Microwave Frequency Characterization of Barium Titanate Films Obtained Via Sol-Gel

The present work focuses on the structural, morphological and dielectric characterization of barium titanate films (BTO or BaTiO3 due to its chemical formula) deposited by spin coating on crystalline silicon (Si) substrates and CPW resonators using the Sol-Gel technique with a Ba/Ti molar ratio of 0...

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Autores:
Tipo de recurso:
Fecha de publicación:
2019
Institución:
Universidad Pedagógica y Tecnológica de Colombia
Repositorio:
RiUPTC: Repositorio Institucional UPTC
Idioma:
eng
spa
OAI Identifier:
oai:repositorio.uptc.edu.co:001/14259
Acceso en línea:
https://revistas.uptc.edu.co/index.php/ingenieria/article/view/10416
https://repositorio.uptc.edu.co/handle/001/14259
Palabra clave:
dielectric constant
ferroelectrics
microwave materials
loss tangent
Sol-Gel
thin films
constante dieléctrica
ferroeléctricos
materiales en microondas
películas delgadas
Sol-Gel
tangente de pérdida
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License
http://purl.org/coar/access_right/c_abf399
id REPOUPTC2_c010cc1bafe93c04537c1512d300d264
oai_identifier_str oai:repositorio.uptc.edu.co:001/14259
network_acronym_str REPOUPTC2
network_name_str RiUPTC: Repositorio Institucional UPTC
repository_id_str
dc.title.en-US.fl_str_mv Microwave Frequency Characterization of Barium Titanate Films Obtained Via Sol-Gel
dc.title.es-ES.fl_str_mv Caracterización en frecuencia de microondas de películas de titanato de bario obtenidas vía Sol-Gel
title Microwave Frequency Characterization of Barium Titanate Films Obtained Via Sol-Gel
spellingShingle Microwave Frequency Characterization of Barium Titanate Films Obtained Via Sol-Gel
dielectric constant
ferroelectrics
microwave materials
loss tangent
Sol-Gel
thin films
constante dieléctrica
ferroeléctricos
materiales en microondas
películas delgadas
Sol-Gel
tangente de pérdida
title_short Microwave Frequency Characterization of Barium Titanate Films Obtained Via Sol-Gel
title_full Microwave Frequency Characterization of Barium Titanate Films Obtained Via Sol-Gel
title_fullStr Microwave Frequency Characterization of Barium Titanate Films Obtained Via Sol-Gel
title_full_unstemmed Microwave Frequency Characterization of Barium Titanate Films Obtained Via Sol-Gel
title_sort Microwave Frequency Characterization of Barium Titanate Films Obtained Via Sol-Gel
dc.subject.en-US.fl_str_mv dielectric constant
ferroelectrics
microwave materials
loss tangent
Sol-Gel
thin films
topic dielectric constant
ferroelectrics
microwave materials
loss tangent
Sol-Gel
thin films
constante dieléctrica
ferroeléctricos
materiales en microondas
películas delgadas
Sol-Gel
tangente de pérdida
dc.subject.es-ES.fl_str_mv constante dieléctrica
ferroeléctricos
materiales en microondas
películas delgadas
Sol-Gel
tangente de pérdida
description The present work focuses on the structural, morphological and dielectric characterization of barium titanate films (BTO or BaTiO3 due to its chemical formula) deposited by spin coating on crystalline silicon (Si) substrates and CPW resonators using the Sol-Gel technique with a Ba/Ti molar ratio of 0.5/0.5. The coplanar waveguides were manufactured on alumina substrates (Al2O3) with 3 mm of gold (Au) metallization using the laser ablation technique. The scanning electron microscopy (SEM) with X-ray energy dispersion spectrometry (EDS) showed the existence of a BTO film with an elementary composition of 14.62% barium and 5.65% titanium, with a thickness of 0.77 mm measured using the profilometric mode of the atomic force microscopy (AFM). Dielectric characterization was carried out by comparing the frequency response (parameter S21) of a CPW resonator with deposited BTO film and another reference resonator (without film) using a network vector analyzer (VNA). These measurements are compared in turn with computational simulations to obtain the dielectric properties. For the BTO film was determined a relative dielectric constant constant (er) of 160 with a loss tangent (Tand) of 0.012 for a frequency of 3.60 GHz. The dielectric constant constant and the ferroelectric property of the material produced are quite promising for applications in microwave circuits, such as miniaturization and tuning.
