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1Por Barrios Arlante, Juan José; Contreras Pico, Carlos Ricardo; Meneses Fonseca, Jaime Enrique; Castro Jaluba, William Razvan; González Querubín, Edwin Alonso; Carreño Zagarra, José Jorge; Ospina Henao, Paolo Andrés; Delgado Moreno, Frank Nikolás; Torres Murillo, Ethman Ariel; Rueda Forero, Pascual; Alzate Marín, José Joaquín; Aguilar Imitola, Karin Julieth; Martínez Quezada, Daniel Orlando; Díaz Contreras, Gustavo Adolfo; Flórez Ordóñez, Yudy Natalia; Navas Gómez, Tatiana InésPublished in 2021Repositorio Repositorio Institucional USTAGet full text
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2Por Barrios Arlante, Juan José; Contreras Pico, Carlos Ricardo; Meneses Fonseca, Jaime Enrique; Castro Jaluba, William Razvan; González Querubín, Edwin Alonso; Carreño Zagarra, José Jorge; Ospina Henao, Paolo Andrés; Delgado Moreno, Frank Nikolás; Torres Murillo, Ethman Ariel; Rueda Forero, Pascual; Alzate Marín, José Joaquín; Aguilar Imitola, Karin Julieth; Martínez Quezada, Daniel Orlando; Díaz Contreras, Gustavo Adolfo; Flórez Ordóñez, Yudy Natalia; Navas Gómez, Tatiana InésPublished in 2021Repositorio Repositorio Institucional USTAGet full text
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3Por Barrios Arlante, Juan José; Contreras Pico, Carlos Ricardo; Meneses Fonseca, Jaime Enrique; Castro Jaluba, William Razvan; González Querubín, Edwin Alonso; Carreño Zagarra, José Jorge; Ospina Henao, Paolo Andrés; Delgado Moreno, Frank Nikolás; Torres Murillo, Ethman Ariel; Rueda Forero, Pascual; Alzate Marín, José Joaquín; Aguilar Imitola, Karin Julieth; Martínez Quezada, Daniel Orlando; Díaz Contreras, Gustavo Adolfo; Flórez Ordóñez, Yudy Natalia; Navas Gómez, Tatiana InésPublished in 2021Repositorio Universidad Santo TomásGet full text
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4Published in 2013Repositorio Repositorio Institucional USTA“... of analyzing samples without the need to invade with any type of destructive coating like electron microscopes...”
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5Published in 2013Repositorio Universidad Santo Tomás“... of analyzing samples without the need to invade with any type of destructive coating like electron microscopes...”
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6Published in 2013Repositorio Repositorio Institucional USTA“... of analyzing samples without the need to invade with any type of destructive coating like electron microscopes...”
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