Background impurities and a delta-doped QW. Part I: Center doping

The influence of shallow background donor impurities on the energy characteristics of the SiGe/Si/SiGe quantum well structure with centered delta-doping is studied numerically. The description of the self-consistent method includes the calculation of the donors impurity binding energy in the delta-l...

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Tipo de recurso:
Fecha de publicación:
2019
Institución:
Universidad de Medellín
Repositorio:
Repositorio UDEM
Idioma:
eng
OAI Identifier:
oai:repository.udem.edu.co:11407/5776
Acceso en línea:
http://hdl.handle.net/11407/5776
Palabra clave:
impurity binding energy
modulation doping
self-consistent calculation
semiconductor quantum wells
Binding energy
Semiconductor doping
Silicon
Background impurities
Energy characteristics
Impurity binding energy
Intersubband optical transitions
Modulation doping
Quantum well structures
Self-consistent calculation
Self-consistent method
Semiconductor quantum wells
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http://purl.org/coar/access_right/c_16ec
id REPOUDEM2_1ed2cd993f9b942f082be4ad87f18405
oai_identifier_str oai:repository.udem.edu.co:11407/5776
network_acronym_str REPOUDEM2
network_name_str Repositorio UDEM
repository_id_str
dc.title.none.fl_str_mv Background impurities and a delta-doped QW. Part I: Center doping
title Background impurities and a delta-doped QW. Part I: Center doping
spellingShingle Background impurities and a delta-doped QW. Part I: Center doping
impurity binding energy
modulation doping
self-consistent calculation
semiconductor quantum wells
Binding energy
Semiconductor doping
Silicon
Background impurities
Energy characteristics
Impurity binding energy
Intersubband optical transitions
Modulation doping
Quantum well structures
Self-consistent calculation
Self-consistent method
Semiconductor quantum wells
title_short Background impurities and a delta-doped QW. Part I: Center doping
title_full Background impurities and a delta-doped QW. Part I: Center doping
title_fullStr Background impurities and a delta-doped QW. Part I: Center doping
title_full_unstemmed Background impurities and a delta-doped QW. Part I: Center doping
title_sort Background impurities and a delta-doped QW. Part I: Center doping
dc.subject.none.fl_str_mv impurity binding energy
modulation doping
self-consistent calculation
semiconductor quantum wells
Binding energy
Semiconductor doping
Silicon
Background impurities
Energy characteristics
Impurity binding energy
Intersubband optical transitions
Modulation doping
Quantum well structures
Self-consistent calculation
Self-consistent method
Semiconductor quantum wells
topic impurity binding energy
modulation doping
self-consistent calculation
semiconductor quantum wells
Binding energy
Semiconductor doping
Silicon
Background impurities
Energy characteristics
Impurity binding energy
Intersubband optical transitions
Modulation doping
Quantum well structures
Self-consistent calculation
Self-consistent method
Semiconductor quantum wells
description The influence of shallow background donor impurities on the energy characteristics of the SiGe/Si/SiGe quantum well structure with centered delta-doping is studied numerically. The description of the self-consistent method includes the calculation of the donors impurity binding energy in the delta-layer. The delta-layer impurity binding energy as well as the energy differences between the first quantized electron subbands in the well demonstrate a significant dependence on the characteristics of the background doping. Therefore, the background doping cannot be neglected when studying phenomena like intersubband optical transitions. © 2019 IOP Publishing Ltd.