publishDate 2019
dc.date.accessioned.none.fl_str_mv 2024-07-05T19:11:52Z
dc.date.available.none.fl_str_mv 2024-07-05T19:11:52Z
dc.date.none.fl_str_mv 2019-12-03
dc.type.none.fl_str_mv info:eu-repo/semantics/article
dc.type.coar.fl_str_mv http://purl.org/coar/resource_type/c_2df8fbb1
dc.type.coarversion.fl_str_mv http://purl.org/coar/version/c_970fb48d4fbd8a85
dc.type.version.spa.fl_str_mv info:eu-repo/semantics/publishedVersion
dc.type.coarversion.spa.fl_str_mv http://purl.org/coar/version/c_970fb48d4fbd8a482
status_str publishedVersion
dc.identifier.none.fl_str_mv https://revistas.uptc.edu.co/index.php/ingenieria/article/view/10416
10.19053/01211129.v29.n54.2020.10416
dc.identifier.uri.none.fl_str_mv https://repositorio.uptc.edu.co/handle/001/14259
url https://revistas.uptc.edu.co/index.php/ingenieria/article/view/10416
https://repositorio.uptc.edu.co/handle/001/14259
identifier_str_mv 10.19053/01211129.v29.n54.2020.10416
dc.language.none.fl_str_mv eng
spa
dc.language.iso.spa.fl_str_mv eng
spa
language eng
spa
dc.relation.none.fl_str_mv https://revistas.uptc.edu.co/index.php/ingenieria/article/view/10416/8926
https://revistas.uptc.edu.co/index.php/ingenieria/article/view/10416/8615
https://revistas.uptc.edu.co/index.php/ingenieria/article/view/10416/9217
dc.rights.coar.fl_str_mv http://purl.org/coar/access_right/c_abf2
dc.rights.coar.spa.fl_str_mv http://purl.org/coar/access_right/c_abf399
rights_invalid_str_mv http://purl.org/coar/access_right/c_abf399
http://purl.org/coar/access_right/c_abf2
dc.format.none.fl_str_mv application/pdf
application/pdf
application/xml
dc.publisher.en-US.fl_str_mv Universidad Pedagógica y Tecnológica de Colombia
dc.source.en-US.fl_str_mv Revista Facultad de Ingeniería; Vol. 29 No. 54 (2020): Continuos Publication; e10416
dc.source.es-ES.fl_str_mv Revista Facultad de Ingeniería; Vol. 29 Núm. 54 (2020): Publicación Continua; e10416
dc.source.none.fl_str_mv 2357-5328
0121-1129
institution Universidad Pedagógica y Tecnológica de Colombia
repository.name.fl_str_mv Repositorio Institucional UPTC
repository.mail.fl_str_mv repositorio.uptc@uptc.edu.co
_version_ 1839633890888646656
spelling 2019-12-032024-07-05T19:11:52Z2024-07-05T19:11:52Zhttps://revistas.uptc.edu.co/index.php/ingenieria/article/view/1041610.19053/01211129.v29.n54.2020.10416https://repositorio.uptc.edu.co/handle/001/14259The present work focuses on the structural, morphological and dielectric characterization of barium titanate films (BTO or BaTiO3 due to its chemical formula) deposited by spin coating on crystalline silicon (Si) substrates and CPW resonators using the Sol-Gel technique with a Ba/Ti molar ratio of 0.5/0.5. The coplanar waveguides were manufactured on alumina substrates (Al2O3) with 3 mm of gold (Au) metallization using the laser ablation technique. The scanning electron microscopy (SEM) with X-ray energy dispersion spectrometry (EDS) showed the existence of a BTO film with an elementary composition of 14.62% barium and 5.65% titanium, with a thickness of 0.77 mm measured using the profilometric mode of the atomic force microscopy (AFM). Dielectric characterization was carried out by comparing the frequency response (parameter S21) of a CPW resonator with deposited BTO film and another reference resonator (without film) using a network vector analyzer (VNA). These measurements are compared in turn with computational simulations to obtain the dielectric