Physical and electrochemical study of platinum thin films deposited by sputtering and electrochemical methods

In this work platinum thin films deposited by sputtering and electrochemicalmethods were characterized through physical and electrochemical analysis. The as-grown platinum thin films were characterized through X-ray diffraction (XRD), atomic force microscopy (AFM); scanning electronic microscopy (SE...

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Autores:
Tipo de recurso:
Fecha de publicación:
2011
Institución:
Universidad del Rosario
Repositorio:
Repositorio EdocUR - U. Rosario
Idioma:
eng
OAI Identifier:
oai:repository.urosario.edu.co:10336/25988
Acceso en línea:
https://doi.org/10.1016/j.apsusc.2011.03.121
https://repository.urosario.edu.co/handle/10336/25988
Palabra clave:
Platinum
Thin film
Counter-electrode
DSSC
Rights
License
Restringido (Acceso a grupos específicos)
id EDOCUR2_ac455f0a74d296dc46c59dc521cfe2a0
oai_identifier_str oai:repository.urosario.edu.co:10336/25988
network_acronym_str EDOCUR2
network_name_str Repositorio EdocUR - U. Rosario
repository_id_str
spelling ac63c04e-2637-462a-bfb5-4b99d792afe1-1607ca645-8cc0-4d72-ba37-d319a0a6fc92-1a506b888-fcd0-4bc9-a4f8-47ab1f1da544-12020-08-06T16:20:24Z2020-08-06T16:20:24Z2011-06-15In this work platinum thin films deposited by sputtering and electrochemicalmethods were characterized through physical and electrochemical analysis. The as-grown platinum thin films were characterized through X-ray diffraction (XRD), atomic force microscopy (AFM); scanning electronic microscopy (SEM) and through electrochemical impedance spectroscopy (EIS) measurements. Structural studies indicated that platinum thin films were polycrystalline. Morphological characteristics were significantly affected by the substrate type and synthesis method. Finally the EIS analysis indicated that platinum films were electrochemically stable and present both low resistance of charge transfer and low series resistance; the equivalent circuit of platinum interface has been proposed.application/pdfhttps://doi.org/10.1016/j.apsusc.2011.03.121ISSN: 0169-4332https://repository.urosario.edu.co/handle/10336/25988engElsevier7550No. 177545Applied Surface Science, Applications of Surface ScienceVol. 257Applied Surface Science, Applications of Surface Science, ISSN: 0169-4332, Vol.257, No.17 ( 2011), pp.7545-7550https://www.sciencedirect.com/science/article/abs/pii/S0169433211004855Restringido (Acceso a grupos específicos)http://purl.org/coar/access_right/c_16ecApplied Surface Science, Applications of Surface Scienceinstname:Universidad del Rosarioreponame:Repositorio Institucional EdocURPlatinumThin filmCounter-electrodeDSSCPhysical and electrochemical study of platinum thin films deposited by sputtering and electrochemical methodsEstudio físico y electroquímico de películas delgadas de platino depositadas por pulverización y métodos electroquímicos.articleArtículohttp://purl.org/coar/version/c_970fb48d4fbd8a85http://purl.org/coar/resource_type/c_6501Quinones, C.Vallejo, W.Mesa, F.10336/25988oai:repository.urosario.edu.co:10336/259882022-05-02 07:37:21.743934https://repository.urosario.edu.coRepositorio institucional EdocURedocur@urosario.edu.co
dc.title.spa.fl_str_mv Physical and electrochemical study of platinum thin films deposited by sputtering and electrochemical methods
dc.title.TranslatedTitle.spa.fl_str_mv Estudio físico y electroquímico de películas delgadas de platino depositadas por pulverización y métodos electroquímicos.
title Physical and electrochemical study of platinum thin films deposited by sputtering and electrochemical methods
spellingShingle Physical and electrochemical study of platinum thin films deposited by sputtering and electrochemical methods
