APA (7th ed.) Citation

(2013). Gentle and fast atomic force microscopy with a piezoelectric scanning probe for nanorobotics applications.

Chicago Style (17th ed.) Citation

Gentle and Fast Atomic Force Microscopy with a Piezoelectric Scanning Probe for Nanorobotics Applications. 2013.

MLA (8th ed.) Citation

Gentle and Fast Atomic Force Microscopy with a Piezoelectric Scanning Probe for Nanorobotics Applications. 2013.

Warning: These citations may not always be 100% accurate.