Teoría básica de microscopía electrónica de transmisión
Ilustraciones y fotografías
- Autores:
-
Alfonso Orjuela, José Edgar
Corredor P., Dery Esmeralda
- Tipo de recurso:
- Book
- Fecha de publicación:
- 2009
- Institución:
- Universidad Nacional de Colombia
- Repositorio:
- Universidad Nacional de Colombia
- Idioma:
- spa
- OAI Identifier:
- oai:repositorio.unal.edu.co:unal/79952
- Palabra clave:
- 500 - Ciencias naturales y matemáticas
Microscopía electrónica
Instrumentos ópticos
Difracción
Microscopios
Micrografía
Lentes
- Rights
- openAccess
- License
- Atribución-NoComercial-SinDerivadas 4.0 Internacional
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Teoría básica de microscopía electrónica de transmisión |
| title |
Teoría básica de microscopía electrónica de transmisión |
| spellingShingle |
Teoría básica de microscopía electrónica de transmisión 500 - Ciencias naturales y matemáticas Microscopía electrónica Instrumentos ópticos Difracción Microscopios Micrografía Lentes |
| title_short |
Teoría básica de microscopía electrónica de transmisión |
| title_full |
Teoría básica de microscopía electrónica de transmisión |
| title_fullStr |
Teoría básica de microscopía electrónica de transmisión |
| title_full_unstemmed |
Teoría básica de microscopía electrónica de transmisión |
| title_sort |
Teoría básica de microscopía electrónica de transmisión |
| dc.creator.fl_str_mv |
Alfonso Orjuela, José Edgar Corredor P., Dery Esmeralda |
| dc.contributor.author.none.fl_str_mv |
Alfonso Orjuela, José Edgar Corredor P., Dery Esmeralda |
| dc.subject.ddc.spa.fl_str_mv |
500 - Ciencias naturales y matemáticas |
| topic |
500 - Ciencias naturales y matemáticas Microscopía electrónica Instrumentos ópticos Difracción Microscopios Micrografía Lentes |
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Microscopía electrónica Instrumentos ópticos Difracción |
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Microscopios Micrografía Lentes |
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Ilustraciones y fotografías |
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2009 |
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2009 |
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2021-08-13T20:41:13Z |
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2021-08-13T20:41:13Z |
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Universidad Nacional de Colombia |
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spa |
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Colección textos; |
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Primera edición |
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Barrera H. y Cárdenas R., El microscopio óptico, Editorial Plaza y Valdés, México, 29-30, 34-36, 1997. Michael J. E., Stereomicroscopes by the British Micromount Society BMS Occasional Paper, No. 6, 12-14, 1995. Glasgow H., First in Field by 200 Years, 35, 1981. Gabor D., A new microscopic principle, Nature, 161, 777-778, 1948. Govi G., Il microscopio composto inventato da Galileo, Italian Physical Society, 25(1), 162-164, 1889. Ford B. J., The Discovery of Giardia, Microscope, 53, 147-153, 2005. Hull D. F. R. S. Eng F. Robert Hooke, A Fractographic Study of Kettering-Stone, Notes Rec. R. Soc., 51(1), 45-55, 1997. Lister J. J., Some Observations on the Structure and Functions of Tubular and Cellular Polypi, and of Ascidiae, Philosophical Transactions of the Royal Society, 124, 365-388, 1834. Ruska E., The Development of the Electron Microscope and of Electron Microscopy, Rev. Mod. Phys., 59, 627-638, 1987. Evenett P., Köhler Illumination Centenary, Royal Microscopical Society, Oxford, United Kingdom, 32, 1994. Hartley, W.G., The Light Microscope: Its Use and Development, Senecio Publishing Co, 1993. Gregory, Don A., Rayleigh Criteria Separation of Optical correlation signals, Applied Optics, 26, 3170-3171, 1987. Wighting M. J., ERIC Journal, 27, 58-61, 2004. Asimov I., Biographical Encyclopedia of Science and Technology, Doubleday, 1982. Lozano, V. y Morales, A., Introducción a la microscopía electrónica, 1996. Edington J. W., Practical Electron Microscopy in Materials Science, Philips Electron