Nanoindentation based on force spectroscopy with an atomic force

An implementation of the method for surface indentation based on Atomic Force Microscopy (AFM), is presented. The implementation was done using the Force Spectroscopy (FS) usually enabled on this instruments which allow vertical movement of the AFM tip without lateral displacement. Determination of...

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Autores:
Arroyave Franco, Mauricio
Tipo de recurso:
Fecha de publicación:
2008
Institución:
Universidad EAFIT
Repositorio:
Repositorio EAFIT
Idioma:
spa
OAI Identifier:
oai:repository.eafit.edu.co:10784/14521
Acceso en línea:
http://hdl.handle.net/10784/14521
Palabra clave:
Atomic Force
Force Spectroscopy
Nanoindentation
Fuerza Atómica
Espectroscopía De Fuerza
Nanoindentación
Rights
License
Copyright (c) 2008 Mauricio Arroyave Franco
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spelling Medellín de: Lat: 06 15 00 N degrees minutes Lat: 6.2500 decimal degrees Long: 075 36 00 W degrees minutes Long: -75.6000 decimal degrees2008-12-012019-11-22T19:10:47Z2008-12-012019-11-22T19:10:47Z2256-43141794-9165http://hdl.handle.net/10784/14521An implementation of the method for surface indentation based on Atomic Force Microscopy (AFM), is presented. The implementation was done using the Force Spectroscopy (FS) usually enabled on this instruments which allow vertical movement of the AFM tip without lateral displacement. Determination of the sensitive factor of the AFM cantilever was necessary to know the applied forces in the indentation process. Force versus depth curves similar to Depth–Sensing Indentation (DSI) curves were obtained however these cannot be used for mechanical diagnostics with Oliver & Pharr method. Indentations about 1 nm and 50 nm of depth on polycrystalline Silicon and 6261 Aluminium alloy respectively were produced. These open important applicationsin materials nanotechnology.Se presenta una implementación del método para el sangrado de superficie basado en Microscopía de Fuerza Atómica (AFM). La implementación se realizó utilizando la espectroscopía de fuerza (FS) generalmente habilitada en estos instrumentos que permiten el movimiento vertical de la punta AFM sin desplazamiento lateral. La determinación del factor sensible del voladizo AFM fue necesaria para conocer las fuerzas aplicadas en el proceso de sangría. Se obtuvieron curvas de fuerza versus profundidad similares a las curvas de sangría de detección de profundidad (DSI), sin embargo, estas no pueden usarse para diagnósticos mecánicos con el método de Oliver y Pharr. Se produjeron hendiduras de aproximadamente 1 nm y 50 nm de profundidad sobre silicio policristalino y aleación de aluminio 6261, respectivamente. Estas abren importantes aplicaciones en materiales nanotecnológicos.application/pdfspaUniversidad EAFIThttp://publicaciones.eafit.edu.co/index.php/ingciencia/article/view/216http://publicaciones.eafit.edu.co/index.php/ingciencia/article/view/216Copyright (c) 2008 Mauricio Arroyave FrancoAcceso abiertohttp://purl.org/coar/access_right/c_abf2instname:Universidad EAFITreponame:Repositorio Institucional Universidad EAFITIngeniería y Ciencia; Vol 4, No 8 (2008)Nanoindentation based on force spectroscopy with an atomic forceNanoindentación basada en espectroscopia de fuerzas con un microscopio de fuerza atómicaarticleinfo:eu-repo/semantics/articlepublishedVersioninfo:eu-repo/semantics/publishedVersionArtículohttp://purl.org/coar/version/c_970fb48d4fbd8a85http://purl.org/coar/resource_type/c_6501http://purl.org/coar/resource_type/c_2df8fbb1Atomic ForceForce SpectroscopyNanoindentationFuerza AtómicaEspectroscopía De FuerzaNanoindentaciónArroyave Franco, MauricioUniversidad EAFITIngeniería y Ciencia488598ing.cienc.THUMBNAILminaitura-ig_Mesa de trabajo 1.jpgminaitura-ig_Mesa de trabajo 1.jpgimage/jpeg265796https://repository.eafit.edu.co/bitstreams/18ee5f29-df51-410a-9e45-931f15d6affc/downloadda9b21a5c7e00c7f1127cef8e97035e0MD51ORIGINAL5.pdf5.pdfTexto completo PDFapplication/pdf363141https://repository.eafit.edu.co/bitstreams/784fdb66-cc12-4d61-9012-cccd34d7c8d7/downloada04fc81a23f54d0be6b124c61d5fd14dMD52articulo.htmlarticulo.htmlTexto completo HTMLtext/html373https://repository.eafit.edu.co/bitstreams/34dbcc75-4855-44db-8a0a-7e1b87886504/download73fdcb9db0deca15a538730c5604bca5MD5310784/14521oai:repository.eafit.edu.co:10784/145212020-03-02 23:05:19.845open.accesshttps://repository.eafit.edu.coRepositorio Institucional Universidad EAFITrepositorio@eafit.edu.co