publishDate 2019
dc.date.accessioned.none.fl_str_mv 2020-04-29T14:53:58Z
dc.date.available.none.fl_str_mv 2020-04-29T14:53:58Z
dc.date.none.fl_str_mv 2019
dc.type.eng.fl_str_mv Article
dc.type.coarversion.fl_str_mv http://purl.org/coar/version/c_970fb48d4fbd8a85
dc.type.coar.fl_str_mv http://purl.org/coar/resource_type/c_6501
http://purl.org/coar/resource_type/c_2df8fbb1
dc.type.driver.none.fl_str_mv info:eu-repo/semantics/article
dc.identifier.issn.none.fl_str_mv 2681242
dc.identifier.uri.none.fl_str_mv http://hdl.handle.net/11407/5776
dc.identifier.doi.none.fl_str_mv 10.1088/1361-6641/ab4c7a
identifier_str_mv 2681242
10.1088/1361-6641/ab4c7a
url http://hdl.handle.net/11407/5776
dc.language.iso.none.fl_str_mv eng
language eng
dc.relation.isversionof.none.fl_str_mv https://www.scopus.com/inward/record.uri?eid=2-s2.0-85081139356&doi=10.1088%2f1361-6641%2fab4c7a&partnerID=40&md5=ae9b7e4552959ef33dcd023cb99e2bc6
dc.relation.citationvolume.none.fl_str_mv 34
dc.relation.citationissue.none.fl_str_mv 12
dc.relation.references.none.fl_str_mv Bastard, G., (1981) Phys. Rev., 24, p. 4714
Mailhiot, C., Chang, Y.C., McGill, T.C., (1982) Phys. Rev., 26, p. 4449
Priester, C., Bastard, G., Allan, G., Lannoo, M., (1984) Phys. Rev., 30, p. 6029
Masselink, W.T., Chang, Y.C., Morkoc, H., (1983) Phys. Rev., 28, p. 7373
Chaudhuri, S., Bajaj, K.K., (1984) Phys. Rev., 29, p. 1803
Chaudhuri, S., (1983) Phys. Rev., 28, p. 4480
Fraizzoli, S., Bassani, F., Buczko, R., (1990) Phys. Rev., 41, p. 5096
Brum, J.A., Bastard, G., Guillemot, C., (1984) Phys. Rev., 30, p. 905
Oliveira, L.E., Falicov, L.M., (1986) Phys. Rev., 34, p. 8676
Lopez, S.Y., Porras-Montenegro, N., Duque, C.A., (2003) Semicond. Sci. Technol., 18 (7), p. 718
Zhao, G.J., Liang, X.X., Ban, S.L., (2003) Phys. Lett., 319, p. 191
Panahi, H., Maleki, M., (2008) J. Appl. Scien., 8, p. 636
Raigoza, N., Morales, A.L., Montes, A., Porras-Montenegro, N., Duque, C.A., (2004) Phys. Rev., 69
López, S.Y., Porras-Montenegro, N., Duque, C.A., (2003) Phys. Stat. Sol., p. 648
Loehr, J.P., Singh, J., (1990) Phys. Rev., 41, p. 3695
Brum, A., Priester, C., Allan, G., (1985) Phys. Rev., 32, p. 2378
Weber, G., (1990) Phys. Rev., 41, p. 10043
Greene, R.L., Bajaj, K.K., (1985) Phys. Rev., 31, p. 913
Elabsy, A.M., (1992) Physica Scripta, 46 (5), p. 473
Peter, A.J., Navaneethakrishnanb, K., (2008) Superlat. Microst., 43, p. 63
Kasapoglu, E., (2008) Phys. Lett., 373, p. 140
Fanyaao, Q., Fonseca, A.L.A., Nunes, O.A.C., (1996) Phys. Stat. Sol., 197, p. 349
Qu, F., Morais, P.C., (1998) J. Phys. Soc. Jpn., 67, p. 513
Sari, H., Kasapoglu, E., Sokmen, I., Balkan, N., (2003) Semicond. Sci. Technol., 18 (6), p. 470
Radhakrishnan, N., Peter, A.J., (2009) Physica, 41, p. 1841
Shubert, E.F., (1990) J. Vac Sci. Technol., 83, p. 2980
Altukhov, I.V., Chirkova, E.G., Sinis, V.P., Kagan, M.S., Gousev, Y.P., Thomas, S.G., Wang, K.L., Yassievich, I.N., (2001) Appl. Phys. Lett., 79, p. 3909
Blom, A., Odnoblyudov, M.A., Cheng, H.H., Yassievich, I.N., Chao, K.A., (2001) Appl. Phys. Lett., 79, p. 713
Bondar, V.M., Dalakyan, A.T., Vorobev, L.E., Firsov, D.A., Tulupenko, V.N., (1999) Jetp Lett., 70, p. 265
