The corrosion resistance and microstructure of ubm system-deposited nbxsiynz thin films
NbxSiyNz thin film nanostructure was grown using the unbalanced magnetron sputtering (UBM) technique with varying Si content. Corrosion resistance was evaluated by potentiodynamic polarisation technique in a 3% NaCl solution. Microstructure was analysed by X-ray diffraction (XRD), scanning electron...
- Autores:
-
Velasco Estrada, Leonardo
Olaya Florez, Jhon Jairo
Rodríguez Baracaldo, Rodolfo
- Tipo de recurso:
- Article of journal
- Fecha de publicación:
- 2012
- Institución:
- Universidad Nacional de Colombia
- Repositorio:
- Universidad Nacional de Colombia
- Idioma:
- spa
- OAI Identifier:
- oai:repositorio.unal.edu.co:unal/71097
- Acceso en línea:
- https://repositorio.unal.edu.co/handle/unal/71097
http://bdigital.unal.edu.co/35567/
http://bdigital.unal.edu.co/35567/2/
- Palabra clave:
- Mechanical Engineering
Material engineering
Corrosion
diffraction
spectroscopy
fluorescence
microstructure
microscopy
race track
x ray
thin film
sputtering
polarisation
Corrosión
Difracción
Espectroscopia
Fluorescencia
Microestructura
Microscopia
race track
Rayos X
Recubrimientos
Sputtering
Polarización
- Rights
- openAccess
- License
- Atribución-NoComercial 4.0 Internacional
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Universidad Nacional de Colombia |
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| dc.title.spa.fl_str_mv |
The corrosion resistance and microstructure of ubm system-deposited nbxsiynz thin films |
| title |
The corrosion resistance and microstructure of ubm system-deposited nbxsiynz thin films |
| spellingShingle |
The corrosion resistance and microstructure of ubm system-deposited nbxsiynz thin films Mechanical Engineering Material engineering Corrosion diffraction spectroscopy fluorescence microstructure microscopy race track x ray thin film sputtering polarisation Corrosión Difracción Espectroscopia Fluorescencia Microestructura Microscopia race track Rayos X Recubrimientos Sputtering Polarización |
| title_short |
The corrosion resistance and microstructure of ubm system-deposited nbxsiynz thin films |
| title_full |
The corrosion resistance and microstructure of ubm system-deposited nbxsiynz thin films |
| title_fullStr |
The corrosion resistance and microstructure of ubm system-deposited nbxsiynz thin films |
| title_full_unstemmed |
The corrosion resistance and microstructure of ubm system-deposited nbxsiynz thin films |
| title_sort |
The corrosion resistance and microstructure of ubm system-deposited nbxsiynz thin films |
| dc.creator.fl_str_mv |
Velasco Estrada, Leonardo Olaya Florez, Jhon Jairo Rodríguez Baracaldo, Rodolfo |
| dc.contributor.author.spa.fl_str_mv |
Velasco Estrada, Leonardo Olaya Florez, Jhon Jairo Rodríguez Baracaldo, Rodolfo |
| dc.subject.proposal.spa.fl_str_mv |
Mechanical Engineering Material engineering Corrosion diffraction spectroscopy fluorescence microstructure microscopy race track x ray thin film sputtering polarisation Corrosión Difracción Espectroscopia Fluorescencia Microestructura Microscopia race track Rayos X Recubrimientos Sputtering Polarización |
| topic |
Mechanical Engineering Material engineering Corrosion diffraction spectroscopy fluorescence microstructure microscopy race track x ray thin film sputtering polarisation Corrosión Difracción Espectroscopia Fluorescencia Microestructura Microscopia race track Rayos X Recubrimientos Sputtering Polarización |
| description |
NbxSiyNz thin film nanostructure was grown using the unbalanced magnetron sputtering (UBM) technique with varying Si content. Corrosion resistance was evaluated by potentiodynamic polarisation technique in a 3% NaCl solution. Microstructure was analysed by X-ray diffraction (XRD), scanning electron microscopy (SEM) and laser scanning microscopy. Chemical composition was ascertained by X-ray fluorescence (XRF) technique. The results showed that deposition rates increased with higher Si content. A microstructural change was observed for greater than 5% Si content through the transition from a crystalline to an amorphous structure in the thin films. Corrosion test results demonstrated that the thin films having the highest silicon content had better corrosion resistance. |
