The corrosion resistance and microstructure of ubm system-deposited nbxsiynz thin films
NbxSiyNz thin film nanostructure was grown using the unbalanced magnetron sputtering (UBM) technique with varying Si content. Corrosion resistance was evaluated by potentiodynamic polarisation technique in a 3% NaCl solution. Microstructure was analysed by X-ray diffraction (XRD), scanning electron...
- Autores:
-
Velasco Estrada, Leonardo
Olaya Florez, Jhon Jairo
Rodríguez Baracaldo, Rodolfo
- Tipo de recurso:
- Article of journal
- Fecha de publicación:
- 2012
- Institución:
- Universidad Nacional de Colombia
- Repositorio:
- Universidad Nacional de Colombia
- Idioma:
- spa
- OAI Identifier:
- oai:repositorio.unal.edu.co:unal/71097
- Acceso en línea:
- https://repositorio.unal.edu.co/handle/unal/71097
http://bdigital.unal.edu.co/35567/
http://bdigital.unal.edu.co/35567/2/
- Palabra clave:
- Mechanical Engineering
Material engineering
Corrosion
diffraction
spectroscopy
fluorescence
microstructure
microscopy
race track
x ray
thin film
sputtering
polarisation
Corrosión
Difracción
Espectroscopia
Fluorescencia
Microestructura
Microscopia
race track
Rayos X
Recubrimientos
Sputtering
Polarización
- Rights
- openAccess
- License
- Atribución-NoComercial 4.0 Internacional