APA (7th ed.) Citation

(2014). Caracterization of thin films by x’pert-pro panalytical difractometer.

Chicago Style (17th ed.) Citation

Caracterization of Thin Films by X’pert-pro Panalytical Difractometer. 2014.

MLA (8th ed.) Citation

Caracterization of Thin Films by X’pert-pro Panalytical Difractometer. 2014.

Warning: These citations may not always be 100% accurate.