmRleGUgeSBkaXZ1bGd1ZSBlbiBlbCBSZXBvc2l0b3JpbyBJbnN0aXR1Y2lvbmFsLCBsYSBvYnJhIG1lbmNpb25hZGEgY29uIGVsIGZpbiBkZSBmYWNpbGl0YXIgbG9zIHByb2Nlc29zIGRlIHZpc2liaWxpZGFkIGUgaW1wYWN0byBkZSBsYSBtaXNtYSwgY29uZm9ybWUgYSBsb3MgZGVyZWNob3MgcGF0cmltb25pYWxlcyBxdWUgbWUobm9zKSBjb3JyZXNwb25kZShuKSB5IHF1ZSBpbmNsdXllbjogbGEgcmVwcm9kdWNjacOzbiwgY29tdW5pY2FjacOzbiBww7pibGljYSwgZGlzdHJpYnVjacOzbiBhbCBww7pibGljbywgdHJhbnNmb3JtYWNpw7NuLCBkZSBjb25mb3JtaWRhZCBjb24gbGEgbm9ybWF0aXZpZGFkIHZpZ2VudGUgc29icmUgZGVyZWNob3MgZGUgYXV0b3IgeSBkZXJlY2hvcyBjb25leG9zIHJlZmVyaWRvcyBlbiBhcnQuIDIsIDEyLCAzMCAobW9kaWZpY2FkbyBwb3IgZWwgYXJ0IDUgZGUgbGEgbGV5IDE1MjAvMjAxMiksIHkgNzIgZGUgbGEgbGV5IDIzIGRlIGRlIDE5ODIsIExleSA0NCBkZSAxOTkzLCBhcnQuIDQgeSAxMSBEZWNpc2nDs24gQW5kaW5hIDM1MSBkZSAxOTkzIGFydC4gMTEsIERlY3JldG8gNDYwIGRlIDE5OTUsIENpcmN1bGFyIE5vIDA2LzIwMDIgZGUgbGEgRGlyZWNjacOzbiBOYWNpb25hbCBkZSBEZXJlY2hvcyBkZSBhdXRvciwgYXJ0LiAxNSBMZXkgMTUyMCBkZSAyMDEyLCBsYSBMZXkgMTkxNSBkZSAyMDE4IHkgZGVtw6FzIG5vcm1hcyBzb2JyZSBsYSBtYXRlcmlhLgoKQWwgcmVzcGVjdG8gY29tbyBBdXRvcihlcykgbWFuaWZlc3RhbW9zIGNvbm9jZXIgcXVlOgoKLSBMYSBhdXRvcml6YWNpw7NuIGVzIGRlIGNhcsOhY3RlciBubyBleGNsdXNpdmEgeSBsaW1pdGFkYSwgZXN0byBpbXBsaWNhIHF1ZSBsYSBsaWNlbmNpYSB0aWVuZSB1bmEgdmlnZW5jaWEsIHF1ZSBubyBlcyBwZXJwZXR1YSB5IHF1ZSBlbCBhdXRvciBwdWVkZSBwdWJsaWNhciBvIGRpZnVuZGlyIHN1IG9icmEgZW4gY3VhbHF1aWVyIG90cm8gbWVkaW8sIGFzw60gY29tbyBsbGV2YXIgYSBjYWJvIGN1YWxxdWllciB0aXBvIGRlIGFjY2nDs24gc29icmUgZWwgZG9jdW1lbnRvLgoKLSBMYSBhdXRvcml6YWNpw7NuIHRlbmRyw6EgdW5hIHZpZ2VuY2lhIGRlIGNpbmNvIGHDsW9zIGEgcGFydGlyIGRlbCBtb21lbnRvIGRlIGxhIGluY2x1c2nDs24gZGUgbGEgb2JyYSBlbiBlbCByZXBvc2l0b3JpbywgcHJvcnJvZ2FibGUgaW5kZWZpbmlkYW1lbnRlIHBvciBlbCB0aWVtcG8gZGUgZHVyYWNpw7NuIGRlIGxvcyBkZXJlY2hvcyBwYXRyaW1vbmlhbGVzIGRlbCBhdXRvciB5IHBvZHLDoSBkYXJzZSBwb3IgdGVybWluYWRhIHVuYSB2ZXogZWwgYXV0b3IgbG8gbWFuaWZpZXN0ZSBwb3IgZXNjcml0byBhIGxhIGluc3RpdHVjacOzbiwgY29uIGxhIHNhbHZlZGFkIGRlIHF1ZSBsYSBvYnJhIGVzIGRpZnVuZGlkYSBnbG9iYWxtZW50ZSB5IGNvc2VjaGFkYSBwb3IgZGlmZXJlbnRlcyBidXNjYWRvcmVzIHkvbyByZXBvc2l0b3Jpb3MgZW4gSW50ZXJuZXQgbG8gcXVlIG5vIGdhcmFudGl6YSBxdWUgbGEgb2JyYSBwdWVkYSBzZXIgcmV0aXJhZGEgZGUgbWFuZXJhIGlubWVkaWF0YSBkZSBvdHJvcyBzaXN0ZW1hcyBkZSBpbmZvcm1hY2nDs24gZW4gbG9zIHF1ZSBzZSBoYXlhIGluZGV4YWRvLCBkaWZlcmVudGVzIGFsIHJlcG9zaXRvcmlvIGluc3RpdHVjaW9uYWwgZGUgbGEgSW5zdGl0dWNpw7NuLCBkZSBtYW5lcmEgcXVlIGVsIGF1dG9yKHJlcykgdGVuZHLDoW4gcXVlIHNvbGljaXRhciBsYSByZXRpcmFkYSBkZSBzdSBvYnJhIGRpcmVjdGFtZW50ZSBhIG90cm9zIHNpc3RlbWFzIGRlIGluZm9ybWFjacOzbiBkaXN0aW50b3MgYWwgZGUgbGEgSW5zdGl0dWNpw7NuIHNpIGRlc2VhIHF1ZSBzdSBvYnJhIHNlYSByZXRpcmFkYSBkZSBpbm1lZGlhdG8uCgotIExhIGF1dG9yaXphY2nDs24gZGUgcHVibGljYWNpw7NuIGNvbXByZW5kZSBlbCBmb3JtYXRvIG9yaWdpbmFsIGRlIGxhIG9icmEgeSB0b2RvcyBsb3MgZGVtw6FzIHF1ZSBzZSByZXF1aWVyYSBwYXJhIHN1IHB1YmxpY2FjacOzbiBlbiBlbCByZXBvc2l0b3Jpby4gSWd1YWxtZW50ZSwgbGEgYXV0b3JpemFjacOzbiBwZXJtaXRlIGEgbGEgaW5zdGl0dWNpw7NuIGVsIGNhbWJpbyBkZSBzb3BvcnRlIGRlIGxhIG9icmEgY29uIGZpbmVzIGRlIHByZXNlcnZhY2nDs24gKGltcHJlc28sIGVsZWN0csOzbmljbywgZGlnaXRhbCwgSW50ZXJuZXQsIGludHJhbmV0LCBvIGN1YWxxdWllciBvdHJvIGZvcm1hdG8gY29ub2NpZG8gbyBwb3IgY29ub2NlcikuCgotIExhIGF1dG9yaXphY2nDs24gZXMgZ3JhdHVpdGEgeSBzZSByZW51bmNpYSBhIHJlY2liaXIgY3VhbHF1aWVyIHJlbXVuZXJhY2nDs24gcG9yIGxvcyB1c29zIGRlIGxhIG9icmEsIGRlIGFjdWVyZG8gY29uIGxhIGxpY2VuY2lhIGVzdGFibGVjaWRhIGVuIGVzdGEgYXV0b3JpemFjacOzbi4KCi0gQWwgZmlybWFyIGVzdGEgYXV0b3JpemFjacOzbiwgc2UgbWFuaWZpZXN0YSBxdWUgbGEgb2JyYSBlcyBvcmlnaW5hbCB5IG5vIGV4aXN0ZSBlbiBlbGxhIG5pbmd1bmEgdmlvbGFjacOzbiBhIGxvcyBkZXJlY2hvcyBkZSBhdXRvciBkZSB0ZXJjZXJvcy4gRW4gY2FzbyBkZSBxdWUgZWwgdHJhYmFqbyBoYXlhIHNpZG8gZmluYW5jaWFkbyBwb3IgdGVyY2Vyb3MgZWwgbyBsb3MgYXV0b3JlcyBhc3VtZW4gbGEgcmVzcG9uc2FiaWxpZGFkIGRlbCBjdW1wbGltaWVudG8gZGUgbG9zIGFjdWVyZG9zIGVzdGFibGVjaWRvcyBzb2JyZSBsb3MgZGVyZWNob3MgcGF0cmltb25pYWxlcyBkZSBsYSBvYnJhIGNvbiBkaWNobyB0ZXJjZXJvLgoKLSBGcmVudGUgYSBjdWFscXVpZXIgcmVjbGFtYWNpw7NuIHBvciB0ZXJjZXJvcywgZWwgbyBsb3MgYXV0b3JlcyBzZXLDoW4gcmVzcG9uc2FibGVzLCBlbiBuaW5nw7puIGNhc28gbGEgcmVzcG9uc2FiaWxpZGFkIHNlcsOhIGFzdW1pZGEgcG9yIGxhIGluc3RpdHVjacOzbi4KCi0gQ29uIGxhIGF1dG9yaXphY2nDs24sIGxhIGluc3RpdHVjacOzbiBwdWVkZSBkaWZ1bmRpciBsYSBvYnJhIGVuIMOtbmRpY2VzLCBidXNjYWRvcmVzIHkgb3Ryb3Mgc2lzdGVtYXMgZGUgaW5mb3JtYWNpw7NuIHF1ZSBmYXZvcmV6Y2FuIHN1IHZpc2liaWxpZGFkCgo= |