Analytical Model for Electronic Transport in Semiconductor Thin Films
Polycrystalline semiconductors are materials who often exhibit unusual electrical properties. In the model we assume that the crystals are composed of semiconductor material, the grain itself, which is surrounded by highly disordered and resistive materials, the grain boundary. The grain boundary di...
- Autores:
-
Torres-Luengo, M
Martínez, H M
Torres, J
López-Carreño, L D
- Tipo de recurso:
- Fecha de publicación:
- 2013
- Institución:
- Universidad EAFIT
- Repositorio:
- Repositorio EAFIT
- Idioma:
- spa
- OAI Identifier:
- oai:repository.eafit.edu.co:10784/14429
- Acceso en línea:
- http://hdl.handle.net/10784/14429
- Palabra clave:
- Thin Films
Semiconductors
Electrical Conduction
Model
Películas Delgadas
Semiconductores
Conducción Eléctrica
Modelo
- Rights
- License
- Copyright (c) 2013 M Torres-Luengo, H M Martínez, J Torres, L D López-Carreño
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dc.title.eng.fl_str_mv |
Analytical Model for Electronic Transport in Semiconductor Thin Films |
dc.title.spa.fl_str_mv |
Modelo analítico para el transporte electrónico en películas delgadas semiconductoras |
title |
Analytical Model for Electronic Transport in Semiconductor Thin Films |
spellingShingle |
Analytical Model for Electronic Transport in Semiconductor Thin Films Thin Films Semiconductors Electrical Conduction Model Películas Delgadas Semiconductores Conducción Eléctrica Modelo |
title_short |
Analytical Model for Electronic Transport in Semiconductor Thin Films |
title_full |
Analytical Model for Electronic Transport in Semiconductor Thin Films |
title_fullStr |
Analytical Model for Electronic Transport in Semiconductor Thin Films |
title_full_unstemmed |
Analytical Model for Electronic Transport in Semiconductor Thin Films |
title_sort |
Analytical Model for Electronic Transport in Semiconductor Thin Films |
dc.creator.fl_str_mv |
Torres-Luengo, M Martínez, H M Torres, J López-Carreño, L D |
dc.contributor.author.spa.fl_str_mv |
Torres-Luengo, M Martínez, H M Torres, J López-Carreño, L D |
dc.contributor.affiliation.spa.fl_str_mv |
Universidad Nacional de Colombia |
dc.subject.keyword.eng.fl_str_mv |
Thin Films Semiconductors Electrical Conduction Model |
topic |
Thin Films Semiconductors Electrical Conduction Model Películas Delgadas Semiconductores Conducción Eléctrica Modelo |
dc.subject.keyword.spa.fl_str_mv |
Películas Delgadas Semiconductores Conducción Eléctrica Modelo |
description |
Polycrystalline semiconductors are materials who often exhibit unusual electrical properties. In the model we assume that the crystals are composed of semiconductor material, the grain itself, which is surrounded by highly disordered and resistive materials, the grain boundary. The grain boundary disturbs the structural regularity of the crystal giving rise to localized electronic states within the energy gap. The existence of these states promotes the charge trapping at the grain boundaries and the bending of the energy bands. This bending is characterized by a potential barrier and a space charge zone which control the electron transport through the grain boundary. The model uses the diusion and drift carriers theories, and thermoionic emission, and the quantum tunneling of carriers through the potential barrier was also taken into consideration. Since the structure of the thin lms of molybdenum trioxide (MoO3) obtained through spray pyrolysis is granular and nanosize, the model described the behavior of the current-voltage characteristic (I-V) of the films. |
publishDate |
2013 |
dc.date.issued.none.fl_str_mv |
2013-11-05 |
dc.date.available.none.fl_str_mv |
2019-11-22T17:02:58Z |
dc.date.accessioned.none.fl_str_mv |
2019-11-22T17:02:58Z |
dc.date.none.fl_str_mv |
2013-11-05 |
dc.type.eng.fl_str_mv |
article info:eu-repo/semantics/article publishedVersion info:eu-repo/semantics/publishedVersion |
dc.type.coarversion.fl_str_mv |
http://purl.org/coar/version/c_970fb48d4fbd8a85 |
dc.type.coar.fl_str_mv |
http://purl.org/coar/resource_type/c_6501 http://purl.org/coar/resource_type/c_2df8fbb1 |
dc.type.local.spa.fl_str_mv |
Artículo |
status_str |
publishedVersion |
dc.identifier.issn.none.fl_str_mv |
2256-4314 1794-9165 |
dc.identifier.uri.none.fl_str_mv |
http://hdl.handle.net/10784/14429 |
dc.identifier.doi.none.fl_str_mv |
10.17230/ingciecia.9.18.9 |
identifier_str_mv |
2256-4314 1794-9165 10.17230/ingciecia.9.18.9 |
url |
http://hdl.handle.net/10784/14429 |
dc.language.iso.spa.fl_str_mv |
spa |
language |
spa |
dc.relation.isversionof.none.fl_str_mv |
http://publicaciones.eafit.edu.co/index.php/ingciencia/article/view/2020 |
dc.relation.uri.none.fl_str_mv |
http://publicaciones.eafit.edu.co/index.php/ingciencia/article/view/2020 |
dc.rights.eng.fl_str_mv |
Copyright (c) 2013 M Torres-Luengo, H M Martínez, J Torres, L D López-Carreño |
dc.rights.coar.fl_str_mv |
http://purl.org/coar/access_right/c_abf2 |
dc.rights.local.spa.fl_str_mv |
Acceso abierto |
rights_invalid_str_mv |
Copyright (c) 2013 M Torres-Luengo, H M Martínez, J Torres, L D López-Carreño Acceso abierto http://purl.org/coar/access_right/c_abf2 |
dc.format.none.fl_str_mv |
application/pdf |