Yen, S.T., Tulupenko, V.N., Cheng, E.S., Chung, P.K., Lee, C.P., Dalakyan, A.T., Chao, K.A., (2004) J. Appl. Phys., 96, p. 4970
Benz, A., Fasching, G., Andrews, A.M., Martl, M., Unterrainer, K., (2007) Appl. Phys. Lett., 90
Levine, B.F., (1993) Journ. Appl. Phys., 74, p. R1
Fan, F., Li, W., Gu, W.H., Wang, X.H., Chang, S.J., (2013) Photonics Nanostruct, 11, p. 4854
Efros, A.L., (1978) Sov. Phys. Usp., 21 (9), p. 746
Tulupenko, V., Abramov, A., Belichenko, Y., Akimov, V., Bogdanova, T., Poroshin, V., Fomina, O., (2011) J. Appl. Phys., 109
Tulupenko, V., Duque, C.A., Demedyuk, R., Belichenko, Y., Duque, C.M., Akimov, V., Poroshin, V., Fomina, O., (2013) Philos. Mag. Lett., 93, p. 42
Tulupenko, V., (2015) Physica, 66
Tulupenko, V., Duque, C.A., Morales, A.L., Tiutiunnyk, A., Demediuk, R., Dmytrychenko, T., Fomina, O., Mora-Ramos, M.E., (2017) Phys. Status Solidi, 254
Blom, A., Odnoblyudov, M.A., Yassievich, I.N., Chao, K.A., (2003) Phys. Rev., 68
Rieger, M.M., Vogl, P., (1993) Phys. Rev., 48, p. 14276
Schaffler, F., (1997) Semicond. Sci. Technol., 12 (12), p. 1515
Paul, D.J., (2004) Semicond. Sci. Technol., 19 (10), p. R75
Sant, S., Lodha, S., Ganguly, U., Mahapatra, S., Heinz, F.O., Smith, L., Moroz, V., Ganguly, S., (2013) J. Appl. Phys., 113
Oberbeck, L., Curson, N.J., Hallam, T., Simmons, M.Y., Bilger, G., Clark, R.G., (2004) Appl. Phys. Lett., 85, p. 1359
Goh, K.E.J., Augarten, Y., Oberbeck, L., Simmons, M.Y., (2008) Appl. Phys. Lett., 93
Kyazym-Zade, A.G., (1995) Semiconductors, 29, p. 10
Sirenko, Y.M., Mitin, V., (1994) J. Lumin., 58, p. 257
Stern, F., (1972) Phys. Rev., 5, p. 4891
Ando, T., Mori, S., (1979) J. Phys. Soc. Jap., 47, p. 1518
Stern, F., Das Sarma, S., (1984) Phys. Rev., 30, p. 840
Tan, I.H., Snider, G.L., Chang, L.D., Hu, E.L., (1990) J. Appl. Phys., 68, p. 4071
Bastard, G., (1991) Wave Mechanics Applied to Semiconductor Nanostructures
Vinter, B., (1982) Phys. Rev., 26, p. 6808
Neamen, D.A., (2012) Semiconductor Physics and Devices
Braunstein, R., Moore, A.R., Herman, F., (1958) Phys. Rev., 109, p. 695
Krussmann, R., Vollmer, H., Labusch, R., (1983) Phys. Stat. Sol., 118, p. 275
BenDaniel, D.J., Duke, C.B., (1966) Phys. Rev., 152, p. 683
Harrison, P., (2005) Quantum Wells, Wires and Dots
Zubkov, V.I., Melnik, M.A., Solomonov, A.V., Tsvelev, E.O., Bugge, F., Weyers, M., Tränkle, G., (2004) Phys. Rev., 70
Zubkov, V.I., (2007) Semiconductors, 41, p. 331
Shiff, L.I., (1949) Quantum Meschanics
Scolfaro, L.M.R., Beliaev, D., Enderlein, R., Leite, J.R., (1994) Phys. Rev., 50, p. 8699
Rodriguez-Vargas, I., Gaggero-Sager, L.M., (2006) Journ. Appl. Phys., 99, p. 033702
Jacson, J.D., (1962) Classical Electrodynamics
Tanaka, K., Nagaoka, M., Yamabe, T., (1983) Phys. Rev, 28, p. 7068
Stopa, M., DasSarma, S., (1989) Phys. Rev, 40, p. 8466
Kohn, W., Luttinger, J.M., (1955) Phys. Rev., 98, p. 915
Ozturk, E., Sari, H., Ergun, Y., Sokmen, I., (2003) Phys., 334, p. 1
Ungan, F., Kasapoglu, E., Sarı, H., Sökmen, I., (2009) Superlatt. Microst., 46, p. 864
Duque, C.A., (2015) Superlatt. Microst., 87, p. 5
Tulupenko, V., Duque, C.A., Akimov, V., Demediuk, R., Belykh, V., Tiutiunnyk, A., Morales, A.L., Fomina, O., (2015) Phys., 74, p. 400
