Showing 1 - 7 results of 7 for search '"electronics"', query time: 0.04s Refine Results
  1. 1
    Article of journal
    Repositorio RED: Repositorio Educativo Digital UAO

    ... diffraction (XRD), X-ray photo-electron spectroscopy (XPS), atomic force microscopy (AFM), scanning electron...
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  2. 2
    Part of book
    Repositorio RED: Repositorio Educativo Digital UAO

    ...) was measure using a scanning electron microscopy (SEM). After the milling process, the particle size showed a...
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