Enhancing aC'dots analysis through STORM imaging: development of advanced computational tools for super-resolution microscopy

Super-resolution microscopy has transformed bioimaging by enabling nanoscale visualization of cellular structures. This thesis introduces PulseSTORM, a software application designed to streamline the quantitative analysis of Stochastic Optical Reconstruction Microscopy (STORM) and filament datasets....

Full description

Autores:
Salgado Manrique, Alejandro
Tipo de recurso:
Trabajo de grado de pregrado
Fecha de publicación:
2024
Institución:
Universidad de los Andes
Repositorio:
Séneca: repositorio Uniandes
Idioma:
eng
OAI Identifier:
oai:repositorio.uniandes.edu.co:1992/75307
Acceso en línea:
https://hdl.handle.net/1992/75307
Palabra clave:
STORM
SMLM
ROI
Stretching open active contours
Point spread function
Fluorescent dye
Core-shell silica nanoparticles
Filament
Ingeniería
Rights
openAccess
License
Attribution-NonCommercial-NoDerivatives 4.0 International
Description
Summary:Super-resolution microscopy has transformed bioimaging by enabling nanoscale visualization of cellular structures. This thesis introduces PulseSTORM, a software application designed to streamline the quantitative analysis of Stochastic Optical Reconstruction Microscopy (STORM) and filament datasets. PulseSTORM integrates tools like ThunderSTORM, Ridge Detection, and SOAX into a modular platform for robust post-processing analysis. The research addresses the need for a comprehensive, user-friendly tool to analyze blinking statistics and filament structures, combining preprocessing, batch processing, and an analytics dashboard. Validation experiments with Cy5, C’dots, and aC’dots confirmed the accuracy of the software, with results aligning closely with literature values and offering actionable insights for sample preparation. PulseSTORM sets a foundation for advancing super-resolution microscopy, with future goals including direct integration with ThunderSTORM, optimization of computational performance, and exploration of recovery yield metrics. Beyond bioimaging, its potential extends to semiconductor defect detection, bridging biological and industrial applications.