Microwave characteristics of sol-gel based Ag-doped (Ba 0.6Sr0.4)TiO3 thin films

Dielectric Ba0.6Sr0.4TiO3 (BST) thin films with a different concentration of Ag-dopant of 0.5, 1, 1.5, 2, 3, and 5 mol % have been prepared using an alkoxide-based sol-gel method on a Pt(111)/TiO 2/SiO2/Si substrate and their surface morphology and crystallinity have been examined using scanning ele...

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Tipo de recurso:
Fecha de publicación:
2014
Institución:
Universidad Tecnológica de Bolívar
Repositorio:
Repositorio Institucional UTB
Idioma:
eng
OAI Identifier:
oai:repositorio.utb.edu.co:20.500.12585/9034
Acceso en línea:
https://hdl.handle.net/20.500.12585/9034
Palabra clave:
Barium strontium titanate
Dielectric properties
Microwave
Silver doping
Sol-Gel deposition
Tunability
Barium strontium titanate
Dielectric losses
Dielectric properties
Electric fields
Film preparation
Metal insulator boundaries
Microwaves
Scanning electron microscopy
Semiconductor doping
Sol-gel process
Sol-gels
Thin films
Alkoxide-based sol-gel methods
Electrical characterization
Metal insulator metal capacitor (MIM)
Microwave characteristics
Silver doping
Sol-gel deposition
Thin film ferroelectrics
Tunabilities
Silver
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restrictedAccess
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http://creativecommons.org/licenses/by-nc-nd/4.0/
id UTB2_09be69eafe0e9ef07da4b75a16a5157f
oai_identifier_str oai:repositorio.utb.edu.co:20.500.12585/9034
network_acronym_str UTB2
network_name_str Repositorio Institucional UTB
repository_id_str
dc.title.none.fl_str_mv Microwave characteristics of sol-gel based Ag-doped (Ba 0.6Sr0.4)TiO3 thin films
title Microwave characteristics of sol-gel based Ag-doped (Ba 0.6Sr0.4)TiO3 thin films
spellingShingle Microwave characteristics of sol-gel based Ag-doped (Ba 0.6Sr0.4)TiO3 thin films
Barium strontium titanate
Dielectric properties
Microwave
Silver doping
Sol-Gel deposition
Tunability
Barium strontium titanate
Dielectric losses
Dielectric properties
Electric fields
Film preparation
Metal insulator boundaries
Microwaves
Scanning electron microscopy
Semiconductor doping
Sol-gel process
Sol-gels
Thin films
Alkoxide-based sol-gel methods
Electrical characterization
Metal insulator metal capacitor (MIM)
Microwave characteristics
Silver doping
Sol-gel deposition
Thin film ferroelectrics
Tunabilities
Silver
title_short Microwave characteristics of sol-gel based Ag-doped (Ba 0.6Sr0.4)TiO3 thin films
title_full Microwave characteristics of sol-gel based Ag-doped (Ba 0.6Sr0.4)TiO3 thin films
title_fullStr Microwave characteristics of sol-gel based Ag-doped (Ba 0.6Sr0.4)TiO3 thin films
title_full_unstemmed Microwave characteristics of sol-gel based Ag-doped (Ba 0.6Sr0.4)TiO3 thin films
title_sort Microwave characteristics of sol-gel based Ag-doped (Ba 0.6Sr0.4)TiO3 thin films
dc.subject.keywords.none.fl_str_mv Barium strontium titanate
Dielectric properties
Microwave
Silver doping
Sol-Gel deposition
Tunability
Barium strontium titanate
Dielectric losses
Dielectric properties
Electric fields
Film preparation
Metal insulator boundaries
Microwaves
Scanning electron microscopy
Semiconductor doping
Sol-gel process
Sol-gels
Thin films
Alkoxide-based sol-gel methods
Electrical characterization
Metal insulator metal capacitor (MIM)
Microwave characteristics
Silver doping
