LFSR characteristic polynomial and phase shifter computation for two-dimensional test set generation
In built-in two-dimensional deterministic test pattern generation, a Linear Feedback Shift Register (LFSR) extended by phase shifters (PS) is commonly used for generating the test patterns. The specific LFSR/PS structure is currently chosen a-priori without regard to the actual test set. In this pap...
- Autores:
- Tipo de recurso:
- Fecha de publicación:
- 2017
- Institución:
- Universidad Tecnológica de Bolívar
- Repositorio:
- Repositorio Institucional UTB
- Idioma:
- eng
- OAI Identifier:
- oai:repositorio.utb.edu.co:20.500.12585/8936
- Acceso en línea:
- https://hdl.handle.net/20.500.12585/8936
- Palabra clave:
- Phase shifters
Characteristic polynomials
Deterministic test pattern
Linear feedback shift registers
Structure-based
Test Pattern
Test sets
Two-dimensional tests
Shift registers
- Rights
- restrictedAccess
- License
- http://creativecommons.org/licenses/by-nc-nd/4.0/
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LFSR characteristic polynomial and phase shifter computation for two-dimensional test set generation |
| title |
LFSR characteristic polynomial and phase shifter computation for two-dimensional test set generation |
| spellingShingle |
LFSR characteristic polynomial and phase shifter computation for two-dimensional test set generation Phase shifters Characteristic polynomials Deterministic test pattern Linear feedback shift registers Structure-based Test Pattern Test sets Two-dimensional tests Shift registers |
| title_short |
LFSR characteristic polynomial and phase shifter computation for two-dimensional test set generation |
| title_full |
LFSR characteristic polynomial and phase shifter computation for two-dimensional test set generation |
| title_fullStr |
LFSR characteristic polynomial and phase shifter computation for two-dimensional test set generation |
| title_full_unstemmed |
LFSR characteristic polynomial and phase shifter computation for two-dimensional test set generation |
| title_sort |
LFSR characteristic polynomial and phase shifter computation for two-dimensional test set generation |
| dc.subject.keywords.none.fl_str_mv |
Phase shifters Characteristic polynomials Deterministic test pattern Linear feedback shift registers Structure-based Test Pattern Test sets Two-dimensional tests Shift registers |
| topic |
Phase shifters Characteristic polynomials Deterministic test pattern Linear feedback shift registers Structure-based Test Pattern Test sets Two-dimensional tests Shift registers |
| description |
In built-in two-dimensional deterministic test pattern generation, a Linear Feedback Shift Register (LFSR) extended by phase shifters (PS) is commonly used for generating the test patterns. The specific LFSR/PS structure is currently chosen a-priori without regard to the actual test set. In this paper, we present a method to design the LFSR/PS structure based on the particular test set that we are given. Comparative experimental results show that the methodology can attain 100% coverage which cannot be achieved with current approaches. © 2017 IEEE. |
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2017 |
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2017 |
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2020-03-26T16:32:37Z |
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2020-03-26T16:32:37Z |
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http://purl.org/coar/version/c_970fb48d4fbd8a85 |
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LATS 2017 - 18th IEEE Latin-American Test Symposium |
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9781538604151 |
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https://hdl.handle.net/20.500.12585/8936 |
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10.1109/LATW.2017.7906758 |
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Universidad Tecnológica de Bolívar |
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Repositorio UTB |
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57197327858 7004389110 |
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LATS 2017 - 18th IEEE Latin-American Test Symposium 9781538604151 10.1109/LATW.2017.7906758 Universidad Tecnológica de Bolívar Repositorio UTB 57197327858 7004389110 |
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https://hdl.handle.net/20.500.12585/8936 |
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eng |
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eng |
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13 March 2017 through 15 March 2017 |