Platinum
Thin film
Counter-electrode
DSSC
title_short Physical and electrochemical study of platinum thin films deposited by sputtering and electrochemical methods
title_full Physical and electrochemical study of platinum thin films deposited by sputtering and electrochemical methods
title_fullStr Physical and electrochemical study of platinum thin films deposited by sputtering and electrochemical methods
title_full_unstemmed Physical and electrochemical study of platinum thin films deposited by sputtering and electrochemical methods
title_sort Physical and electrochemical study of platinum thin films deposited by sputtering and electrochemical methods
dc.subject.keyword.spa.fl_str_mv Platinum
Thin film
Counter-electrode
DSSC
topic Platinum
Thin film
Counter-electrode
DSSC
description In this work platinum thin films deposited by sputtering and electrochemicalmethods were characterized through physical and electrochemical analysis. The as-grown platinum thin films were characterized through X-ray diffraction (XRD), atomic force microscopy (AFM); scanning electronic microscopy (SEM) and through electrochemical impedance spectroscopy (EIS) measurements. Structural studies indicated that platinum thin films were polycrystalline. Morphological characteristics were significantly affected by the substrate type and synthesis method. Finally the EIS analysis indicated that platinum films were electrochemically stable and present both low resistance of charge transfer and low series resistance; the equivalent circuit of platinum interface has been proposed.
publishDate 2011
dc.date.created.spa.fl_str_mv 2011-06-15
dc.date.accessioned.none.fl_str_mv 2020-08-06T16:20:24Z
dc.date.available.none.fl_str_mv 2020-08-06T16:20:24Z
dc.type.eng.fl_str_mv article
dc.type.coarversion.fl_str_mv http://purl.org/coar/version/c_970fb48d4fbd8a85
dc.type.coar.fl_str_mv http://purl.org/coar/resource_type/c_6501
dc.type.spa.spa.fl_str_mv Artículo
dc.identifier.doi.none.fl_str_mv https://doi.org/10.1016/j.apsusc.2011.03.121
dc.identifier.issn.none.fl_str_mv ISSN: 0169-4332
dc.identifier.uri.none.fl_str_mv https://repository.urosario.edu.co/handle/10336/25988
url https://doi.org/10.1016/j.apsusc.2011.03.121
https://repository.urosario.edu.co/handle/10336/25988
identifier_str_mv ISSN: 0169-4332
dc.language.iso.spa.fl_str_mv eng
language eng
dc.relation.citationEndPage.none.fl_str_mv 7550
dc.relation.citationIssue.none.fl_str_mv No. 17
dc.relation.citationStartPage.none.fl_str_mv 7545
dc.relation.citationTitle.none.fl_str_mv Applied Surface Science, Applications of Surface Science
dc.relation.citationVolume.none.fl_str_mv Vol. 257
dc.relation.ispartof.spa.fl_str_mv Applied Surface Science, Applications of Surface Science, ISSN: 0169-4332, Vol.257, No.17 ( 2011), pp.7545-7550
dc.relation.uri.spa.fl_str_mv https://www.sciencedirect.com/science/article/abs/pii/S0169433211004855
dc.rights.coar.fl_str_mv http://purl.org/coar/access_right/c_16ec
dc.rights.acceso.spa.fl_str_mv Restringido (Acceso a grupos específicos)
rights_invalid_str_mv Restringido (Acceso a grupos específicos)
http://purl.org/coar/access_right/c_16ec
dc.format.mimetype.none.fl_str_mv application/pdf
dc.publisher.spa.fl_str_mv Elsevier
dc.source.spa.fl_str_mv Applied Surface Science, Applications of Surface Science
institution Universidad del Rosario
dc.source.instname.none.fl_str_mv instname:Universidad del Rosario
dc.source.reponame.none.fl_str_mv reponame:Repositorio Institucional EdocUR
repository.name.fl_str_mv Repositorio institucional EdocUR
repository.mail.fl_str_mv edocur@urosario.edu.co
_version_ 1814167458890645504

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