Nanoindentation based on force spectroscopy with an atomic force

An implementation of the method for surface indentation based on Atomic Force Microscopy (AFM), is presented. The implementation was done using the Force Spectroscopy (FS) usually enabled on this instruments which allow vertical movement of the AFM tip without lateral displacement. Determination of...

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Autores:

Arroyave Franco, Mauricio

Tipo de recurso:

Fecha de publicación:

2008

Institución:

Universidad EAFIT

Repositorio:

Repositorio EAFIT

Idioma:

spa

OAI Identifier:

oai:repository.eafit.edu.co:10784/14521

Acceso en línea:

http://hdl.handle.net/10784/14521

Palabra clave:

Atomic Force
Force Spectroscopy
Nanoindentation
Fuerza Atómica
Espectroscopía De Fuerza
Nanoindentación

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Copyright (c) 2008 Mauricio Arroyave Franco