Physical and electrochemical study of platinum thin films deposited by sputtering and electrochemical methods

In this work platinum thin films deposited by sputtering and electrochemicalmethods were characterized through physical and electrochemical analysis. The as-grown platinum thin films were characterized through X-ray diffraction (XRD), atomic force microscopy (AFM); scanning electronic microscopy (SE...

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Autores:

Tipo de recurso:

Fecha de publicación:

2011

Institución:

Universidad del Rosario

Repositorio:

Repositorio EdocUR - U. Rosario

Idioma:

eng

OAI Identifier:

oai:repository.urosario.edu.co:10336/25988

Acceso en línea:

https://doi.org/10.1016/j.apsusc.2011.03.121
https://repository.urosario.edu.co/handle/10336/25988

Palabra clave:

Platinum
Thin film
Counter-electrode
DSSC

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