Fabrication and Characterization of Alq3 Thin Films

Alq3 (tris (8-hydroxyquinolate) aluminum) thin films were deposited on glass by thermal evaporation in order to establish the optimal evaporation rates of thin films deposited between 30 to 120nm on a substrate with temperatures between 60 and 120°C. The

Autores:
Adames, R. P.
Segura, J A
Gómez, D P
Ardila, A M
Tipo de recurso:
Fecha de publicación:
2014
Institución:
Universidad EAFIT
Repositorio:
Repositorio EAFIT
Idioma:
spa
OAI Identifier:
oai:repository.eafit.edu.co:10784/14396
Acceso en línea:
http://hdl.handle.net/10784/14396
Palabra clave:
Thin Film
Thermal Evaporation
Substrate
Characterization
Organic Semiconductor
Película Delgada
Evaporación Térmica
Sustrato
Caracterización
Semiconductor Orgánico
Rights
License
Copyright (c) 2014 R. P. Adames, J A Segura, D P Gómez, A M Ardila
id REPOEAFIT2_fcc9340f4ffbd942750a6b3b43c16079
oai_identifier_str oai:repository.eafit.edu.co:10784/14396
network_acronym_str REPOEAFIT2
network_name_str Repositorio EAFIT
repository_id_str
spelling Medellín de: Lat: 06 15 00 N degrees minutes Lat: 6.2500 decimal degrees Long: 075 36 00 W degrees minutes Long: -75.6000 decimal degrees2014-06-242019-11-22T16:48:49Z2014-06-242019-11-22T16:48:49Z2256-43141794-9165http://hdl.handle.net/10784/1439610.17230/ingciencia.10.20.3Alq3 (tris (8-hydroxyquinolate) aluminum) thin films were deposited on glass by thermal evaporation in order to establish the optimal evaporation rates of thin films deposited between 30 to 120nm on a substrate with temperatures between 60 and 120°C. TheLas películas delgadas de Alq3 (aluminio tris (8-hidroxiquinolato)) se depositaron sobre el vidrio por evaporación térmica para establecer las velocidades de evaporación óptimas de las películas delgadas depositadas entre 30 y 120 nm en un sustrato con teapplication/pdfspaUniversidad EAFIThttp://publicaciones.eafit.edu.co/index.php/ingciencia/article/view/2410http://publicaciones.eafit.edu.co/index.php/ingciencia/article/view/2410Copyright (c) 2014 R. P. Adames, J A Segura, D P Gómez, A M ArdilaAcceso abiertohttp://purl.org/coar/access_right/c_abf2instname:Universidad EAFITreponame:Repositorio Institucional Universidad EAFITIngeniería y Ciencia; Vol 10, No 20 (2014)Fabrication and Characterization of Alq3 Thin FilmsFabricación y caracterización de películas delgadas de Alq3articleinfo:eu-repo/semantics/articlepublishedVersioninfo:eu-repo/semantics/publishedVersionArtículohttp://purl.org/coar/version/c_970fb48d4fbd8a85http://purl.org/coar/resource_type/c_6501http://purl.org/coar/resource_type/c_2df8fbb1Thin FilmThermal EvaporationSubstrateCharacterizationOrganic SemiconductorPelícula DelgadaEvaporación TérmicaSustratoCaracterizaciónSemiconductor OrgánicoAdames, R. P.Segura, J AGómez, D PArdila, A MUniversidad Nacional de ColombiaIngeniería y Ciencia10203750ing.cienc.THUMBNAILminaitura-ig_Mesa de trabajo 1.jpgminaitura-ig_Mesa de trabajo 1.jpgimage/jpeg265796https://repository.eafit.edu.co/bitstreams/b3d94d2b-2c73-4eee-bcf7-ef9c678dbfc8/downloadda9b21a5c7e00c7f1127cef8e97035e0MD51ORIGINAL3.pdf3.pdfTexto completo PDFapplication/pdf2267376https://repository.eafit.edu.co/bitstreams/6767ca70-5e86-46a2-8dac-94d48f4d0e92/download0f7c41f4c1b79d17b72bf689739676ebMD52articulo.htmlarticulo.htmlTexto completo HTMLtext/html374https://repository.eafit.edu.co/bitstreams/a093d566-57c5-4bae-93da-9aa28835398a/download0067923b2300bfb703a4c0b77da6e498MD5310784/14396oai:repository.eafit.edu.co:10784/143962020-03-01 23:23:16.611open.accesshttps://repository.eafit.edu.coRepositorio Institucional Universidad EAFITrepositorio@eafit.edu.co
dc.title.eng.fl_str_mv Fabrication and Characterization of Alq3 Thin Films
dc.title.spa.fl_str_mv Fabricación y caracterización de películas delgadas de Alq3
title Fabrication and Characterization of Alq3 Thin Films
spellingShingle Fabrication and Characterization of Alq3 Thin Films
Thin Film
Thermal Evaporation
Substrate
Characterization
Organic Semiconductor
Película Delgada
