Analytical Model for Electronic Transport in Semiconductor Thin Films

Polycrystalline semiconductors are materials who often exhibit unusual electrical properties. In the model we assume that the crystals are composed of semiconductor material, the grain itself, which is surrounded by highly disordered and resistive materials, the grain boundary. The grain boundary di...

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Autores:
Torres-Luengo, M
Martínez, H M
Torres, J
López-Carreño, L D
Tipo de recurso:
Fecha de publicación:
2013
Institución:
Universidad EAFIT
Repositorio:
Repositorio EAFIT
Idioma:
spa
OAI Identifier:
oai:repository.eafit.edu.co:10784/14429
Acceso en línea:
http://hdl.handle.net/10784/14429
Palabra clave:
Thin Films
Semiconductors
Electrical Conduction
Model
Películas Delgadas
Semiconductores
Conducción Eléctrica
Modelo
Rights
License
Copyright (c) 2013 M Torres-Luengo, H M Martínez, J Torres, L D López-Carreño
id REPOEAFIT2_791c8b6bbb28c0bcbc7629799d88c130
oai_identifier_str oai:repository.eafit.edu.co:10784/14429
network_acronym_str REPOEAFIT2
network_name_str Repositorio EAFIT
repository_id_str
dc.title.eng.fl_str_mv Analytical Model for Electronic Transport in Semiconductor Thin Films
dc.title.spa.fl_str_mv Modelo analítico para el transporte electrónico en películas delgadas semiconductoras
title Analytical Model for Electronic Transport in Semiconductor Thin Films
spellingShingle Analytical Model for Electronic Transport in Semiconductor Thin Films
Thin Films
Semiconductors
Electrical Conduction
Model
Películas Delgadas
Semiconductores
Conducción Eléctrica
Modelo
title_short Analytical Model for Electronic Transport in Semiconductor Thin Films
title_full Analytical Model for Electronic Transport in Semiconductor Thin Films
title_fullStr Analytical Model for Electronic Transport in Semiconductor Thin Films
title_full_unstemmed Analytical Model for Electronic Transport in Semiconductor Thin Films
title_sort Analytical Model for Electronic Transport in Semiconductor Thin Films
dc.creator.fl_str_mv Torres-Luengo, M
Martínez, H M
Torres, J
López-Carreño, L D
dc.contributor.author.spa.fl_str_mv Torres-Luengo, M
Martínez, H M
Torres, J
López-Carreño, L D
dc.contributor.affiliation.spa.fl_str_mv Universidad Nacional de Colombia
dc.subject.keyword.eng.fl_str_mv Thin Films
Semiconductors
Electrical Conduction
Model
topic Thin Films
Semiconductors
Electrical Conduction
Model
Películas Delgadas
Semiconductores
Conducción Eléctrica
Modelo
dc.subject.keyword.spa.fl_str_mv Películas Delgadas
Semiconductores
Conducción Eléctrica
Modelo
description Polycrystalline semiconductors are materials who often exhibit unusual electrical properties. In the model we assume that the crystals are composed of semiconductor material, the grain itself, which is surrounded by highly disordered and resistive materials, the grain boundary. The grain boundary disturbs the structural regularity of the crystal giving rise to localized electronic states within the energy gap. The existence of these states promotes the charge trapping at the grain boundaries and the bending of the energy bands. This bending is characterized by a potential barrier and a space charge zone which control the electron transport through the grain boundary. The model uses the diusion and drift carriers theories, and thermoionic emission, and the quantum tunneling of carriers through the potential barrier was also taken into consideration. Since the structure of the thin lms of molybdenum trioxide (MoO3) obtained through spray pyrolysis is granular and nanosize, the model described the behavior of the current-voltage characteristic (I-V) of the films.
publishDate 2013
dc.date.issued.none.fl_str_mv 2013-11-05
dc.date.available.none.fl_str_mv 2019-11-22T17:02:58Z
dc.date.accessioned.none.fl_str_mv 2019-11-22T17:02:58Z
dc.date.none.fl_str_mv 2013-11-05
dc.type.eng.fl_str_mv article
info:eu-repo/semantics/article
publishedVersion
info:eu-repo/semantics/publishedVersion
dc.type.coarversion.fl_str_mv http://purl.org/coar/version/c_970fb48d4fbd8a85
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http://purl.org/coar/resource_type/c_2df8fbb1
dc.type.local.spa.fl_str_mv Artículo
status_str publishedVersion
dc.identifier.issn.none.fl_str_mv 2256-4314
1794-9165
dc.identifier.uri.none.fl_str_mv http://hdl.handle.net/10784/14429
dc.identifier.doi.none.fl_str_mv 10.17230/ingciecia.9.18.9
identifier_str_mv 2256-4314
1794-9165
10.17230/ingciecia.9.18.9
url http://hdl.handle.net/10784/14429
dc.language.iso.spa.fl_str_mv spa
language spa
dc.relation.isversionof.none.fl_str_mv http://publicaciones.eafit.edu.co/index.php/ingciencia/article/view/2020
dc.relation.uri.none.fl_str_mv http://publicaciones.eafit.edu.co/index.php/ingciencia/article/view/2020
dc.rights.eng.fl_str_mv Copyright (c) 2013 M Torres-Luengo, H M Martínez, J Torres, L D López-Carreño
dc.rights.coar.fl_str_mv http://purl.org/coar/access_right/c_abf2
dc.rights.local.spa.fl_str_mv Acceso abierto
rights_invalid_str_mv Copyright (c) 2013 M Torres-Luengo, H M Martínez, J Torres, L D López-Carreño
Acceso abierto
http://purl.org/coar/access_right/c_abf2