Ramdas, A.K., Rodriguez, S., (1981) Rep. Prog. Phys., 44 (12), p. 1297
dc.rights.coar.fl_str_mv http://purl.org/coar/access_right/c_16ec
rights_invalid_str_mv http://purl.org/coar/access_right/c_16ec
dc.publisher.none.fl_str_mv Institute of Physics Publishing
dc.publisher.program.none.fl_str_mv Facultad de Ciencias Básicas
dc.publisher.faculty.none.fl_str_mv Facultad de Ciencias Básicas
publisher.none.fl_str_mv Institute of Physics Publishing
dc.source.none.fl_str_mv Semiconductor Science and Technology
institution Universidad de Medellín
repository.name.fl_str_mv Repositorio Institucional Universidad de Medellin
repository.mail.fl_str_mv repositorio@udem.edu.co
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spelling 20192020-04-29T14:53:58Z2020-04-29T14:53:58Z2681242http://hdl.handle.net/11407/577610.1088/1361-6641/ab4c7aThe influence of shallow background donor impurities on the energy characteristics of the SiGe/Si/SiGe quantum well structure with centered delta-doping is studied numerically. The description of the self-consistent method includes the calculation of the donors impurity binding energy in the delta-layer. The delta-layer impurity binding energy as well as the energy differences between the first quantized electron subbands in the well demonstrate a significant dependence on the characteristics of the background doping. Therefore, the background doping cannot be neglected when studying phenomena like intersubband optical transitions. © 2019 IOP Publishing Ltd.engInstitute of Physics PublishingFacultad de Ciencias BásicasFacultad de Ciencias Básicashttps://www.scopus.com/inward/record.uri?eid=2-s2.0-85081139356&doi=10.1088%2f1361-6641%2fab4c7a&partnerID=40&md5=ae9b7e4552959ef33dcd023cb99e2bc63412Bastard, G., (1981) Phys. Rev., 24, p. 4714Mailhiot, C., Chang, Y.C., McGill, T.C., (1982) Phys. Rev., 26, p. 4449Priester, C., Bastard, G., Allan, G., Lannoo, M., (1984) Phys. Rev., 30, p. 6029Masselink, W.T., Chang, Y.C., Morkoc, H., (1983) Phys. Rev., 28, p. 7373Chaudhuri, S., Bajaj, K.K., (1984) Phys. Rev., 29, p. 1803Chaudhuri, S., (1983) Phys. Rev., 28, p. 4480Fraizzoli, S., Bassani, F., Buczko, R., (1990) Phys. Rev., 41, p. 5096Brum, J.A., Bastard, G., Guillemot, C., (1984) Phys. Rev., 30, p. 905Oliveira, L.E., Falicov, L.M., (1986) Phys. Rev., 34, p. 8676Lopez, S.Y., Porras-Montenegro, N., Duque, C.A., (2003) Semicond. Sci. Technol., 18 (7), p. 718Zhao, G.J., Liang, X.X., Ban, S.L., (2003) Phys. Lett., 319, p. 191Panahi, H., Maleki, M., (2008) J. Appl. Scien., 8, p. 636Raigoza, N., Morales, A.L., Montes, A., Porras-Montenegro, N., Duque, C.A., (2004) Phys. Rev., 69López, S.Y., Porras-Montenegro, N., Duque, C.A., (2003) Phys. Stat. Sol., p. 648Loehr, J.P., Singh, J., (1990) Phys. Rev., 41, p. 3695Brum, A., Priester, C., Allan, G., (1985) Phys. Rev., 32, p. 2378Weber, G., (1990) Phys. Rev., 41, p. 10043Greene, R.L., Bajaj, K.K., (1985) Phys. Rev., 31, p. 913Elabsy, A.M., (1992) Physica Scripta, 46 (5), p. 473Peter, A.J., Navaneethakrishnanb, K., (2008) Superlat. Microst., 43, p. 63Kasapoglu, E., (2008) Phys. Lett., 