On the computation of LFSR characteristic polynomials for built-in deterministic test pattern generation

In built-in test pattern generation and test set compression, an LFSR is usually employed as the on-chip generator with an arbitrarily selected characteristic polynomial of degree equal, according to a popular rule, to Smax+20, where Smax is the maximum number of specified bits in any test cube of t...

Full description

Autores:

Tipo de recurso:

Fecha de publicación:

2016

Institución:

Universidad Tecnológica de Bolívar

Repositorio:

Repositorio Institucional UTB

Idioma:

eng

OAI Identifier:

oai:repositorio.utb.edu.co:20.500.12585/8992

Acceso en línea:

https://hdl.handle.net/20.500.12585/8992

Palabra clave:

Algorithm design and analysis
Linear systems
Mathematical model
Polynomials
Test pattern generators
Upper bound
Computation theory
Data compression
Geometry
Linear systems
Mathematical models
Algorithm design and analysis
Berlekamp-Massey algorithm
Characteristic polynomials
Deterministic test pattern
Polynomial degree
Test pattern generator
Test-set compression
Upper bound
Polynomials

Rights

restrictedAccess

License

http://creativecommons.org/licenses/by-nc-nd/4.0/