Measuring material thickness variations through tri-aperture DSPI

A configuration for the measurement of thickness changes in materials through one-shot digital speckle pattern interferometry (DSPI) was developed. The phase maps calculation was made by adding carrier fringes by the multiple aperture principle and Fourier Transform Method (FTM). With this setup, in...

Full description

Autores:

Sanchez Barrera, Estiven
Ealo Cuello, Joao Luis

Tipo de recurso:

Fecha de publicación:

2023

Institución:

Universidad Tecnológica de Bolívar

Repositorio:

Repositorio Institucional UTB

Idioma:

eng

OAI Identifier:

oai:repositorio.utb.edu.co:20.500.12585/12091

Acceso en línea:

https://hdl.handle.net/20.500.12585/12091

Palabra clave:

DSPI
Carrier Fringes
Fourier Transform Method
Multiple Aperture
Thickness Variations.
LEMB

Rights

restrictedAccess

License

http://purl.org/coar/access_right/c_16ec