Caracterization of thin films by x’pert-pro panalytical difractometer

In this work, the structural characterization of thin films using a conventional diffraction equipment, brand X'Pert PRO PANalytical X-rays is described. A brief review of the theoretical diffraction techniques and X-ray reflectivity is included. In the experimental part the conditions necessar...

Full description

Autores:

Tolosa, Jhonny
Ortiz, César A.

Tipo de recurso:

Article of journal

Fecha de publicación:

2014

Institución:

Universidad Nacional de Colombia

Repositorio:

Universidad Nacional de Colombia

Idioma:

spa

OAI Identifier:

oai:repositorio.unal.edu.co:unal/50920

Acceso en línea:

https://repositorio.unal.edu.co/handle/unal/50920
http://bdigital.unal.edu.co/44962/

Palabra clave:

Película delgada
Difracción de rayos-X de haz rasante
reflectividad de rayos-X.
Thin films
grazing incidence X-ray diffraction
X-ray reflectivity

Rights

openAccess

License

Atribución-NoComercial 4.0 Internacional