The corrosion resistance and microstructure of ubm system-deposited nbxsiynz thin films

NbxSiyNz thin film nanostructure was grown using the unbalanced magnetron sputtering (UBM) technique with varying Si content. Corrosion resistance was evaluated by potentiodynamic polarisation technique in a 3% NaCl solution. Microstructure was analysed by X-ray diffraction (XRD), scanning electron...

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Autores:
Velasco Estrada, Leonardo
Olaya Florez, Jhon Jairo
Rodríguez Baracaldo, Rodolfo
Tipo de recurso:
Article of journal
Fecha de publicación:
2012
Institución:
Universidad Nacional de Colombia
Repositorio:
Universidad Nacional de Colombia
Idioma:
spa
OAI Identifier:
oai:repositorio.unal.edu.co:unal/71097
Acceso en línea:
https://repositorio.unal.edu.co/handle/unal/71097
http://bdigital.unal.edu.co/35567/
http://bdigital.unal.edu.co/35567/2/
Palabra clave:
Mechanical Engineering
Material engineering
Corrosion
diffraction
spectroscopy
fluorescence
microstructure
microscopy
race track
x ray
thin film
sputtering
polarisation
Corrosión
Difracción
Espectroscopia
Fluorescencia
Microestructura
Microscopia
race track
Rayos X
Recubrimientos
Sputtering
Polarización
Rights
openAccess
License
Atribución-NoComercial 4.0 Internacional
id UNACIONAL2_336a025fc41033821e51fca0a6bb2d3b
oai_identifier_str oai:repositorio.unal.edu.co:unal/71097
network_acronym_str UNACIONAL2
network_name_str Universidad Nacional de Colombia
repository_id_str
dc.title.spa.fl_str_mv The corrosion resistance and microstructure of ubm system-deposited nbxsiynz thin films
title The corrosion resistance and microstructure of ubm system-deposited nbxsiynz thin films
spellingShingle The corrosion resistance and microstructure of ubm system-deposited nbxsiynz thin films
Mechanical Engineering
Material engineering
Corrosion
diffraction
spectroscopy
fluorescence
microstructure
microscopy
race track
x ray
thin film
sputtering
polarisation
Corrosión
Difracción
Espectroscopia
Fluorescencia
Microestructura
Microscopia
race track
Rayos X
Recubrimientos
Sputtering
Polarización
title_short The corrosion resistance and microstructure of ubm system-deposited nbxsiynz thin films
title_full The corrosion resistance and microstructure of ubm system-deposited nbxsiynz thin films
title_fullStr The corrosion resistance and microstructure of ubm system-deposited nbxsiynz thin films
title_full_unstemmed The corrosion resistance and microstructure of ubm system-deposited nbxsiynz thin films
title_sort The corrosion resistance and microstructure of ubm system-deposited nbxsiynz thin films
dc.creator.fl_str_mv Velasco Estrada, Leonardo
Olaya Florez, Jhon Jairo
Rodríguez Baracaldo, Rodolfo
dc.contributor.author.spa.fl_str_mv Velasco Estrada, Leonardo
Olaya Florez, Jhon Jairo
Rodríguez Baracaldo, Rodolfo
dc.subject.proposal.spa.fl_str_mv Mechanical Engineering
Material engineering
Corrosion
diffraction
spectroscopy
fluorescence
microstructure
microscopy
race track
x ray
thin film
sputtering
polarisation
Corrosión
Difracción
Espectroscopia
Fluorescencia
Microestructura
Microscopia
race track
Rayos X
Recubrimientos
Sputtering
Polarización
topic Mechanical Engineering
Material engineering
Corrosion
diffraction
spectroscopy
fluorescence
microstructure
microscopy
race track
x ray
thin film
sputtering
polarisation
Corrosión
Difracción
Espectroscopia
Fluorescencia
Microestructura
Microscopia
race track
Rayos X
Recubrimientos
Sputtering
Polarización
description NbxSiyNz thin film nanostructure was grown using the unbalanced magnetron sputtering (UBM) technique with varying Si content. Corrosion resistance was evaluated by potentiodynamic polarisation technique in a 3% NaCl solution. Microstructure was analysed by X-ray diffraction (XRD), scanning electron microscopy (SEM) and laser scanning microscopy. Chemical composition was ascertained by X-ray fluorescence (XRF) technique. The results showed that deposition rates increased with higher Si content. A microstructural change was observed for greater than 5% Si content through the transition from a crystalline to an amorphous structure in the thin films. Corrosion test results demonstrated that the thin films having the highest silicon content had better corrosion resistance.