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dc.coverage.spatial.eng.fl_str_mv Medellín de: Lat: 06 15 00 N degrees minutes Lat: 6.2500 decimal degrees Long: 075 36 00 W degrees minutes Long: -75.6000 decimal degrees
dc.publisher.spa.fl_str_mv Universidad EAFIT
dc.source.none.fl_str_mv instname:Universidad EAFIT
reponame:Repositorio Institucional Universidad EAFIT
dc.source.spa.fl_str_mv Ingeniería y Ciencia; Vol 9, No 18 (2013)
instname_str Universidad EAFIT
institution Universidad EAFIT
reponame_str Repositorio Institucional Universidad EAFIT
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spelling Medellín de: Lat: 06 15 00 N degrees minutes Lat: 6.2500 decimal degrees Long: 075 36 00 W degrees minutes Long: -75.6000 decimal degrees2013-11-052019-11-22T17:02:58Z2013-11-052019-11-22T17:02:58Z2256-43141794-9165http://hdl.handle.net/10784/1442910.17230/ingciecia.9.18.9Polycrystalline semiconductors are materials who often exhibit unusual electrical properties. In the model we assume that the crystals are composed of semiconductor material, the grain itself, which is surrounded by highly disordered and resistive materials, the grain boundary. The grain boundary disturbs the structural regularity of the crystal giving rise to localized electronic states within the energy gap. The existence of these states promotes the charge trapping at the grain boundaries and the bending of the energy bands. This bending is characterized by a potential barrier and a space charge zone which control the electron transport through the grain boundary. The model uses the diusion and drift carriers theories, and thermoionic emission, and the quantum tunneling of carriers through the potential barrier was also taken into consideration. Since the structure of the thin lms of molybdenum trioxide (MoO3) obtained through spray pyrolysis is granular and nanosize, the model described the behavior of the current-voltage characteristic (I-V) of the films.Los semiconductores policristalinos son materiales que a menudo exhiben propiedades eléctricas inusuales. En el modelo suponemos que los cristales están compuestos de material semiconductor, el grano mismo, que está rodeado de materiales altamente desordenados y resistentes, el límite del grano. El límite de grano perturba la regularidad estructural del cristal, dando lugar a estados electrónicos localizados dentro de la brecha de energía. La existencia de estos estados promueve la captura de carga en los límites del grano y la flexión de las bandas de energía. Esta flexión se caracteriza por una barrera potencial y una zona de carga espacial que controlan el transporte de electrones a través del límite del grano. El modelo utiliza las teorías de los portadores de deriva y deriva, y la emisión termoiónica, y también se tuvo en cuenta el túnel cuántico de los portadores a través de la barrera potencial. Dado que la estructura de las películas finas de trióxido de molibdeno (MoO3) obtenidas a través de la pirólisis por pulverización es granular y de tamaño nanométrico, el modelo describió el comportamiento de la característica de corriente-voltaje (I-V) de las películas.application/pdfspaUniversidad EAFIThttp://publicaciones.eafit.edu.co/index.php/ingciencia/article/view/2020http://publicaciones.eafit.edu.co/index.php/ingciencia/article/view/2020Copyright (c) 2013 M Torres-Luengo, H M Martínez, J Torres, L D López-CarreñoAcceso abiertohttp://purl.org/coar/access_right/c_abf2instname:Universidad EAFITreponame:Repositorio Institucional Universidad EAFITIngeniería y Ciencia; Vol 9, No 18 (2013)Analytical Model for Electronic Transport in Semiconductor Thin FilmsModelo analítico para el transporte electrónico en películas delgadas semiconductorasarticleinfo:eu-repo/semantics/articlepublishedVersioninfo:eu-repo/semantics/publishedVersionArtículohttp://purl.org/coar/version/c_970fb48d4fbd8a85http://purl.org/coar/resource_type/c_6501http://purl.org/coar/resource_type/c_2df8fbb1Thin FilmsSemiconductorsElectrical ConductionModelPelículas DelgadasSemiconductoresConducción EléctricaModeloTorres-Luengo, M11bb90dc-03d6-4505-a288-7946e1351f34-1Martínez, H Mb7bd1322-b874-4d5e-9173-4f18e6e05931-1Torres, Jf02e5385-7343-40d7-8e3d-51ef2e667f5e-1López-Carreño, L Dff5520b2-ef7c-4d0d-8ab3-254b729ee637-1Universidad Nacional de ColombiaIngeniería y Ciencia918153170ing.cienc.ORIGINALdocument (26).pdfdocument (26).pdfTexto completo PDFapplication/pdf702336https://repository.eafit.edu.co/bitstreams/99804cd0-4ea8-4a7f-8785-2ce4735c03a8/download63d1948ed156358873cd4ffcde5b1d15MD51articulo.htmlarticulo.htmlTexto completo HTMLtext/html374https://repository.eafit.edu.co/bitstreams/c3859cf0-83e9-4f7a-9f92-ea3183c8297d/downloaddfb970ca4697df20eb83cf8667a19c09MD53THUMBNAILminaitura-ig_Mesa de trabajo 1.jpgminaitura-ig_Mesa de trabajo 1.jpgimage/jpeg265796https://repository.eafit.edu.co/bitstreams/df811254-7a9b-4873-a5c1-471db0a5be69/downloadda9b21a5c7e00c7f1127cef8e97035e0MD5210784/14429oai:repository.eafit.edu.co:10784/144292024-12-04 11:49:54.148open.accesshttps://repository.eafit.edu.coRepositorio Institucional Universidad EAFITrepositorio@eafit.edu.co