Showing 1 - 14 results of 14 for search '"electronics"', query time: 0.06s Refine Results
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    Article of journal
    Repositorio Repositorio Digital UFPS

    ... Microscopy (AFM), Scanning Electron Microscopy (SEM), X-ray diffraction (XRD) besides the measured...
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  4. 4
    Article of journal
    Repositorio Repositorio Digital UFPS

    ... characterize the material by X-ray scanning electron microscopy, and ultraviolet-visible spectroscopy....
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  5. 5
    Article of journal
    Repositorio Repositorio Digital UFPS

    ... characterize the material by X-ray scanning electron microscopy, and ultraviolet-visible spectroscopy....
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    Article of journal
    Repositorio Repositorio Digital UFPS

    ... characterized by X-ray diffraction and scanning electron microscopy. The results showed that the presence of HNO...
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    Article of journal
    Repositorio Repositorio Digital UFPS

    ... characterized by X-ray diffraction and scanning electron microscopy. The results showed that the presence of HNO...
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  8. 8
    Article of journal
    Repositorio Repositorio Digital UFPS

    ... Electron Microscopy (SEM), Brunauer, Emmett and Teller (BET) surface area measurements, UV-visible...
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  9. 9
    Article of journal
    Repositorio Repositorio Digital UFPS

    ... Electron Microscopy (SEM), Brunauer, Emmett and Teller (BET) surface area measurements, UV-visible...
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  10. 10
    Article of journal
    Repositorio Repositorio Digital UFPS

    ... and characterized topographically by Scanning Electron Microscopy SEM and structurally by X-ray diffraction XRD...
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