Temperature-dependent and dielectric relaxation of porous silicon prepared by electrochemical etching

In the electronic devices based on porous silicon (PS) is important understand the physical mechanisms governing the electrical behaviour in the PS/c-Si structure. In order to investigate the conduction mechanisms in the PS/p-Si heterojunction, we prepared the PS by electrochemical etching. The temp...

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Autores:
Fonthal Rico, Faruk
Oliveros Ortiz, Edward Steven's
Chavarria Varon, Mario Andres
Tipo de recurso:
Article of journal
Fecha de publicación:
2016
Institución:
Universidad Autónoma de Occidente
Repositorio:
RED: Repositorio Educativo Digital UAO
Idioma:
eng
OAI Identifier:
oai:red.uao.edu.co:10614/11108
Acceso en línea:
http://hdl.handle.net/10614/11108
https://doi.org/10.1149/ma2016-02/27/1844
Palabra clave:
Dieléctricos
Relajación dieléctrica
Nanosilicio
Nanoelectrónica
Dielectrics
Dielectric relaxation
Nanosilicon
Nanoelectronics
Rights
closedAccess
License
Derechos Reservados - Universidad Autónoma de Occidente