Sol-gel deposition
Thin film ferroelectrics
Tunabilities
Silver
topic Barium strontium titanate
Dielectric properties
Microwave
Silver doping
Sol-Gel deposition
Tunability
Barium strontium titanate
Dielectric losses
Dielectric properties
Electric fields
Film preparation
Metal insulator boundaries
Microwaves
Scanning electron microscopy
Semiconductor doping
Sol-gel process
Sol-gels
Thin films
Alkoxide-based sol-gel methods
Electrical characterization
Metal insulator metal capacitor (MIM)
Microwave characteristics
Silver doping
Sol-gel deposition
Thin film ferroelectrics
Tunabilities
Silver
description Dielectric Ba0.6Sr0.4TiO3 (BST) thin films with a different concentration of Ag-dopant of 0.5, 1, 1.5, 2, 3, and 5 mol % have been prepared using an alkoxide-based sol-gel method on a Pt(111)/TiO 2/SiO2/Si substrate and their surface morphology and crystallinity have been examined using scanning electron microscopy (SEM) and X-ray diffraction (XRD) analysis, respectively. An on-chip metal-insulator-metal capacitor has been fabricated with the prepared thin film ferroelectric sample. Concentric coplanar electrodes are used for high frequency electrical characterization with a vector network analyzer and a probe station. The SEM images show that increasing Ag doping concentration leads to a decrease in grain size. XRD reveals that the fabricated films show good BST crystallinity for all the concentration while a doping concentration of 5 mol % starts to show an Ag peak, implying a metallic phase. Improved microwave dielectric loss properties of the BST thin films are observed in a low Ag doping level. Especially, BST with an Ag doping concentration of 1 mol % shows the best properties with a dielectric constant of 269.3, a quality factor of 48.1, a tunability at the electric field of 100 kV/cm of 41.2 %, a leakage-current density of 1.045 × 10- 7A/cm2 at an electric field of 100 kV/cm and a figure of merit (defined by tunability (%) divided by tan δ (%)) of 19.59 under a dc bias voltage of 10 V at 1 GHz. © 2014 Elsevier B.V. All rights reserved.
publishDate 2014
dc.date.issued.none.fl_str_mv 2014
dc.date.accessioned.none.fl_str_mv 2020-03-26T16:32:49Z
dc.date.available.none.fl_str_mv 2020-03-26T16:32:49Z
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dc.type.driver.none.fl_str_mv info:eu-repo/semantics/article
dc.type.hasversion.none.fl_str_mv info:eu-repo/semantics/publishedVersion
dc.type.spa.none.fl_str_mv Artículo
status_str publishedVersion
dc.identifier.citation.none.fl_str_mv Thin Solid Films; Vol. 565, pp. 172-178
dc.identifier.issn.none.fl_str_mv 00406090
dc.identifier.uri.none.fl_str_mv https://hdl.handle.net/20.500.12585/9034
dc.identifier.doi.none.fl_str_mv 10.1016/j.tsf.2014.06.047
dc.identifier.instname.none.fl_str_mv Universidad Tecnológica de Bolívar
dc.identifier.reponame.none.fl_str_mv Repositorio UTB
dc.identifier.orcid.none.fl_str_mv 7409321912
56021218700
36698427600
7409767761
7402126778
identifier_str_mv Thin Solid Films; Vol. 565, pp. 172-178
00406090
10.1016/j.tsf.2014.06.047
Universidad Tecnológica de Bolívar
Repositorio UTB
7409321912
56021218700
36698427600
7409767761
7402126778
url https://hdl.handle.net/20.500.12585/9034
dc.language.iso.none.fl_str_mv eng
language eng
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dc.rights.accessrights.none.fl_str_mv info:eu-repo/semantics/restrictedAccess