dc.title.eng.fl_str_mv Nanoindentation based on force spectroscopy with an atomic force
dc.title.spa.fl_str_mv Nanoindentación basada en espectroscopia de fuerzas con un microscopio de fuerza atómica
title Nanoindentation based on force spectroscopy with an atomic force
spellingShingle Nanoindentation based on force spectroscopy with an atomic force
Atomic Force
Force Spectroscopy
Nanoindentation
Fuerza Atómica
Espectroscopía De Fuerza
Nanoindentación
title_short Nanoindentation based on force spectroscopy with an atomic force
title_full Nanoindentation based on force spectroscopy with an atomic force
title_fullStr Nanoindentation based on force spectroscopy with an atomic force
title_full_unstemmed Nanoindentation based on force spectroscopy with an atomic force
title_sort Nanoindentation based on force spectroscopy with an atomic force
dc.creator.fl_str_mv Arroyave Franco, Mauricio
dc.contributor.author.spa.fl_str_mv Arroyave Franco, Mauricio
dc.contributor.affiliation.spa.fl_str_mv Universidad EAFIT
dc.subject.keyword.eng.fl_str_mv Atomic Force
Force Spectroscopy
Nanoindentation
topic Atomic Force
Force Spectroscopy
Nanoindentation
Fuerza Atómica
Espectroscopía De Fuerza
Nanoindentación
dc.subject.keyword.spa.fl_str_mv Fuerza Atómica
Espectroscopía De Fuerza
Nanoindentación
description An implementation of the method for surface indentation based on Atomic Force Microscopy (AFM), is presented. The implementation was done using the Force Spectroscopy (FS) usually enabled on this instruments which allow vertical movement of the AFM tip without lateral displacement. Determination of the sensitive factor of the AFM cantilever was necessary to know the applied forces in the indentation process. Force versus depth curves similar to Depth–Sensing Indentation (DSI) curves were obtained however these cannot be used for mechanical diagnostics with Oliver & Pharr method. Indentations about 1 nm and 50 nm of depth on polycrystalline Silicon and 6261 Aluminium alloy respectively were produced. These open important applicationsin materials nanotechnology.
publishDate 2008
dc.date.issued.none.fl_str_mv 2008-12-01
dc.date.available.none.fl_str_mv 2019-11-22T19:10:47Z
dc.date.accessioned.none.fl_str_mv 2019-11-22T19:10:47Z
dc.date.none.fl_str_mv 2008-12-01
dc.type.eng.fl_str_mv article
info:eu-repo/semantics/article
publishedVersion
info:eu-repo/semantics/publishedVersion
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http://purl.org/coar/resource_type/c_2df8fbb1
dc.type.local.spa.fl_str_mv Artículo
status_str publishedVersion
dc.identifier.issn.none.fl_str_mv 2256-4314
1794-9165
dc.identifier.uri.none.fl_str_mv http://hdl.handle.net/10784/14521
identifier_str_mv 2256-4314
1794-9165
url http://hdl.handle.net/10784/14521
dc.language.iso.spa.fl_str_mv spa
language spa
dc.relation.isversionof.none.fl_str_mv http://publicaciones.eafit.edu.co/index.php/ingciencia/article/view/216
dc.relation.uri.none.fl_str_mv http://publicaciones.eafit.edu.co/index.php/ingciencia/article/view/216
dc.rights.eng.fl_str_mv Copyright (c) 2008 Mauricio Arroyave Franco
dc.rights.coar.fl_str_mv http://purl.org/coar/access_right/c_abf2
dc.rights.local.spa.fl_str_mv Acceso abierto
rights_invalid_str_mv Copyright (c) 2008 Mauricio Arroyave Franco
Acceso abierto
http://purl.org/coar/access_right/c_abf2
dc.format.none.fl_str_mv application/pdf
dc.coverage.spatial.eng.fl_str_mv Medellín de: Lat: 06 15 00 N degrees minutes Lat: 6.2500 decimal degrees Long: 075 36 00 W degrees minutes Long: -75.6000 decimal degrees
dc.publisher.spa.fl_str_mv Universidad EAFIT
dc.source.none.fl_str_mv instname:Universidad EAFIT
reponame:Repositorio Institucional Universidad EAFIT
dc.source.spa.fl_str_mv Ingeniería y Ciencia; Vol 4, No 8 (2008)
instname_str Universidad EAFIT
institution Universidad EAFIT
reponame_str Repositorio Institucional Universidad EAFIT
collection Repositorio Institucional Universidad EAFIT
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