Optics, Egerton RF, 1996. Williams D. B. and Carter C. B., Transmission Electron Microscopy: A Textbook for Materials Science, Cambridge University Press, 1999. The microscope. http://em-outreach.ucsd.edu/web-course/SecI.A/Sec-I.A.html. Origin (07/07). Müller E. W., The Field Ion Microscope. Z. Phys, 131, 136-142, 1951. Tecnai Basic Manual, FEI Electron Optics, B. V. Eindhoven, The Netherlands, 2002. Williams D.B. and Carter C. B., Transmission Electron Microscopy, Basics Kluwer Academic Pub., 1996. Ipohorski M., Microscopía electrónica de láminas delgadas, Instituto de Tecnología Profesor Jorge A. Savato, Buenos Aires, 1996. Karlík M., Introduction to High-Resolution Transmission Electron Microscopy, ÈVUT: Faculty of Nuclear Sciences and Physical Engineering, Department of Materials (in Czech), 1993. Miroslav Karlik, Lattice Imaging in Transmission electron Microscopy, Materials Structure, 8(1), 2001. Otten M. T., Alignement of the Transmission Electron Microscope, Philips Electron Optics, 1993. Reimer L., Transmission Electron Microscopy, Springer-Verlag, 1989. Scherzer O., The Theoretical Resolution Limit of the Electron Microscope, J. Appl. Physics, 20, 20-29, 1949. Spence J. C. H., Experimental High-Resolution Electron Microscopy, Oxford University Press, 1988. Metherell A. J. F., Diffraction of Electrons by Perfect Crystals, In: ‘Electron Microscopy in Materials Science’, 3rd Course of Int. School of Electron Microscopy, Ettore Majorana, eds U. Valdrè, E. Ruedl, EEC, 2, 397-552, 1973. Edington J. W., Practical Electron Microscopy in Materials Science, N. V. Philips Gloeilampenfabrieken, Eindhoven, 1976. Goodhew P. J., Humphreys J. and Beanland R., Electron Microscopy and Analysis, Third edition, Taylor y Francis e-Library, 2001. Yao N. and Wang Z. L., Handbook of Microscopy for Nanotechnology, Academic Publishers, United States of America, 2005. Leica Microsystems Inc., La teoría del microscopio, Educational and Analytical Division, Buffalo, New York, 2000. Fischione P. E., Materials Specimen Preparation for Transmission Electron Microscopy, E. A. Fischione Instruments, 1-10, 1990. Gatan Inc./OGI, Joint Workshop on TEM Specimen Preparation, 3-18, 2002. Solórzano G., Apuntes de clase, 21-33, 2001. Romero de Pérez G., Apuntes de clase, 101-150, 2005. Tipler, P. A. and Llewellyn R. A, Modern Physics, 4 ed. W. H. Freeman and Company, 203-4, 222-3, 236, 2003. Edington J. W. Practical Electron Microscopy in Materials Science, Philips Electron Optics, Egerton RF, 1996. Ball, C. J., An Introduction to the Theory of Diffraction, Pergamon. NY, 1971. Hirsch P., Electron Microscopy of Thin Crystals, 2 ed. Krieger, Melbourne. FL, 1977. Wilman H., The Interpretation and Application of ElectronDiffraction Kikuchi-Line Patterns- Part 11. The Methods of Indexing the Patterns, Applied Physical Chemistry Laboratories, Imperial College, London MS, 1947. Edington J. W., Practical Electron Microscopy in Materials Science, Philips Electron Optics, Egerton RF, 1996. Loretto, M. H. and Smallman R. E., Defect Analysis in electron Microscopy, John Wiley & Sons, New York, 1975. Buitrago J., Crecimiento de películas delgadas de NbN por la técnica de pulverización catódica y caracterización estructural y eléctrica, Tesis de Maestría, Bogotá, Universidad Nacional de Colombia, 2008. Kittel C., Introduction to Solid State Physics, John Wiley & Sons. Inc., New York, 1968. Williams D. B. and Carter C. B., Transmission Electron Microscopy, Basics Kluwer Academic Pub, 1996. Del Río D., Oxidación parcial de metano sobre catalizadores de MoO3 soportado sobre SiO2, Tesis de Maestría, Bogotá, Universidad Nacional de Colombia, 2008. Loreto M. H. and Smallman R. E., Defect analysis in electron microscopy, 29, 1975. Seifriz, W., Protoplasm, McGraw-Hill, New York, 99-100, 1936. FEI Company, FEI Electron Optics Company, B. V. Eindhoven, the Netherlands, 1-3, 2002. Loreto M. H. and Samllman R. R., Defect Analysis in Electron Microscopy, 29, 1975. John Mayall, Jr., Lectures on the History of the Microscope by British Collector, Journal of the Society of the Arts, 1885-1888. |
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Universidad Nacional de Colombia |
