Through-glass interposer integrated high quality RF components

High quality and compact RF devices, using the half mode substrate integrated waveguide (HMSIW) architecture loaded with a complementary split ring resonator (CSRR), are implemented on a glass interposer layer, which therefore serves as an interconnection layer and as a host medium for integrated pa...

Full description

Autores:
Tipo de recurso:
Fecha de publicación:
2014
Institución:
Universidad Tecnológica de Bolívar
Repositorio:
Repositorio Institucional UTB
Idioma:
eng
OAI Identifier:
oai:repositorio.utb.edu.co:20.500.12585/9063
Acceso en línea:
https://hdl.handle.net/20.500.12585/9063
Palabra clave:
Bandpass filters
Bandwidth
Glass
Microwave circuits
Optical resonators
Resonators
Substrates
Surface micromachining
Waveguides
Bandpass filter (BPFs)
Complementary split-ring resonator
Electrical conductivity
Evanescent wave amplification
External quality factor
Half-mode substrate integrated waveguides
Interconnection layers
Waveguiding structures
Substrate integrated waveguides
Rights
restrictedAccess
License
http://creativecommons.org/licenses/by-nc-nd/4.0/
Description
Summary:High quality and compact RF devices, using the half mode substrate integrated waveguide (HMSIW) architecture loaded with a complementary split ring resonator (CSRR), are implemented on a glass interposer layer, which therefore serves as an interconnection layer and as a host medium for integrated passive RF components. Compared with the silicon interposer approach, which suffers from large electrical conductivity and therefore substrate loss, the glass interposer has advantages of low substrate loss, allowing high quality interconnection and passive circuits, and low material and manufacturing costs. Corning fusion glass is selected as the substrate to realize the compact CSRR-loaded HMSIW resonators and bandpass filters (BPFs) working under the principle of evanescent wave amplification. Two and three pole bandpass filters are designed for broadband operation at 5.8 GHz. Thru glass vias (TGVs) are used to define the side-wall of the substrate integrated waveguiding structure. Surface micromachining techniques are used to fabricate the proposed devices. The variations of the external quality factor (Qe) of the resonator and the internal coupling coefficient (M) of the coupled resonators are studied for filter design. Operation of the filters at 5.8 GHz with a fractional bandwidth (FBW) of more than 10% for an in-band return loss of better than 20 dB and an low insertion loss of less than 1.35 dB has been obtained, which is not feasible with a usual Si interposer approach. Measurement results are presented from 2 to 10 GHz and show good agreement with simulated ones. © 2014 IEEE.