373, p. 140Fanyaao, Q., Fonseca, A.L.A., Nunes, O.A.C., (1996) Phys. Stat. Sol., 197, p. 349Qu, F., Morais, P.C., (1998) J. Phys. Soc. Jpn., 67, p. 513Sari, H., Kasapoglu, E., Sokmen, I., Balkan, N., (2003) Semicond. Sci. Technol., 18 (6), p. 470Radhakrishnan, N., Peter, A.J., (2009) Physica, 41, p. 1841Shubert, E.F., (1990) J. Vac Sci. Technol., 83, p. 2980Altukhov, I.V., Chirkova, E.G., Sinis, V.P., Kagan, M.S., Gousev, Y.P., Thomas, S.G., Wang, K.L., Yassievich, I.N., (2001) Appl. Phys. Lett., 79, p. 3909Blom, A., Odnoblyudov, M.A., Cheng, H.H., Yassievich, I.N., Chao, K.A., (2001) Appl. Phys. Lett., 79, p. 713Bondar, V.M., Dalakyan, A.T., Vorobev, L.E., Firsov, D.A., Tulupenko, V.N., (1999) Jetp Lett., 70, p. 265Yen, S.T., Tulupenko, V.N., Cheng, E.S., Chung, P.K., Lee, C.P., Dalakyan, A.T., Chao, K.A., (2004) J. Appl. Phys., 96, p. 4970Benz, A., Fasching, G., Andrews, A.M., Martl, M., Unterrainer, K., (2007) Appl. Phys. Lett., 90Levine, B.F., (1993) Journ. Appl. Phys., 74, p. R1Fan, F., Li, W., Gu, W.H., Wang, X.H., Chang, S.J., (2013) Photonics Nanostruct, 11, p. 4854Efros, A.L., (1978) Sov. Phys. Usp., 21 (9), p. 746Tulupenko, V., Abramov, A., Belichenko, Y., Akimov, V., Bogdanova, T., Poroshin, V., Fomina, O., (2011) J. Appl. Phys., 109Tulupenko, V., Duque, C.A., Demedyuk, R., Belichenko, Y., Duque, C.M., Akimov, V., Poroshin, V., Fomina, O., (2013) Philos. Mag. Lett., 93, p. 42Tulupenko, V., (2015) Physica, 66Tulupenko, V., Duque, C.A., Morales, A.L., Tiutiunnyk, A., Demediuk, R., Dmytrychenko, T., Fomina, O., Mora-Ramos, M.E., (2017) Phys. Status Solidi, 254Blom, A., Odnoblyudov, M.A., Yassievich, I.N., Chao, K.A., (2003) Phys. Rev., 68Rieger, M.M., Vogl, P., (1993) Phys. Rev., 48, p. 14276Schaffler, F., (1997) Semicond. Sci. Technol., 12 (12), p. 1515Paul, D.J., (2004) Semicond. Sci. Technol., 19 (10), p. R75Sant, S., Lodha, S., Ganguly, U., Mahapatra, S., Heinz, F.O., Smith, L., Moroz, V., Ganguly, S., (2013) J. Appl. Phys., 113Oberbeck, L., Curson, N.J., Hallam, T., Simmons, M.Y., Bilger, G., Clark, R.G., (2004) Appl. Phys. Lett., 85, p. 1359Goh, K.E.J., Augarten, Y., Oberbeck, L., Simmons, M.Y., (2008) Appl. Phys. Lett., 93Kyazym-Zade, A.G., (1995) Semiconductors, 29, p. 10Sirenko, Y.M., Mitin, V., (1994) J. Lumin., 58, p. 257Stern, F., (1972) Phys. Rev., 5, p. 4891Ando, T., Mori, S., (1979) J. Phys. Soc. Jap., 47, p. 1518Stern, F., Das Sarma, S., (1984) Phys. Rev., 30, p. 840Tan, I.H., Snider, G.L., Chang, L.D., Hu, E.L., (1990) J. Appl. Phys., 68, p. 4071Bastard, G., (1991) Wave Mechanics Applied to Semiconductor NanostructuresVinter, B., (1982) Phys. Rev., 26, p. 6808Neamen, D.A., (2012) Semiconductor Physics and DevicesBraunstein, R., Moore, A.R., Herman, F., (1958) Phys. Rev., 109, p. 695Krussmann, R., Vollmer, H., Labusch, R., (1983) Phys. Stat. Sol., 118, p. 275BenDaniel, D.J., Duke, C.B., (1966) Phys. Rev., 152, p. 683Harrison, P., (2005) Quantum Wells, Wires and DotsZubkov, V.I., Melnik, M.A., Solomonov, A.V., Tsvelev, E.O., Bugge, F., Weyers, M., Tränkle, G., (2004) Phys. Rev., 70Zubkov, V.I., (2007) Semiconductors, 41, p. 331Shiff, L.I., (1949) Quantum