(2013). Gentle and fast atomic force microscopy with a piezoelectric scanning probe for nanorobotics applications.
Chicago Style (17th ed.) CitationGentle and Fast Atomic Force Microscopy with a Piezoelectric Scanning Probe for Nanorobotics Applications. 2013.
MLA (8th ed.) CitationGentle and Fast Atomic Force Microscopy with a Piezoelectric Scanning Probe for Nanorobotics Applications. 2013.
Warning: These citations may not always be 100% accurate.