Evaporación Térmica
Sustrato
Caracterización
Semiconductor Orgánico
title_short Fabrication and Characterization of Alq3 Thin Films
title_full Fabrication and Characterization of Alq3 Thin Films
title_fullStr Fabrication and Characterization of Alq3 Thin Films
title_full_unstemmed Fabrication and Characterization of Alq3 Thin Films
title_sort Fabrication and Characterization of Alq3 Thin Films
dc.creator.fl_str_mv Adames, R. P.
Segura, J A
Gómez, D P
Ardila, A M
dc.contributor.author.spa.fl_str_mv Adames, R. P.
Segura, J A
Gómez, D P
Ardila, A M
dc.contributor.affiliation.spa.fl_str_mv Universidad Nacional de Colombia
dc.subject.keyword.eng.fl_str_mv Thin Film
Thermal Evaporation
Substrate
Characterization
Organic Semiconductor
topic Thin Film
Thermal Evaporation
Substrate
Characterization
Organic Semiconductor
Película Delgada
Evaporación Térmica
Sustrato
Caracterización
Semiconductor Orgánico
dc.subject.keyword.spa.fl_str_mv Película Delgada
Evaporación Térmica
Sustrato
Caracterización
Semiconductor Orgánico
description Alq3 (tris (8-hydroxyquinolate) aluminum) thin films were deposited on glass by thermal evaporation in order to establish the optimal evaporation rates of thin films deposited between 30 to 120nm on a substrate with temperatures between 60 and 120°C. The
publishDate 2014
dc.date.issued.none.fl_str_mv 2014-06-24
dc.date.available.none.fl_str_mv 2019-11-22T16:48:49Z
dc.date.accessioned.none.fl_str_mv 2019-11-22T16:48:49Z
dc.date.none.fl_str_mv 2014-06-24
dc.type.eng.fl_str_mv article
info:eu-repo/semantics/article
publishedVersion
info:eu-repo/semantics/publishedVersion
dc.type.coarversion.fl_str_mv http://purl.org/coar/version/c_970fb48d4fbd8a85
dc.type.coar.fl_str_mv http://purl.org/coar/resource_type/c_6501
http://purl.org/coar/resource_type/c_2df8fbb1
dc.type.local.spa.fl_str_mv Artículo
status_str publishedVersion
dc.identifier.issn.none.fl_str_mv 2256-4314
1794-9165
dc.identifier.uri.none.fl_str_mv http://hdl.handle.net/10784/14396
dc.identifier.doi.none.fl_str_mv 10.17230/ingciencia.10.20.3
identifier_str_mv 2256-4314
1794-9165
10.17230/ingciencia.10.20.3
url http://hdl.handle.net/10784/14396
dc.language.iso.spa.fl_str_mv spa
language spa
dc.relation.isversionof.none.fl_str_mv http://publicaciones.eafit.edu.co/index.php/ingciencia/article/view/2410
dc.relation.uri.none.fl_str_mv http://publicaciones.eafit.edu.co/index.php/ingciencia/article/view/2410
dc.rights.eng.fl_str_mv Copyright (c) 2014 R. P. Adames, J A Segura, D P Gómez, A M Ardila
dc.rights.coar.fl_str_mv http://purl.org/coar/access_right/c_abf2
dc.rights.local.spa.fl_str_mv Acceso abierto
rights_invalid_str_mv Copyright (c) 2014 R. P. Adames, J A Segura, D P Gómez, A M Ardila
Acceso abierto
http://purl.org/coar/access_right/c_abf2
dc.format.none.fl_str_mv application/pdf
dc.coverage.spatial.eng.fl_str_mv Medellín de: Lat: 06 15 00 N degrees minutes Lat: 6.2500 decimal degrees Long: 075 36 00 W degrees minutes Long: -75.6000 decimal degrees
dc.publisher.spa.fl_str_mv Universidad EAFIT
dc.source.none.fl_str_mv instname:Universidad EAFIT
reponame:Repositorio Institucional Universidad EAFIT
dc.source.spa.fl_str_mv Ingeniería y Ciencia; Vol 10, No 20 (2014)
instname_str Universidad EAFIT
institution Universidad EAFIT
reponame_str Repositorio Institucional Universidad EAFIT
collection Repositorio Institucional Universidad EAFIT
bitstream.url.fl_str_mv https://repository.eafit.edu.co/bitstreams/b3d94d2b-2c73-4eee-bcf7-ef9c678dbfc8/download
https://repository.eafit.edu.co/bitstreams/6767ca70-5e86-46a2-8dac-94d48f4d0e92/download
https://repository.eafit.edu.co/bitstreams/a093d566-57c5-4bae-93da-9aa28835398a/download
bitstream.checksum.fl_str_mv da9b21a5c7e00c7f1127cef8e97035e0
0f7c41f4c1b79d17b72bf689739676eb
0067923b2300bfb703a4c0b77da6e498
bitstream.checksumAlgorithm.fl_str_mv MD5
MD5
MD5
repository.name.fl_str_mv Repositorio Institucional Universidad EAFIT
repository.mail.fl_str_mv repositorio@eafit.edu.co
_version_ 1814110460131147776

Publicaciones similares