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Bogotá, Colombia |
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Atribución-NoComercial-SinDerivadas 4.0 InternacionalDerechos Reservados al Autor, 2009http://creativecommons.org/licenses/by-nc-nd/4.0/info:eu-repo/semantics/openAccesshttp://purl.org/coar/access_right/c_abf2Alfonso Orjuela, José Edgar74d57e7bb0b8958baa4bbada2f34ed51Corredor P., Dery Esmeralda083ae5095d9f64c9aaa6f2b22e9ac54f2021-08-13T20:41:13Z2021-08-13T20:41:13Z2009https://repositorio.unal.edu.co/handle/unal/79952Universidad Nacional de ColombiaRepositorio Institucional Universidad Nacional de Colombiahttps://repositorio.unal.edu.co/Ilustraciones y fotografíasEn este documento se presentan los conceptos físicos básicos que acercarán a los estudiantes de las carreras de Ciencias e Ingeniería a los conocimientos físicos involucrados, tanto en los procesos que ocurren en la generación de un patrón de difracción de electrones, como en la manera de interpretarlos y utilizarlos en la determinación de la estructura y grado de cristalinidad de materiales de interés científico y con aplicación tecnológica. (Texto tomado de la fuente).Incluye índice analíticoPrimera reimpresión 2009Primera edición98 páginasapplication/pdfspaUniversidad Nacional de ColombiaSede BogotáBogotá, ColombiaColección textos;Primera ediciónBarrera H. y Cárdenas R., El microscopio óptico, Editorial Plaza y Valdés, México, 29-30, 34-36, 1997.Michael J. E., Stereomicroscopes by the British Micromount Society BMS Occasional Paper, No. 6, 12-14, 1995.Glasgow H., First in Field by 200 Years, 35, 1981.Gabor D., A new microscopic principle, Nature, 161, 777-778, 1948.Govi G., Il microscopio composto inventato da Galileo, Italian Physical Society, 25(1), 162-164, 1889.Ford B. J., The Discovery of Giardia, Microscope, 53, 147-153, 2005.Hull D. F. R. S. Eng F. Robert Hooke, A Fractographic Study of Kettering-Stone, Notes Rec. R. Soc., 51(1), 45-55, 1997.Lister J. J., Some Observations on the Structure and Functions of Tubular and Cellular Polypi, and of Ascidiae, Philosophical Transactions of the Royal Society, 124, 365-388, 1834.Ruska E., The Development of the Electron Microscope and of Electron Microscopy, Rev. Mod. Phys., 59, 627-638, 1987.Evenett P., Köhler Illumination Centenary, Royal Microscopical Society, Oxford, United Kingdom, 32, 1994.Hartley, W.G., The Light Microscope: Its Use and Development, Senecio Publishing Co, 1993.Gregory, Don A., Rayleigh Criteria Separation of Optical correlation signals, Applied Optics, 26, 3170-3171, 1987.Wighting M. J., ERIC Journal, 27, 58-61, 2004.Asimov I., Biographical Encyclopedia of Science and Technology, Doubleday, 1982.Lozano, V. y Morales, A., Introducción a la microscopía electrónica, 1996.Edington J. W., Practical Electron Microscopy in Materials Science, Philips Electron Optics, Egerton RF, 1996.Williams D. B. and Carter C. B., Transmission Electron Microscopy: A Textbook for Materials Science, Cambridge University Press, 1999.The microscope. http://em-outreach.ucsd.edu/web-course/SecI.A/Sec-I.A.html. Origin (07/07).Müller E. W., The Field Ion Microscope. Z. Phys, 131, 136-142, 1951.Tecnai Basic Manual, FEI Electron Optics, B. V. Eindhoven, The Netherlands, 2002.Williams D.B. and Carter C. B., Transmission Electron Microscopy, Basics Kluwer Academic Pub., 1996.Ipohorski M., Microscopía electrónica de láminas delgadas, Instituto de Tecnología Profesor Jorge A. Savato, Buenos Aires, 1996.Karlík M., Introduction to High-Resolution Transmission Electron Microscopy, ÈVUT: Faculty of Nuclear Sciences and Physical Engineering, Department of Materials (in Czech), 1993.Miroslav Karlik, Lattice Imaging in Transmission electron Microscopy, Materials Structure, 8(1), 2001.Otten M. T., Alignement of the Transmission Electron Microscope, Philips Electron Optics, 1993.Reimer L., Transmission Electron Microscopy, Springer-Verlag, 1989.Scherzer O., The Theoretical Resolution Limit of the Electron Microscope, J. Appl. Physics, 20, 20-29, 1949.Spence J. C. H., Experimental High-Resolution Electron Microscopy, Oxford University Press, 1988.Metherell A. J. F., Diffraction of Electrons by Perfect Crystals, In: ‘Electron