| publishDate |
2012 |
| dc.date.issued.spa.fl_str_mv |
2012 |
| dc.date.accessioned.spa.fl_str_mv |
2019-07-03T14:16:40Z |
| dc.date.available.spa.fl_str_mv |
2019-07-03T14:16:40Z |
| dc.type.spa.fl_str_mv |
Artículo de revista |
| dc.type.coar.fl_str_mv |
http://purl.org/coar/resource_type/c_2df8fbb1 |
| dc.type.driver.spa.fl_str_mv |
info:eu-repo/semantics/article |
| dc.type.version.spa.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
| dc.type.coar.spa.fl_str_mv |
http://purl.org/coar/resource_type/c_6501 |
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http://purl.org/coar/version/c_970fb48d4fbd8a85 |
| dc.type.content.spa.fl_str_mv |
Text |
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http://purl.org/redcol/resource_type/ART |
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http://purl.org/coar/resource_type/c_6501 |
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publishedVersion |
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https://repositorio.unal.edu.co/handle/unal/71097 |
| dc.identifier.eprints.spa.fl_str_mv |
http://bdigital.unal.edu.co/35567/ http://bdigital.unal.edu.co/35567/2/ |
| url |
https://repositorio.unal.edu.co/handle/unal/71097 http://bdigital.unal.edu.co/35567/ http://bdigital.unal.edu.co/35567/2/ |
| dc.language.iso.spa.fl_str_mv |
spa |
| language |
spa |
| dc.relation.spa.fl_str_mv |
http://revistas.unal.edu.co/index.php/ingeinv/article/view/35932 |
| dc.relation.ispartof.spa.fl_str_mv |
Universidad Nacional de Colombia Revistas electrónicas UN Ingeniería e Investigación Ingeniería e Investigación |
| dc.relation.ispartofseries.none.fl_str_mv |
Ingeniería e Investigación; Vol. 32, núm. 3 (2012); 10-13 Ingeniería e Investigación; Vol. 32, núm. 3 (2012); 10-13 2248-8723 0120-5609 |
| dc.relation.references.spa.fl_str_mv |
Velasco Estrada, Leonardo and Olaya Florez, Jhon Jairo and Rodríguez Baracaldo, Rodolfo (2012) The corrosion resistance and microstructure of ubm system-deposited nbxsiynz thin films. Ingeniería e Investigación; Vol. 32, núm. 3 (2012); 10-13 Ingeniería e Investigación; Vol. 32, núm. 3 (2012); 10-13 2248-8723 0120-5609 . |
| dc.rights.spa.fl_str_mv |
Derechos reservados - Universidad Nacional de Colombia |
| dc.rights.coar.fl_str_mv |
http://purl.org/coar/access_right/c_abf2 |
| dc.rights.license.spa.fl_str_mv |
Atribución-NoComercial 4.0 Internacional |
| dc.rights.uri.spa.fl_str_mv |
http://creativecommons.org/licenses/by-nc/4.0/ |
| dc.rights.accessrights.spa.fl_str_mv |
info:eu-repo/semantics/openAccess |
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Atribución-NoComercial 4.0 Internacional Derechos reservados - Universidad Nacional de Colombia http://creativecommons.org/licenses/by-nc/4.0/ http://purl.org/coar/access_right/c_abf2 |
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openAccess |
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application/pdf |
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Universidad Nacional de Colombia - Facultad de Ingeniería |
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Universidad Nacional de Colombia |
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https://repositorio.unal.edu.co/bitstream/unal/71097/1/35932-148095-1-PB.pdf https://repositorio.unal.edu.co/bitstream/unal/71097/2/35932-148095-1-PB.pdf.jpg |
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Repositorio Institucional Universidad Nacional de Colombia |
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repositorio_nal@unal.edu.co |
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1806886657970929664 |
| spelling |