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Institute of Electrical and Electronics Engineers Inc. |
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Institute of Electrical and Electronics Engineers Inc. |
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2020-03-26T16:32:37Z2020-03-26T16:32:37Z2017LATS 2017 - 18th IEEE Latin-American Test Symposium9781538604151https://hdl.handle.net/20.500.12585/893610.1109/LATW.2017.7906758Universidad Tecnológica de BolívarRepositorio UTB571973278587004389110In built-in two-dimensional deterministic test pattern generation, a Linear Feedback Shift Register (LFSR) extended by phase shifters (PS) is commonly used for generating the test patterns. The specific LFSR/PS structure is currently chosen a-priori without regard to the actual test set. In this paper, we present a method to design the LFSR/PS structure based on the particular test set that we are given. Comparative experimental results show that the methodology can attain 100% coverage which cannot be achieved with current approaches. © 2017 IEEE.IEEE Colombia ChapterRecurso electrónicoapplication/pdfengInstitute of Electrical and Electronics Engineers Inc.http://creativecommons.org/licenses/by-nc-nd/4.0/info:eu-repo/semantics/restrictedAccessAtribución-NoComercial 4.0 Internacionalhttp://purl.org/coar/access_right/c_16echttps://www.scopus.com/inward/record.uri?eid=2-s2.0-85020214634&doi=10.1109%2fLATW.2017.7906758&partnerID=40&md5=786fd8d8ebbd541ded723bc37ccb1a54Scopus2-s2.0-8502021463418th IEEE Latin-American Test Symposium, LATS 2017LFSR characteristic polynomial and phase shifter computation for two-dimensional test set generationinfo:eu-repo/semantics/conferenceObjectinfo:eu-repo/semantics/publishedVersionConferenciahttp://purl.org/coar/version/c_970fb48d4fbd8a85http://purl.org/coar/resource_type/c_c94fPhase shiftersCharacteristic polynomialsDeterministic test patternLinear feedback shift registersStructure-basedTest PatternTest setsTwo-dimensional testsShift registers13 March 2017 through 15 March 2017Acevedo Patiño, ÓscarKagaris D.Abramovici, M., Breuer, M.A., Friedman, A.D., (1990) Digital Systems Testing and Testable Design, , Computer Science PressBardell, P., McAnney, W., Savir, J., (1987) Built-in Test for VLSI: Pseudorandom Techniques, , Wiley-InterscienceRajski, J., Tamarapalli, N., Tyszer, J., Automated synthesis of phase shifters for built-in self-test applications (2000) IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 19 (10), pp. 1175-1188. , OctKagaris, D., A unified method for phase shifter computation (2005) ACM Transactions on Design Automation of Electronic Systems, 10 (1), pp. 157-167Konemann, B., LFSR-coded test patterns for scan designs (1991) Proceedings European Test Conference, pp. 237-242Rajski, J., Tyszer, J., Kassab, M., Mukherjee, N., Embedded deterministic test (2004) IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 23 (5), pp. 776-792Hellebrand, S., Tarnick, S., Rajski, J., Courtois, B., Generation of vector patterns through reseeding of multiple-polynomial linear feedback shift register (1992) Proceedings of International Test Conference, pp. 120-129Mrugalski, G., Tyszer, J., Rajski, J., Linear independence as evaluation criterion for two-dimensional test pattern generators (2000) Proceedings 18th IEEE VLSI Test Symposium, pp. 377-386Chen, C.L., Linear dependencies in linear feedback shift registers (1986) IEEE Transactions on Computers, C-35 (12), pp. 1086-1088. , DecBardell, P.H., Calculating the effects of linear dependencies in m-sequences used as test stimuli (1992) IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 11 (1), pp. 83-86. , JanBanerjee, S., Chowdhury, D.R., Bhattacharya, B.B., An efficient scan tree design for compact test pattern set (2006) 19th International Conference on VLSI Design, pp. 3-7. , JanRajski, J., Tyszer, J., Primitive polynomials over GF(2) of degree up to 660 with uniformly distributed coefficients (2003) Journal of Electronic Testing, 19 (6), pp. 645-657Acevedo, O., Kagaris, D., Using the berlekamp-massey algorithm to obtain LFSR characteristic polynomials for TPG (2012) 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), pp. 233-238Acevedo, O., Kagaris, D., On the computation of LFSR characteristic polynomials for built-in deterministic test pattern generation (2016) IEEE Transactions on Computers, 65 (2), pp. 664-669http://purl.org/coar/resource_type/c_c94fTHUMBNAILMiniProdInv.pngMiniProdInv.pngimage/png23941https://repositorio.utb.edu.co/bitstream/20.500.12585/8936/1/MiniProdInv.png0cb0f101a8d16897fb46fc914d3d7043MD5120.500.12585/8936oai:repositorio.utb.edu.co:20.500.12585/89362023-04-21 15:21:42.847Repositorio Institucional UTBrepositorioutb@utb.edu.co |