dc.coverage.spatial.eng.fl_str_mv |
Medellín de: Lat: 06 15 00 N degrees minutes Lat: 6.2500 decimal degrees Long: 075 36 00 W degrees minutes Long: -75.6000 decimal degrees |
dc.publisher.spa.fl_str_mv |
Universidad EAFIT |
dc.source.none.fl_str_mv |
instname:Universidad EAFIT reponame:Repositorio Institucional Universidad EAFIT |
dc.source.spa.fl_str_mv |
Ingeniería y Ciencia; Vol 9, No 18 (2013) |
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Universidad EAFIT |
institution |
Universidad EAFIT |
reponame_str |
Repositorio Institucional Universidad EAFIT |
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Repositorio Institucional Universidad EAFIT |
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Medellín de: Lat: 06 15 00 N degrees minutes Lat: 6.2500 decimal degrees Long: 075 36 00 W degrees minutes Long: -75.6000 decimal degrees2013-11-052019-11-22T17:02:58Z2013-11-052019-11-22T17:02:58Z2256-43141794-9165http://hdl.handle.net/10784/1442910.17230/ingciecia.9.18.9Polycrystalline semiconductors are materials who often exhibit unusual electrical properties. In the model we assume that the crystals are composed of semiconductor material, the grain itself, which is surrounded by highly disordered and resistive materials, the grain boundary. The grain boundary disturbs the structural regularity of the crystal giving rise to localized electronic states within the energy gap. The existence of these states promotes the charge trapping at the grain boundaries and the bending of the energy bands. This bending is characterized by a potential barrier and a space charge zone which control the electron transport through the grain boundary. The model uses the diusion and drift carriers theories, and thermoionic emission, and the quantum tunneling of carriers through the potential barrier was also taken into consideration. Since the structure of the thin lms of molybdenum trioxide (MoO3) obtained through spray pyrolysis is granular and nanosize, the model described the behavior of the current-voltage characteristic (I-V) of the films.Los semiconductores policristalinos son materiales que a menudo exhiben propiedades eléctricas inusuales. En el modelo suponemos que los cristales están compuestos de material semiconductor, el grano mismo, que está rodeado de materiales altamente desordenados y resistentes, el límite del grano. El límite de grano perturba la regularidad estructural del cristal, dando lugar a estados electrónicos localizados dentro de la brecha de energía. La existencia de estos estados promueve la captura de carga en los límites del grano y la flexión de las bandas de energía. Esta flexión se caracteriza por una barrera potencial y una zona de carga espacial que controlan el transporte de electrones a través del límite del grano. El modelo utiliza las teorías de los portadores de deriva y deriva, y la emisión termoiónica, y también se tuvo en cuenta el túnel cuántico de los portadores a través de la barrera potencial. Dado que la estructura de las películas finas de trióxido de molibdeno (MoO3) obtenidas a través de la pirólisis por pulverización es granular y de tamaño nanométrico, el modelo describió el comportamiento de la característica de corriente-voltaje (I-V) de las películas.application/pdfspaUniversidad EAFIThttp://publicaciones.eafit.edu.co/index.php/ingciencia/article/view/2020http://publicaciones.eafit.edu.co/index.php/ingciencia/article/view/2020Copyright (c) 2013 M Torres-Luengo, H M Martínez, J Torres, L D López-CarreñoAcceso abiertohttp://purl.org/coar/access_right/c_abf2instname:Universidad EAFITreponame:Repositorio Institucional Universidad EAFITIngeniería y Ciencia; Vol 9, No 18 (2013)Analytical Model for Electronic Transport in Semiconductor Thin FilmsModelo analítico para el transporte electrónico en películas delgadas semiconductorasarticleinfo:eu-repo/semantics/articlepublishedVersioninfo:eu-repo/semantics/publishedVersionArtículohttp://purl.org/coar/version/c_970fb48d4fbd8a85http://purl.org/coar/resource_type/c_6501http://purl.org/coar/resource_type/c_2df8fbb1Thin FilmsSemiconductorsElectrical ConductionModelPelículas DelgadasSemiconductoresConducción EléctricaModeloTorres-Luengo, M11bb90dc-03d6-4505-a288-7946e1351f34-1Martínez, H Mb7bd1322-b874-4d5e-9173-4f18e6e05931-1Torres, Jf02e5385-7343-40d7-8e3d-51ef2e667f5e-1López-Carreño, L Dff5520b2-ef7c-4d0d-8ab3-254b729ee637-1Universidad Nacional de ColombiaIngeniería y Ciencia918153170ing.cienc.ORIGINALdocument (26).pdfdocument (26).pdfTexto completo PDFapplication/pdf702336https://repository.eafit.edu.co/bitstreams/99804cd0-4ea8-4a7f-8785-2ce4735c03a8/download63d1948ed156358873cd4ffcde5b1d15MD51articulo.htmlarticulo.htmlTexto completo HTMLtext/html374https://repository.eafit.edu.co/bitstreams/c3859cf0-83e9-4f7a-9f92-ea3183c8297d/downloaddfb970ca4697df20eb83cf8667a19c09MD53THUMBNAILminaitura-ig_Mesa de trabajo 1.jpgminaitura-ig_Mesa de trabajo 1.jpgimage/jpeg265796https://repository.eafit.edu.co/bitstreams/df811254-7a9b-4873-a5c1-471db0a5be69/downloadda9b21a5c7e00c7f1127cef8e97035e0MD5210784/14429oai:repository.eafit.edu.co:10784/144292024-12-04 11:49:54.148open.accesshttps://repository.eafit.edu.coRepositorio Institucional Universidad EAFITrepositorio@eafit.edu.co |