Automatic visual inspection: An approach with multi-instance learning

One of the industrial applications of computer vision is automatic visual inspection. In the last decade, standard supervised learning methods have been used to detect defects in different kind of products. These methods are trained with a set of images where every image has to be manually segmented...

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Autores:
Tipo de recurso:
Fecha de publicación:
2016
Institución:
Universidad de Medellín
Repositorio:
Repositorio UDEM
Idioma:
eng
OAI Identifier:
oai:repository.udem.edu.co:11407/3141
Acceso en línea:
http://hdl.handle.net/11407/3141
Palabra clave:
Automatic visual inspection
Defect detection
Multi-instance learning
Pattern recognition
Weak labels
Computer vision
Inspection
Pattern recognition
Automatic visual inspection
Automatic visual inspection systems
Defect detection
Multi-instance learning
Receiver operating characteristic curves
Supervised classifiers
Supervised learning methods
Weak labels
Defects
Rights
restrictedAccess
License
http://purl.org/coar/access_right/c_16ec
Description
Summary:One of the industrial applications of computer vision is automatic visual inspection. In the last decade, standard supervised learning methods have been used to detect defects in different kind of products. These methods are trained with a set of images where every image has to be manually segmented and labeled by experts in the application domain. These manual segmentations require a large amount of high quality delineations (on pixels), which can be time consuming and often a difficult task. Multi-instance learning (MIL), in contrast to standard supervised classifiers, avoids this task and can, therefore, be trained with weakly labeled images. In this paper, we propose an approach for the automatic visual inspection that uses MIL for defect detection. The approach has been tested with data from three artificial benchmark datasets and three real-world industrial scenarios: inspection of artificial teeth, weld defect detection and fishbone detection. Results show that the proposed approach can be used with weakly labeled images for defect detection on automatic visual inspection systems. This approach is able to increase the area under the receiver-operating characteristic curve (AUC) up to 6.3% compared with the naïve MIL approach of propagating the bag labels. © 2016 Elsevier B.V.