Microscopy in Materials Science’, 3rd Course of Int. School of Electron Microscopy, Ettore Majorana, eds U. Valdrè, E. Ruedl, EEC, 2, 397-552, 1973.Edington J. W., Practical Electron Microscopy in Materials Science, N. V. Philips Gloeilampenfabrieken, Eindhoven, 1976.Goodhew P. J., Humphreys J. and Beanland R., Electron Microscopy and Analysis, Third edition, Taylor y Francis e-Library, 2001.Yao N. and Wang Z. L., Handbook of Microscopy for Nanotechnology, Academic Publishers, United States of America, 2005.Leica Microsystems Inc., La teoría del microscopio, Educational and Analytical Division, Buffalo, New York, 2000.Fischione P. E., Materials Specimen Preparation for Transmission Electron Microscopy, E. A. Fischione Instruments, 1-10, 1990.Gatan Inc./OGI, Joint Workshop on TEM Specimen Preparation, 3-18, 2002.Solórzano G., Apuntes de clase, 21-33, 2001.Romero de Pérez G., Apuntes de clase, 101-150, 2005.Tipler, P. A. and Llewellyn R. A, Modern Physics, 4 ed. W. H. Freeman and Company, 203-4, 222-3, 236, 2003.Edington J. W. Practical Electron Microscopy in Materials Science, Philips Electron Optics, Egerton RF, 1996.Ball, C. J., An Introduction to the Theory of Diffraction, Pergamon. NY, 1971.Hirsch P., Electron Microscopy of Thin Crystals, 2 ed. Krieger, Melbourne. FL, 1977.Wilman H., The Interpretation and Application of ElectronDiffraction Kikuchi-Line Patterns- Part 11. The Methods of Indexing the Patterns, Applied Physical Chemistry Laboratories, Imperial College, London MS, 1947.Edington J. W., Practical Electron Microscopy in Materials Science, Philips Electron Optics, Egerton RF, 1996.Loretto, M. H. and Smallman R. E., Defect Analysis in electron Microscopy, John Wiley & Sons, New York, 1975.Buitrago J., Crecimiento de películas delgadas de NbN por la técnica de pulverización catódica y caracterización estructural y eléctrica, Tesis de Maestría, Bogotá, Universidad Nacional de Colombia, 2008.Kittel C., Introduction to Solid State Physics, John Wiley & Sons. Inc., New York, 1968.Williams D. B. and Carter C. B., Transmission Electron Microscopy, Basics Kluwer Academic Pub, 1996.Del Río D., Oxidación parcial de metano sobre catalizadores de MoO3 soportado sobre SiO2, Tesis de Maestría, Bogotá, Universidad Nacional de Colombia, 2008.Loreto M. H. and Smallman R. E., Defect analysis in electron microscopy, 29, 1975.Seifriz, W., Protoplasm, McGraw-Hill, New York, 99-100, 1936.FEI Company, FEI Electron Optics Company, B. V. Eindhoven, the Netherlands, 1-3, 2002.Loreto M. H. and Samllman R. R., Defect Analysis in Electron Microscopy, 29, 1975.John Mayall, Jr., Lectures on the History of the Microscope by British Collector, Journal of the Society of the Arts, 1885-1888.500 - Ciencias naturales y matemáticasMicroscopía electrónicaInstrumentos ópticosDifracciónMicroscopiosMicrografíaLentesTeoría básica de microscopía electrónica de transmisiónLibroinfo:eu-repo/semantics/bookinfo:eu-repo/semantics/acceptedVersionhttp://purl.org/coar/resource_type/c_2f33Texthttp://purl.org/redcol/resource_type/LIBGeneralLICENSElicense.txtlicense.txttext/plain; charset=utf-83964https://repositorio.unal.edu.co/bitstream/unal/79952/1/license.txtcccfe52f796b7c63423298c2d3365fc6MD51ORIGINALTeoría básica de microscopía electrónica de transmisión 9789587193718.pdfTeoría básica de microscopía electrónica de transmisión 9789587193718.pdfLibro del Departamento de Físicaapplication/pdf1740206https://repositorio.unal.edu.co/bitstream/unal/79952/2/Teor%c3%ada%20b%c3%a1sica%20de%20microscop%c3%ada%20electr%c3%b3nica%20de%20transmisi%c3%b3n%209789587193718.pdf98b08e2d8bf4e4b833a4d4745d400cf0MD52THUMBNAILTeoría básica de microscopía electrónica de transmisión 9789587193718.pdf.jpgTeoría básica de microscopía electrónica de transmisión 9789587193718.pdf.jpgGenerated Thumbnailimage/jpeg5585https://repositorio.unal.edu.co/bitstream/unal/79952/3/Teor%c3%ada%20b%c3%a1sica%20de%20microscop%c3%ada%20electr%c3%b3nica%20de%20transmisi%c3%b3n%209789587193718.pdf.jpg0a79cd0f9bc9531c8d07d7533e9e5af2MD53unal/79952oai:repositorio.unal.edu.co:unal/799522024-07-27 00:17:35.924Repositorio Institucional Universidad Nacional de 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