dc.rights.cc.none.fl_str_mv Atribución-NoComercial 4.0 Internacional
rights_invalid_str_mv http://creativecommons.org/licenses/by-nc-nd/4.0/
Atribución-NoComercial 4.0 Internacional
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dc.publisher.none.fl_str_mv Elsevier
publisher.none.fl_str_mv Elsevier
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institution Universidad Tecnológica de Bolívar
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spelling 2020-03-26T16:32:49Z2020-03-26T16:32:49Z2014Thin Solid Films; Vol. 565, pp. 172-17800406090https://hdl.handle.net/20.500.12585/903410.1016/j.tsf.2014.06.047Universidad Tecnológica de BolívarRepositorio UTB7409321912560212187003669842760074097677617402126778Dielectric Ba0.6Sr0.4TiO3 (BST) thin films with a different concentration of Ag-dopant of 0.5, 1, 1.5, 2, 3, and 5 mol % have been prepared using an alkoxide-based sol-gel method on a Pt(111)/TiO 2/SiO2/Si substrate and their surface morphology and crystallinity have been examined using scanning electron microscopy (SEM) and X-ray diffraction (XRD) analysis, respectively. An on-chip metal-insulator-metal capacitor has been fabricated with the prepared thin film ferroelectric sample. Concentric coplanar electrodes are used for high frequency electrical characterization with a vector network analyzer and a probe station. The SEM images show that increasing Ag doping concentration leads to a decrease in grain size. XRD reveals that the fabricated films show good BST crystallinity for all the concentration while a doping concentration of 5 mol % starts to show an Ag peak, implying a metallic phase. Improved microwave dielectric loss properties of the BST thin films are observed in a low Ag doping level. Especially, BST with an Ag doping concentration of 1 mol % shows the best properties with a dielectric constant of 269.3, a quality factor of 48.1, a tunability at the electric field of 100 kV/cm of 41.2 %, a leakage-current density of 1.045 × 10- 7A/cm2 at an electric field of 100 kV/cm and a figure of merit (defined by tunability (%) divided by tan δ (%)) of 19.59 under a dc bias voltage of 10 V at 1 GHz. © 2014 Elsevier B.V. All rights reserved.This work was supported by the Global R&D program of MOTIE/KIAT (N0000686)Recurso electrónicoapplication/pdfengElsevierhttp://creativecommons.org/licenses/by-nc-nd/4.0/info:eu-repo/semantics/restrictedAccessAtribución-NoComercial 4.0 Internacionalhttp://purl.org/coar/access_right/c_16echttps://www.scopus.com/inward/record.uri?eid=2-s2.0-84905723242&doi=10.1016%2fj.tsf.2014.06.047&partnerID=40&md5=fd01a53151b99e6245ee720b677ca460Microwave characteristics of sol-gel based Ag-doped (Ba 0.6Sr0.4)TiO3 thin filmsinfo:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionArtículohttp://purl.org/coar/version/c_970fb48d4fbd8a85http://purl.org/coar/resource_type/c_2df8fbb1Barium strontium titanateDielectric propertiesMicrowaveSilver dopingSol-Gel depositionTunabilityBarium strontium titanateDielectric lossesDielectric propertiesElectric fieldsFilm preparationMetal insulator boundariesMicrowavesScanning electron microscopySemiconductor dopingSol-gel processSol-gelsThin filmsAlkoxide-based sol-gel methodsElectrical characterizationMetal insulator metal capacitor (MIM)Microwave characteristicsSilver dopingSol-gel depositionThin film ferroelectricsTunabilitiesSilverKim, K.T.Kim C.Senior D.E.Kim D.Yoon, Y.K.Scott, J.F., High-Dielectric Constant Thin Films for Dynamic Random Access Memories (DRAM) (1998) Annu. 