Ab initio calculations on twisted graphene/hBN: Electronic structure and STM image simulation

By performing ab initio calculations we obtained theoretical scanning tunneling microscopy (STM) images and studied the electronic properties of graphene on a hexagonal boron-nitrite (hBN) layer. Three different stack configurations and four twisted angles were considered. All calculations were perf...

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Autores:
Tipo de recurso:
Fecha de publicación:
2016
Institución:
Universidad de Medellín
Repositorio:
Repositorio UDEM
Idioma:
eng
OAI Identifier:
oai:repository.udem.edu.co:11407/2465
Acceso en línea:
http://hdl.handle.net/11407/2465
Palabra clave:
Calculations
Density functional theory
Electronic properties
Electronic structure
Fermi level
Heterojunctions
Scanning tunneling microscopy
Van der Waals forces
Ab initio calculations
Density of state
Electronic properties of graphene
Stack configurations
STM images
Total density of state
Van Der Waals interactions
Van Hove singularities
Graphene
Rights
restrictedAccess
License
http://purl.org/coar/access_right/c_16ec
Description
Summary:By performing ab initio calculations we obtained theoretical scanning tunneling microscopy (STM) images and studied the electronic properties of graphene on a hexagonal boron-nitrite (hBN) layer. Three different stack configurations and four twisted angles were considered. All calculations were performed using density functional theory, including van der Waals interactions as implemented in the SIESTA ab initio package. Our results show that the electronic structure of graphene is preserved, although some small changes are induced by the interaction with the hBN layer, particularly in the total density of states at 1.5 eV under the Fermi level. When layers present a twisted angle, the density of states shows several van Hove singularities under the Fermi level, which are associated to moiré patterns observed in theoretical STM images. © 2016 Elsevier Ltd. All rights reserved.