properties. For the BTO film was determined a relative dielectric constant constant (er) of 160 with a loss tangent (Tand) of 0.012 for a frequency of 3.60 GHz. The dielectric constant constant and the ferroelectric property of the material produced are quite promising for applications in microwave circuits, such as miniaturization and tuning.El presente trabajo se centra en la caracterización estructural, morfológica y dieléctrica de películas de titanato de bario (BTO o BaTiO3 por su fórmula química) depositados mediante la técnica que proporciona recubrimiento por medio de un sistema de rotación (spin coating) sobre substratos de silicio cristalino (Si) y resonadores CPW mediante la técnica Sol-Gel, utilizando una relación molar Ba/Ti de 0.5/0.5. Las guías de ondas se fabricaron sobre substratos de alúmina (Al2O3) con 3 mm de metalización en oro (Au) empleando la técnica de ablación láser. La microscopia electrónica de barrido (SEM) con espectrometría de dispersión de energía de rayos X (EDS) permitió evidenciar la existencia de una película de BTO con una composición elemental de 14.62 % de bario y 5.65 % de titanio, además de un espesor de 0.77 mm medido utilizando la modalidad perfilométrica de la microscopia de fuerza atómica (AFM). La caracterización dieléctrica se llevó a cabo mediante la comparación de la respuesta en frecuencia (parámetro S21) de un resonador CPW con película de BTO depositada y otro resonador de referencia (sin película) usando un analizador vectorial de red (VNA). Estas medidas se comparan a su vez con simulaciones computacionales para obtener las propiedades dieléctricas. Para la película de BTO se determinó una constante dieléctrica relativa (er) de 160 con tangente de pérdida (Tand) de 0.012 para una frecuencia de 3.60 GHz. La constante dieléctrica y la propiedad ferroeléctrica del material elaborado son características bastante promisorias para aplicaciones en circuitos de microondas, tales como miniaturización y sintonizabilidad.application/pdfapplication/pdfapplication/xmlengspaengspaUniversidad Pedagógica y Tecnológica de Colombiahttps://revistas.uptc.edu.co/index.php/ingenieria/article/view/10416/8926https://revistas.uptc.edu.co/index.php/ingenieria/article/view/10416/8615https://revistas.uptc.edu.co/index.php/ingenieria/article/view/10416/9217Revista Facultad de Ingeniería; Vol. 29 No. 54 (2020): Continuos Publication; e10416Revista Facultad de Ingeniería; Vol. 29 Núm. 54 (2020): Publicación Continua; e104162357-53280121-1129dielectric constantferroelectricsmicrowave materialsloss tangentSol-Gelthin filmsconstante dieléctricaferroeléctricosmateriales en microondaspelículas delgadasSol-Geltangente de pérdidaMicrowave Frequency Characterization of Barium Titanate Films Obtained Via Sol-GelCaracterización en frecuencia de microondas de películas de titanato de bario obtenidas vía Sol-Gelinfo:eu-repo/semantics/articlehttp://purl.org/coar/resource_type/c_2df8fbb1info:eu-repo/semantics/publishedVersionhttp://purl.org/coar/version/c_970fb48d4fbd8a482http://purl.org/coar/version/c_970fb48d4fbd8a85http://purl.org/coar/access_right/c_abf399http://purl.org/coar/access_right/c_abf2Marulanda-Bernal, José IgnacioGallo-Castrillón, Wilson HenryMosquera-Palacio, Diana Marybel001/14259oai:repositorio.uptc.edu.co:001/142592025-07-18 11:53:51.475metadata.onlyhttps://repositorio.uptc.edu.coRepositorio Institucional UPTCrepositorio.uptc@uptc.edu.co