LFSR characteristic polynomial and phase shifter computation for two-dimensional test set generation
In built-in two-dimensional deterministic test pattern generation, a Linear Feedback Shift Register (LFSR) extended by phase shifters (PS) is commonly used for generating the test patterns. The specific LFSR/PS structure is currently chosen a-priori without regard to the actual test set. In this pap...
- Autores:
- Tipo de recurso:
- Fecha de publicación:
- 2017
- Institución:
- Universidad Tecnológica de Bolívar
- Repositorio:
- Repositorio Institucional UTB
- Idioma:
- eng
- OAI Identifier:
- oai:repositorio.utb.edu.co:20.500.12585/8936
- Acceso en línea:
- https://hdl.handle.net/20.500.12585/8936
- Palabra clave:
- Phase shifters
Characteristic polynomials
Deterministic test pattern
Linear feedback shift registers
Structure-based
Test Pattern
Test sets
Two-dimensional tests
Shift registers
- Rights
- restrictedAccess
- License
- http://creativecommons.org/licenses/by-nc-nd/4.0/
| Summary: | In built-in two-dimensional deterministic test pattern generation, a Linear Feedback Shift Register (LFSR) extended by phase shifters (PS) is commonly used for generating the test patterns. The specific LFSR/PS structure is currently chosen a-priori without regard to the actual test set. In this paper, we present a method to design the LFSR/PS structure based on the particular test set that we are given. Comparative experimental results show that the methodology can attain 100% coverage which cannot be achieved with current approaches. © 2017 IEEE. |
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