Atribución-NoComercial 4.0 InternacionalDerechos reservados - Universidad Nacional de Colombiahttp://creativecommons.org/licenses/by-nc/4.0/info:eu-repo/semantics/openAccesshttp://purl.org/coar/access_right/c_abf2Velasco Estrada, Leonardo8efe415d-18ac-4453-bc41-7de3b00a6808300Olaya Florez, Jhon Jairoae149608-1880-473a-a5bd-e6434873a8fa300Rodríguez Baracaldo, Rodolfoddf20b61-89dd-4992-8718-532b42e470633002019-07-03T14:16:40Z2019-07-03T14:16:40Z2012https://repositorio.unal.edu.co/handle/unal/71097http://bdigital.unal.edu.co/35567/http://bdigital.unal.edu.co/35567/2/NbxSiyNz thin film nanostructure was grown using the unbalanced magnetron sputtering (UBM) technique with varying Si content. Corrosion resistance was evaluated by potentiodynamic polarisation technique in a 3% NaCl solution. Microstructure was analysed by X-ray diffraction (XRD), scanning electron microscopy (SEM) and laser scanning microscopy. Chemical composition was ascertained by X-ray fluorescence (XRF) technique. The results showed that deposition rates increased with higher Si content. A microstructural change was observed for greater than 5% Si content through the transition from a crystalline to an amorphous structure in the thin films. Corrosion test results demonstrated that the thin films having the highest silicon content had better corrosion resistance.En este trabajo se produjeron recubrimientos nanoestructurados de NbxSiyNz sobre acero inoxidable AISI 304 mediante la técnica del UBM (unbalanced magnetrón - sputtering con magnetrón desbalanceado), variando el contenido de Si, y se evaluó su resistencia frente al fenómeno corrosivo por medio de la técnica de polarización potenciodinámica en una solución al 3% de NaCl. La microestructura de los recubrimientos se analizó por medio de XRD (X ray diffraction - difracción de rayos X), SEM (scanning electron microscopy - microscopia electrónica de barrido) y microscopia láser confocal. La composición química se identificó con la técnica XRF (X ray fluorescence - fluorescencia de rayos X). Como resultado las tasas de depósito se incrementaron con la adición de Si, además se observó un cambio en la microestructura para contenidos superiores a 5% de Si, mediante la transición de un recubrimiento cristalino a amorfo. Finalmente, los resultados de corrosión sugieren que los recubrimientos con un alto contenido de silicio tienen un mejor comportamiento frente a la corrosión del sistema.application/pdfspaUniversidad Nacional de Colombia - Facultad de Ingenieríahttp://revistas.unal.edu.co/index.php/ingeinv/article/view/35932Universidad Nacional de Colombia Revistas electrónicas UN Ingeniería e InvestigaciónIngeniería e InvestigaciónIngeniería e Investigación; Vol. 32, núm. 3 (2012); 10-13 Ingeniería e Investigación; Vol. 32, núm. 3 (2012); 10-13 2248-8723 0120-5609Velasco Estrada, Leonardo and Olaya Florez, Jhon Jairo and Rodríguez Baracaldo, Rodolfo (2012) The corrosion resistance and microstructure of ubm system-deposited nbxsiynz thin films. Ingeniería e Investigación; Vol. 32, núm. 3 (2012); 10-13 Ingeniería e Investigación; Vol. 32, núm. 3 (2012); 10-13 2248-8723 0120-5609 .The corrosion resistance and microstructure of ubm system-deposited nbxsiynz thin filmsArtículo de revistainfo:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionhttp://purl.org/coar/resource_type/c_6501http://purl.org/coar/resource_type/c_2df8fbb1http://purl.org/coar/version/c_970fb48d4fbd8a85Texthttp://purl.org/redcol/resource_type/ARTMechanical EngineeringMaterial engineeringCorrosiondiffractionspectroscopyfluorescencemicrostructuremicroscopyrace trackx raythin filmsputteringpolarisationCorrosiónDifracciónEspectroscopiaFluorescenciaMicroestructuraMicroscopiarace trackRayos XRecubrimientosSputteringPolarizaciónORIGINAL35932-148095-1-PB.pdfapplication/pdf925626https://repositorio.unal.edu.co/bitstream/unal/71097/1/35932-148095-1-PB.pdfe229c9e6cd350ceb98da641f110133faMD51THUMBNAIL35932-148095-1-PB.pdf.jpg35932-148095-1-PB.pdf.jpgGenerated Thumbnailimage/jpeg9099https://repositorio.unal.edu.co/bitstream/unal/71097/2/35932-148095-1-PB.pdf.jpg40afdcbdb368e45eb556c5fd9b341d67MD52unal/71097oai:repositorio.unal.edu.co:unal/710972024-06-09 23:09:47.872Repositorio Institucional Universidad Nacional de Colombiarepositorio_nal@unal.edu.co |