publishDate 2012
dc.date.issued.spa.fl_str_mv 2012
dc.date.accessioned.spa.fl_str_mv 2019-07-03T14:16:40Z
dc.date.available.spa.fl_str_mv 2019-07-03T14:16:40Z
dc.type.spa.fl_str_mv Artículo de revista
dc.type.coar.fl_str_mv http://purl.org/coar/resource_type/c_2df8fbb1
dc.type.driver.spa.fl_str_mv info:eu-repo/semantics/article
dc.type.version.spa.fl_str_mv info:eu-repo/semantics/publishedVersion
dc.type.coar.spa.fl_str_mv http://purl.org/coar/resource_type/c_6501
dc.type.coarversion.spa.fl_str_mv http://purl.org/coar/version/c_970fb48d4fbd8a85
dc.type.content.spa.fl_str_mv Text
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format http://purl.org/coar/resource_type/c_6501
status_str publishedVersion
dc.identifier.uri.none.fl_str_mv https://repositorio.unal.edu.co/handle/unal/71097
dc.identifier.eprints.spa.fl_str_mv http://bdigital.unal.edu.co/35567/
http://bdigital.unal.edu.co/35567/2/
url https://repositorio.unal.edu.co/handle/unal/71097
http://bdigital.unal.edu.co/35567/
http://bdigital.unal.edu.co/35567/2/
dc.language.iso.spa.fl_str_mv spa
language spa
dc.relation.spa.fl_str_mv http://revistas.unal.edu.co/index.php/ingeinv/article/view/35932
dc.relation.ispartof.spa.fl_str_mv Universidad Nacional de Colombia Revistas electrónicas UN Ingeniería e Investigación
Ingeniería e Investigación
dc.relation.ispartofseries.none.fl_str_mv Ingeniería e Investigación; Vol. 32, núm. 3 (2012); 10-13 Ingeniería e Investigación; Vol. 32, núm. 3 (2012); 10-13 2248-8723 0120-5609
dc.relation.references.spa.fl_str_mv Velasco Estrada, Leonardo and Olaya Florez, Jhon Jairo and Rodríguez Baracaldo, Rodolfo (2012) The corrosion resistance and microstructure of ubm system-deposited nbxsiynz thin films. Ingeniería e Investigación; Vol. 32, núm. 3 (2012); 10-13 Ingeniería e Investigación; Vol. 32, núm. 3 (2012); 10-13 2248-8723 0120-5609 .
dc.rights.spa.fl_str_mv Derechos reservados - Universidad Nacional de Colombia
dc.rights.coar.fl_str_mv http://purl.org/coar/access_right/c_abf2
dc.rights.license.spa.fl_str_mv Atribución-NoComercial 4.0 Internacional
dc.rights.uri.spa.fl_str_mv http://creativecommons.org/licenses/by-nc/4.0/
dc.rights.accessrights.spa.fl_str_mv info:eu-repo/semantics/openAccess
rights_invalid_str_mv Atribución-NoComercial 4.0 Internacional
Derechos reservados - Universidad Nacional de Colombia
http://creativecommons.org/licenses/by-nc/4.0/
http://purl.org/coar/access_right/c_abf2
eu_rights_str_mv openAccess
dc.format.mimetype.spa.fl_str_mv application/pdf
dc.publisher.spa.fl_str_mv Universidad Nacional de Colombia - Facultad de Ingeniería
institution Universidad Nacional de Colombia
bitstream.url.fl_str_mv https://repositorio.unal.edu.co/bitstream/unal/71097/1/35932-148095-1-PB.pdf
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repository.name.fl_str_mv Repositorio Institucional Universidad Nacional de Colombia
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spelling Atribución-NoComercial 4.0 InternacionalDerechos reservados - Universidad Nacional de Colombiahttp://creativecommons.org/licenses/by-nc/4.0/info:eu-repo/semantics/openAccesshttp://purl.org/coar/access_right/c_abf2Velasco Estrada, Leonardo8efe415d-18ac-4453-bc41-7de3b00a6808300Olaya Florez, Jhon Jairoae149608-1880-473a-a5bd-e6434873a8fa300Rodríguez Baracaldo, Rodolfoddf20b61-89dd-4992-8718-532b42e470633002019-07-03T14:16:40Z2019-07-03T14:16:40Z2012https://repositorio.unal.edu.co/handle/unal/71097http://bdigital.unal.edu.co/35567/http://bdigital.unal.edu.co/35567/2/NbxSiyNz thin film nanostructure was grown using the unbalanced magnetron sputtering (UBM) technique with varying