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Phys., 35, p. 4880Kim, K.T., Kim, C.I., Structure and dielectrical properties of (Pb, Sr)TiO3 thin films for tunable microwave device (2002) Thin Solid Films, 420 (421), p. 544Yoon, Y.K., Allen, M.G., Ferroelectric-based tunable RF capacitor (2012) Passive RF Component Technology: Materials, Techniques, and Applications, p. 37. , G. Wang, B. Pan, ARTTECH HOUSE Inc. MAYoon, Y.K., Kim, D., Allen, M.G., Kenney, J.S., Hunt, A.T., A reduced intermodulation distortion tunable ferroelectric capacitor-architecture and demonstration (2003) IEEE Trans. Microw. Theory Tech., 51, p. 2568Pervez, N.K., Hansen, P.J., York, R.A., High tunability barium strontium titanate thin films for rf circuit applications (2004) Appl. Phys. Lett., 85, p. 4451Ning, T., Chen, C., Wang, C., Zhou, Y., Zhang, D., Ming, H., Yang, G., Enhanced femtosecond optical nonlinearity of Mn doped Ba 0.6Sr0.4TiO3 films (2011) J. Appl. Phys., 109, p. 013101Nayak, M., Tseng, T.-Y., Dielectric tunability of barium strontium titanate films prepared by a sol-gel method (2002) Thin Solid Films, 408, p. 194Joshi, P.C., Cole, M.W., Mg-doped Ba0.6Sr0.4TiO3 thin films for tunable microwave applications (2000) Appl. Phys. Lett., 77, p. 289Cha, S.Y., Jang, B.T., Lee, H.C., Effects of Ir electrodes on the dielectric constants of Ba 0.5Sr0.5TiO3 films (1999) Jpn. J. Appl. Phys., 38, p. 49Yoon, K.H., Lee, J.C., Park, J., Kang, D.H., Song, C.M., Seo, Y.G., Electrical properties of Mg doped (Ba0.5Sr0.5) TiO3 thin films (2001) Jpn. J. Appl. Phys., 40, p. 5497Chen, S.Y., Wang, H.W., Huang, L.C., Electrical properties of Mg/La, Mg/Nb co-doped (Ba0.7Sr 0.3)TiO3 thin films prepared by metallo-organic deposition method (2001) Jpn. J. Appl. Phys., 40, p. 4974Jayadevan, K.P., Liu, C.Y., Tseng, T.Y., Dielectric characteristics of nanocrystalline Ag-Ba0.5Sr 0.5TiO3 composite thin films (2004) Appl. Phys. Lett., 85, p. 1211Srivastava, A., Kumar, D., Singh, R.K., Venkataraman, H., Eisenstadt, W.R., Improvement in electrical and dielectric behavior of (Ba, Sr)TiO3 thin films by Ag doping (2000) Phys. Rev. B, 61, p. 7305Bao, P., Jackson, T.J., Lancsater, M.J., Barium strontium titanate thin film varactors for room-temperature microwave device applications (2008) J. Phys. D. Appl. Phys., 41, p. 063001Zhu, X., Chen, D.-Y., Jin, Z., Phillips, J.D., Mortazawi, A., Characterization of thin film BST tunable capacitors using a simple two port measurement technique (2005) IEEE MTT-S Int. Microw. Symp. Dig., 2, p. 611Ma, Z., Becker, A.J., Polakos, P., Huggins, H., Pastalan, J., Wu, H., Watts, K., Mankiewich, P., RF measurement technique for characterizing thin dielectric films (1998) IEEE Trans. Electron Devices, 45, p. 1811Chu, J.P., Mahalingam, T., Liu, C.F., Wang, S.F., Preparation and characterization of Mn-doped BaTiO3 thin films by magnetron sputtering (2007) J. Mater. 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Soc., 77, p. 3173http://purl.org/coar/resource_type/c_6501THUMBNAILMiniProdInv.pngMiniProdInv.pngimage/png23941https://repositorio.utb.edu.co/bitstream/20.500.12585/9034/1/MiniProdInv.png0cb0f101a8d16897fb46fc914d3d7043MD5120.500.12585/9034oai:repositorio.utb.edu.co:20.500.12585/90342023-04-24 09:39:00.208Repositorio Institucional UTBrepositorioutb@utb.edu.co