Speckle interferometry single-shot applications with multiple carrier-fringe information
The need for robust equipment that allows identifying defects or measuring small displacements in a harsh environment has been a requirement in the aeronautical and principally in the Oil & Gas industry. In this field, Digital Speckle Pattern Interferometry and shearography had been the optical...
- Autores:
-
Sánchez Barrera, Estiven
- Tipo de recurso:
- Fecha de publicación:
- 2023
- Institución:
- Universidad Tecnológica de Bolívar
- Repositorio:
- Repositorio Institucional UTB
- Idioma:
- eng
- OAI Identifier:
- oai:repositorio.utb.edu.co:20.500.12585/12442
- Acceso en línea:
- https://hdl.handle.net/20.500.12585/12442
- Palabra clave:
- Digital Speckle Pattern Interferometry
Spatial Phase Measurement
Robust Measurement
Carrier-fringes
Single-shot applications
- Rights
- closedAccess
- License
- http://purl.org/coar/access_right/c_14cb
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Speckle interferometry single-shot applications with multiple carrier-fringe information |
| title |
Speckle interferometry single-shot applications with multiple carrier-fringe information |
| spellingShingle |
Speckle interferometry single-shot applications with multiple carrier-fringe information Digital Speckle Pattern Interferometry Spatial Phase Measurement Robust Measurement Carrier-fringes Single-shot applications |
| title_short |
Speckle interferometry single-shot applications with multiple carrier-fringe information |
| title_full |
Speckle interferometry single-shot applications with multiple carrier-fringe information |
| title_fullStr |
Speckle interferometry single-shot applications with multiple carrier-fringe information |
| title_full_unstemmed |
Speckle interferometry single-shot applications with multiple carrier-fringe information |
| title_sort |
Speckle interferometry single-shot applications with multiple carrier-fringe information |
| dc.creator.fl_str_mv |
Sánchez Barrera, Estiven |
| dc.contributor.author.none.fl_str_mv |
Sánchez Barrera, Estiven |
| dc.subject.keywords.spa.fl_str_mv |
Digital Speckle Pattern Interferometry Spatial Phase Measurement Robust Measurement Carrier-fringes Single-shot applications |
| topic |
Digital Speckle Pattern Interferometry Spatial Phase Measurement Robust Measurement Carrier-fringes Single-shot applications |
| description |
The need for robust equipment that allows identifying defects or measuring small displacements in a harsh environment has been a requirement in the aeronautical and principally in the Oil & Gas industry. In this field, Digital Speckle Pattern Interferometry and shearography had been the optical techniques more used. Recently, advances in the process of phase images through multiple carrier frequencies had allowed compact optical configurations that can combine multiple acquisitions or even multiple techniques in an simple process of capture. This article shows the different applications, versatility, and compactness of the use of carrier frequencies through the multiple aperture principle. |
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2023 |
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2023-07-27T20:24:53Z |
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2023-07-27T20:24:53Z |
| dc.date.issued.none.fl_str_mv |
2023-06-15 |
| dc.date.submitted.none.fl_str_mv |
2023-06-15 |
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http://purl.org/coar/version/c_970fb48d4fbd8a85 |
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info:eu-repo/semantics/lecture |
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info:eu-repo/semantics/publishedVersion |
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http://purl.org/coar/resource_type/c_8544 |
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publishedVersion |
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Estiven Sánchez Barrera, "Speckle interferometry single-shot applications with multiple carrier-fringe information," Proc. SPIE 12524, Dimensional Optical Metrology and Inspection for Practical Applications XII , 1252402 (15 June 2023); doi: 10.1117/12.2662369 |
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0277-786X |
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https://hdl.handle.net/20.500.12585/12442 |
| dc.identifier.instname.spa.fl_str_mv |
Universidad Tecnológica de Bolívar |
| dc.identifier.reponame.spa.fl_str_mv |
Repositorio Universidad Tecnológica de Bolívar |
| identifier_str_mv |
Estiven Sánchez Barrera, "Speckle interferometry single-shot applications with multiple carrier-fringe information," Proc. SPIE 12524, Dimensional Optical Metrology and Inspection for Practical Applications XII , 1252402 (15 June 2023); doi: 10.1117/12.2662369 0277-786X Universidad Tecnológica de Bolívar Repositorio Universidad Tecnológica de Bolívar |
| url |
https://hdl.handle.net/20.500.12585/12442 |
| dc.language.iso.spa.fl_str_mv |
eng |
| language |
eng |
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http://purl.org/coar/access_right/c_14cb |
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info:eu-repo/semantics/closedAccess |
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closedAccess |
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http://purl.org/coar/access_right/c_14cb |
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11 páginas |
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application/pdf |
