Novel single beam technique for measuring nonlinear optical absorption of materials by using an electrically focus-tunable lens

ABSTRACT: We have measured the two-photon absorption coefficients for CdS and ZnSe by using a new single beam setup based on the well-known Z-scan technique. This novel technique, which we have named “f-scan”, uses an electrically focus-tunable lens instead of a mechanical translation stage, simplif...

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Autores:
Serna Restrepo, Juan Humberto
Hamad, Abdullatif
García Monroy, Hernando
Rueda Muñoz, Edgar Alberto
Tipo de recurso:
Article of investigation
Fecha de publicación:
2015
Institución:
Universidad de Antioquia
Repositorio:
Repositorio UdeA
Idioma:
spa
OAI Identifier:
oai:bibliotecadigital.udea.edu.co:10495/30845
Acceso en línea:
https://hdl.handle.net/10495/30845
https://www.redalyc.org/pdf/478/47845648006.pdf
Palabra clave:
Procesos multifotónicos
Multiphoton processes
Nonlinear optics
Z-scan
Óptica no lineal
Rights
openAccess
License
http://creativecommons.org/licenses/by-nc-nd/2.5/co/
Description
Summary:ABSTRACT: We have measured the two-photon absorption coefficients for CdS and ZnSe by using a new single beam setup based on the well-known Z-scan technique. This novel technique, which we have named “f-scan”, uses an electrically focus-tunable lens instead of a mechanical translation stage, simplifying the experimental setup and reducing dramatically the cost of equipment while maintaining the experimental sensitivity. Also we found, experimentally, that the technique is more robust to sample surface roughness and multiple scattering because of the elimination of the mechanical motion of the sample. In this paper we present the theory as well as the experimental implementation of the technique. Experimental results for CdS and ZnSe are presented and two-photon absorption coefficients are compared to the well-established values for these semiconductors in the literature. The f-scan opens the door to an affordable nonlinear optical technique for basic research and applications.