Si content. Corrosion resistance was evaluated by potentiodynamic polarisation technique in a 3% NaCl solution. Microstructure was analysed by X-ray diffraction (XRD), scanning electron microscopy (SEM) and laser scanning microscopy. Chemical composition was ascertained by X-ray fluorescence (XRF) technique. The results showed that deposition rates increased with higher Si content. A microstructural change was observed for greater than 5% Si content through the transition from a crystalline to an amorphous structure in the thin films. Corrosion test results demonstrated that the thin films having the highest silicon content had better corrosion resistance.En este trabajo se produjeron recubrimientos nanoestructurados de NbxSiyNz sobre acero inoxidable AISI 304 mediante la técnica del UBM (unbalanced magnetrón - sputtering con magnetrón desbalanceado), variando el contenido de Si, y se evaluó su resistencia frente al fenómeno corrosivo por medio de la técnica de polarización potenciodinámica en una solución al 3% de NaCl. La microestructura de los recubrimientos se analizó por medio de XRD (X ray diffraction - difracción de rayos X), SEM (scanning electron microscopy - microscopia electrónica de barrido) y microscopia láser confocal. La composición química se identificó con la técnica XRF (X ray fluorescence - fluorescencia de rayos X). Como resultado las tasas de depósito se incrementaron con la adición de Si, además se observó un cambio en la microestructura para contenidos superiores a 5% de Si, mediante la transición de un recubrimiento cristalino a amorfo. Finalmente, los resultados de corrosión sugieren que los recubrimientos con un alto contenido de silicio tienen un mejor comportamiento frente a la corrosión del sistema.application/pdfspaUniversidad Nacional de Colombia - Facultad de Ingenieríahttp://revistas.unal.edu.co/index.php/ingeinv/article/view/35932Universidad Nacional de Colombia Revistas electrónicas UN Ingeniería e InvestigaciónIngeniería e InvestigaciónIngeniería e Investigación; Vol. 32, núm. 3 (2012); 10-13 Ingeniería e Investigación; Vol. 32, núm. 3 (2012); 10-13 2248-8723 0120-5609Velasco Estrada, Leonardo and Olaya Florez, Jhon Jairo and Rodríguez Baracaldo, Rodolfo (2012) The corrosion resistance and microstructure of ubm system-deposited nbxsiynz thin films. Ingeniería e Investigación; Vol. 32, núm. 3 (2012); 10-13 Ingeniería e Investigación; Vol. 32, núm. 3 (2012); 10-13 2248-8723 0120-5609 .The corrosion resistance and microstructure of ubm system-deposited nbxsiynz thin filmsArtículo de revistainfo:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionhttp://purl.org/coar/resource_type/c_6501http://purl.org/coar/resource_type/c_2df8fbb1http://purl.org/coar/version/c_970fb48d4fbd8a85Texthttp://purl.org/redcol/resource_type/ARTMechanical EngineeringMaterial engineeringCorrosiondiffractionspectroscopyfluorescencemicrostructuremicroscopyrace trackx raythin filmsputteringpolarisationCorrosiónDifracciónEspectroscopiaFluorescenciaMicroestructuraMicroscopiarace trackRayos XRecubrimientosSputteringPolarizaciónORIGINAL35932-148095-1-PB.pdfapplication/pdf925626https://repositorio.unal.edu.co/bitstream/unal/71097/1/35932-148095-1-PB.pdfe229c9e6cd350ceb98da641f110133faMD51THUMBNAIL35932-148095-1-PB.pdf.jpg35932-148095-1-PB.pdf.jpgGenerated Thumbnailimage/jpeg9099https://repositorio.unal.edu.co/bitstream/unal/71097/2/35932-148095-1-PB.pdf.jpg40afdcbdb368e45eb556c5fd9b341d67MD52unal/71097oai:repositorio.unal.edu.co:unal/710972024-06-09 23:09:47.872Repositorio Institucional Universidad Nacional de Colombiarepositorio_nal@unal.edu.co