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Cartagena de Indias |
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Universidad Tecnológica de Bolívar |
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Sánchez Barrera, Estiven338ae022-97b6-407e-b53b-4fe8139105b76002023-07-27T20:24:53Z2023-07-27T20:24:53Z2023-06-152023-06-15Estiven Sánchez Barrera, "Speckle interferometry single-shot applications with multiple carrier-fringe information," Proc. SPIE 12524, Dimensional Optical Metrology and Inspection for Practical Applications XII , 1252402 (15 June 2023); doi: 10.1117/12.26623690277-786Xhttps://hdl.handle.net/20.500.12585/12442Universidad Tecnológica de BolívarRepositorio Universidad Tecnológica de BolívarThe need for robust equipment that allows identifying defects or measuring small displacements in a harsh environment has been a requirement in the aeronautical and principally in the Oil & Gas industry. In this field, Digital Speckle Pattern Interferometry and shearography had been the optical techniques more used. Recently, advances in the process of phase images through multiple carrier frequencies had allowed compact optical configurations that can combine multiple acquisitions or even multiple techniques in an simple process of capture. This article shows the different applications, versatility, and compactness of the use of carrier frequencies through the multiple aperture principle.11 páginasapplication/pdfengSpeckle interferometry single-shot applications with multiple carrier-fringe informationinfo:eu-repo/semantics/lectureinfo:eu-repo/semantics/publishedVersionhttp://purl.org/coar/resource_type/c_8544http://purl.org/coar/version/c_970fb48d4fbd8a85Digital Speckle Pattern InterferometrySpatial Phase MeasurementRobust MeasurementCarrier-fringesSingle-shot applicationsinfo:eu-repo/semantics/closedAccesshttp://purl.org/coar/access_right/c_14cbCartagena de IndiasPúblico generalGoodman, J. W., [Speckle phenomena in optics: theory and applications ], SPIE (2007).(ed), P. K. R., “Digital speckle pattern interferometry and related techniques,” Measurement Science and Technology 12, 1606 (sep 2001).Schmit, J., Creath, K., and Kujawinska, M., “Spatial and temporal phase-measurement techniques: a comparison of major error sources in one dimension,” in [Interferometry: Techniques and Analysis ], Brown, G. M., Kwon, O. Y., Kujawinska, M., and Reid, G. T., eds., 1755, 202 – 211, International Society for Optics and Photonics, SPIE (1993).Kujawinska, M. and Wojiak, J., “Spatial phase-shifting techniques of fringe pattern analysis in photome chanics,” in [Second International Conference on Photomechanics and Speckle Metrology], Chiang, F.-P. and Chiang, F.-P., eds., 1554, 503, International Society for Optics and Photonics, SPIE (1991).Creath, K. and Goldstein, G., “Dynamic quantitative phase imaging for biological objects using a pixelated phase mask,” Biomed. Opt. Express 3, 2866–2880 (Nov 2012).Pedrini, G., Zou, Y.-L., and Tiziani, H. J., “Quantitative evaluation of digital shearing interferogram using the spatial carrier method,” Pure and Applied Optics: Journal of the European Optical Society Part A 5, 313 (may 1996).Santos, F., Vaz, M., and Monteiro, J., “A new set-up for pulsed digital shearography applied to defect detection in composite structures,” Optics and Lasers in Engineering 42(2), 131–140 (2004).Bhaduri, B., Mohan, N. K., Kothiyal, M. P., and Sirohi, R., “Use of spatial phase shifting technique in digital speckle pattern interferometry (dspi) and digital shearography (ds),” Opt. Express 14, 11598–11607 (Nov 2006).Barrera, E. S., Fantin, A. V., Willemann, D. P., Benedet, M. E., and Albertazzi Gon¸calves Jr., A., “Multiple aperture one-shot shearography for simultaneous measurements in three shearing directions,” Optics and Lasers in Engineering 111, 86–92 (2018).Takeda, M., Ina, H., and Kobayashi, S., “Fourier-transform method of fringe-pattern analysis for computer based topography and interferometry,” J. Opt. Soc. Am. 72, 156–160 (Jan 1982).Chang, G.-W., Lin, Y.-H., and Yeh, Z.-M., “White light interferometric profile measurement system us ing spectral coherence,” in [Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS VI], Hartzell, A. L. and Ramesham, R., eds., 6463, 64630I, International Society for Optics and Photonics, SPIE (2007).Barrera, E. S. and Cuello, J. L. E., “Measuring material thickness changes through tri-aperture digital speckle pattern interferometry,” Optical Engineering 62(1), 014108 (2023).http://purl.org/coar/resource_type/c_c94fORIGINALSpeckle Interferometry single-shot applications.pdfSpeckle Interferometry single-shot applications.pdfArtículo principalapplication/pdf8923362https://repositorio.utb.edu.co/bitstream/20.500.12585/12442/1/Speckle%20Interferometry%20single-shot%20applications.pdf10824022a38059d71cac8adfc66f59fcMD51LICENSElicense.txtlicense.txttext/plain; charset=utf-83182https://repositorio.utb.edu.co/bitstream/20.500.12585/12442/2/license.txte20ad307a1c5f3f25af9304a7a7c86b6MD52TEXTSpeckle Interferometry single-shot applications.pdf.txtSpeckle Interferometry single-shot applications.pdf.txtExtracted texttext/plain21106https://repositorio.utb.edu.co/bitstream/20.500.12585/12442/3/Speckle%20Interferometry%20single-shot%20applications.pdf.txt2946976de03b88ba057b435457738577MD53THUMBNAILSpeckle Interferometry 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