MeschanicsScolfaro, L.M.R., Beliaev, D., Enderlein, R., Leite, J.R., (1994) Phys. Rev., 50, p. 8699Rodriguez-Vargas, I., Gaggero-Sager, L.M., (2006) Journ. Appl. Phys., 99, p. 033702Jacson, J.D., (1962) Classical ElectrodynamicsTanaka, K., Nagaoka, M., Yamabe, T., (1983) Phys. Rev, 28, p. 7068Stopa, M., DasSarma, S., (1989) Phys. Rev, 40, p. 8466Kohn, W., Luttinger, J.M., (1955) Phys. Rev., 98, p. 915Ozturk, E., Sari, H., Ergun, Y., Sokmen, I., (2003) Phys., 334, p. 1Ungan, F., Kasapoglu, E., Sarı, H., Sökmen, I., (2009) Superlatt. Microst., 46, p. 864Duque, C.A., (2015) Superlatt. Microst., 87, p. 5Tulupenko, V., Duque, C.A., Akimov, V., Demediuk, R., Belykh, V., Tiutiunnyk, A., Morales, A.L., Fomina, O., (2015) Phys., 74, p. 400Ramdas, A.K., Rodriguez, S., (1981) Rep. Prog. Phys., 44 (12), p. 1297Semiconductor Science and Technologyimpurity binding energymodulation dopingself-consistent calculationsemiconductor quantum wellsBinding energySemiconductor dopingSiliconBackground impuritiesEnergy characteristicsImpurity binding energyIntersubband optical transitionsModulation dopingQuantum well structuresSelf-consistent calculationSelf-consistent methodSemiconductor quantum wellsBackground impurities and a delta-doped QW. Part I: Center dopingArticleinfo:eu-repo/semantics/articlehttp://purl.org/coar/version/c_970fb48d4fbd8a85http://purl.org/coar/resource_type/c_6501http://purl.org/coar/resource_type/c_2df8fbb1Akimov, V., Facultad de Ciencias Básicas, Universidad de Medellín-UdeM, Carrera 87 No.30-65, Medellín, Colombia, Grupo de Materia Condensada-UdeA, Instituto de Física, Facultad de Ciencias Exactas y Naturales, Universidad de Antioquia UdeA, Calle 70 No.52-21, Medellín, Colombia; Tulupenko, V., Donbass State Engineering Academy, Academichna str. 62, Kramatorsk, 84313, Ukraine, Grupo de Materia Condensada-UdeA, Instituto de Física, Facultad de Ciencias Exactas y Naturales, Universidad de Antioquia UdeA, Calle 70 No.52-21, Medellín, Colombia; Duque, C.A., Grupo de Materia Condensada-UdeA, Instituto de Física, Facultad de Ciencias Exactas y Naturales, Universidad de Antioquia UdeA, Calle 70 No.52-21, Medellín, Colombia; Morales, A.L., Grupo de Materia Condensada-UdeA, Instituto de Física, Facultad de Ciencias Exactas y Naturales, Universidad de Antioquia UdeA, Calle 70 No.52-21, Medellín, Colombia; Demediuk, R., Donbass State Engineering Academy, Academichna str. 62, Kramatorsk, 84313, Ukraine; Tiutiunnyk, A., Instituto de Alta Investigación, Cedenna, Universidad de Tarapacá, casilla 7D, Arica, Chile; Laroze, D., Instituto de Alta Investigación, Cedenna, Universidad de Tarapacá, casilla 7D, Arica, Chile; Kovalov, V., Donbass State Engineering Academy, Academichna str. 62, Kramatorsk, 84313, Ukraine; Sushchenko, D., Donbass State Engineering Academy, Academichna str. 62, Kramatorsk, 84313, Ukrainehttp://purl.org/coar/access_right/c_16ecAkimov V.Tulupenko V.Duque C.A.Morales A.L.Demediuk R.Tiutiunnyk A.Laroze D.Kovalov V.Sushchenko D.11407/5776oai:repository.udem.edu.co:11407/57762020-05-27 17:51:09.377Repositorio Institucional Universidad de Medellinrepositorio@udem.edu.co