APA (7th ed.) Citation

(2016). Study of electromigration and ir-drop effects for chip reliability.

Chicago Style (17th ed.) Citation

Study of Electromigration and Ir-drop Effects for Chip Reliability. 2016.

MLA (8th ed.) Citation

Study of Electromigration and Ir-drop Effects for Chip Reliability. 2016.

Warning: These citations may not always be 100% accurate.