We have observed by means of scanning tunneling microscopy (STM) moiré patterns corresponding to the rotation of one graphene layer on HOPG surface. These moiré patterns were characterized by rotation angle and extension in the plane. Additionally, by identifying border domains and defects we can di...
- Autores:
- Tipo de recurso:
- Fecha de publicación:
- 2013
- Institución:
- Universidad de Medellín
- Repositorio:
- Repositorio UDEM
- Idioma:
- eng
- OAI Identifier:
- oai:repository.udem.edu.co:11407/1349
- Acceso en línea:
- http://hdl.handle.net/11407/1349
- Palabra clave:
- Graphite STM
Moiré patterns
Trilayer graphene
- Rights
- restrictedAccess
- License
- http://purl.org/coar/access_right/c_16ec