A new algorithm for detecting and correcting bad pixels in infrared images

An image processing algorithm detects and replaces abnormal pixels individually, highlighting them amongst their neighbours in a sequence of thermal images without affecting overall texture, like classical filtering does. Bad pixels from manufacture or constant use of a CCD device in an IR camera are thus detected and replaced with a very good success rate, thereby reducing the risk of bad interpretation. Some thermal sequences from CFRP plates, taken by a Cincinnati Electronics InSb IR camera, were used for developing and testing this algorithm. The results were compared to a detailed list of bad pixels given by the manufacturer (about 70% coincidence). This work becomes relevant considering that the number of papers on this subject is low; most of them talk about astronomical image pre-processing. Moreover, thermo graphic non-destructive testing (TNDT) techniques are gaining popularity in Colombia at introductory levels in industrial sectors such as energy generation and transmission, sugar production and military aeronautics.

• Autores: Restrepo Girón, Andrés David; Loaiza Correa, Humberto
• Tipo de recurso: Article of journal
• Fecha de publicación: 2010
• Institución: Universidad Nacional de Colombia
• Repositorio: Universidad Nacional de Colombia
• Idioma: spa
• OAI Identifier: oai:repositorio.unal.edu.co:unal/29666
• Acceso en línea: https://repositorio.unal.edu.co/handle/unal/29666; http://bdigital.unal.edu.co/19714/; http://bdigital.unal.edu.co/19714/2/; http://bdigital.unal.edu.co/19714/3/
• Palabra clave: Ingeniería Eléctrica; Ingeniería Electrónica; corrección de píxeles; imágenes infrarrojas; termografía; evaluación no destructiva (END); Electrical Engineering; Electronics Engineering; pixel correction; infrared image; thermography; non-destructive testing (NDT)
• Rights: openAccess
• License: Atribución-NoComercial 4.0 Internacional