Integrated analogical signs generator for testing mixed integrated circuits
This paper presents the design of a functional block for testing analog and mixed-signal integrated circuits. The objective is that this functional block is embedded into an integrated circuit, IC, to generate the stimuli of the analog functional blocks. The result is a simple block with the ability...
- Autores:
-
Simancas-García, José L.
Meléndez Pertuz, Farid A.
combita, harold
R. González, Ramón E.
Collazos-Morales, Carlos
- Tipo de recurso:
- Part of book
- Fecha de publicación:
- 2022
- Institución:
- Corporación Universidad de la Costa
- Repositorio:
- REDICUC - Repositorio CUC
- Idioma:
- eng
- OAI Identifier:
- oai:repositorio.cuc.edu.co:11323/9253
- Acceso en línea:
- https://hdl.handle.net/11323/9253
https://doi.org/10.1007/978-3-030-98404-5_45
https://repositorio.cuc.edu.co/
- Palabra clave:
- Integrated circuit
Testing
Analog and mixed-signal systems
- Rights
- embargoedAccess
- License
- © 2022 Springer Nature Switzerland AG
| id |
RCUC2_f717173f2f9309d94e6ac51b87ccfdd3 |
|---|---|
| oai_identifier_str |
oai:repositorio.cuc.edu.co:11323/9253 |
| network_acronym_str |
RCUC2 |
| network_name_str |
REDICUC - Repositorio CUC |
| repository_id_str |
|
| dc.title.eng.fl_str_mv |
Integrated analogical signs generator for testing mixed integrated circuits |
| title |
Integrated analogical signs generator for testing mixed integrated circuits |
| spellingShingle |
Integrated analogical signs generator for testing mixed integrated circuits Integrated circuit Testing Analog and mixed-signal systems |
| title_short |
Integrated analogical signs generator for testing mixed integrated circuits |
| title_full |
Integrated analogical signs generator for testing mixed integrated circuits |
| title_fullStr |
Integrated analogical signs generator for testing mixed integrated circuits |
| title_full_unstemmed |
Integrated analogical signs generator for testing mixed integrated circuits |
| title_sort |
Integrated analogical signs generator for testing mixed integrated circuits |
| dc.creator.fl_str_mv |
Simancas-García, José L. Meléndez Pertuz, Farid A. combita, harold R. González, Ramón E. Collazos-Morales, Carlos |
| dc.contributor.author.spa.fl_str_mv |
Simancas-García, José L. Meléndez Pertuz, Farid A. combita, harold R. González, Ramón E. Collazos-Morales, Carlos |
| dc.subject.proposal.eng.fl_str_mv |
Integrated circuit Testing Analog and mixed-signal systems |
| topic |
Integrated circuit Testing Analog and mixed-signal systems |
| description |
This paper presents the design of a functional block for testing analog and mixed-signal integrated circuits. The objective is that this functional block is embedded into an integrated circuit, IC, to generate the stimuli of the analog functional blocks. The result is a simple block with the ability to generate analog stimuli, as evidenced in the simulations carried out. |
| publishDate |
2022 |
| dc.date.accessioned.none.fl_str_mv |
2022-06-14T16:11:29Z |
| dc.date.available.none.fl_str_mv |
2022-06-14T16:11:29Z |
| dc.date.issued.none.fl_str_mv |
2022-03-20 |
| dc.type.spa.fl_str_mv |
Capítulo - Parte de Libro |
| dc.type.coarversion.fl_str_mv |
http://purl.org/coar/version/c_b1a7d7d4d402bcce |
| dc.type.coar.spa.fl_str_mv |
http://purl.org/coar/resource_type/c_3248 |
| dc.type.content.spa.fl_str_mv |
Text |
| dc.type.driver.spa.fl_str_mv |
info:eu-repo/semantics/bookPart |
| dc.type.redcol.spa.fl_str_mv |
http://purl.org/redcol/resource_type/CAP_LIB |
| format |
http://purl.org/coar/resource_type/c_3248 |
| dc.identifier.citation.spa.fl_str_mv |
Simancas-García, J.L., Meléndez-Pertuz, F.A., Combita-Niño, H., González, R.E.R., Collazos-Morales, C. (2022). Integrated Analogical Signs Generator for Testing Mixed Integrated Circuits. In: Kim, JH., Singh, M., Khan, J., Tiwary, U.S., Sur, M., Singh, D. (eds) Intelligent Human Computer Interaction. IHCI 2021. Lecture Notes in Computer Science, vol 13184. Springer, Cham. https://doi.org/10.1007/978-3-030-98404-5_45 |
| dc.identifier.isbn.spa.fl_str_mv |
978-3-030-98403-8 |
| dc.identifier.uri.spa.fl_str_mv |
https://hdl.handle.net/11323/9253 |
| dc.identifier.url.spa.fl_str_mv |
https://doi.org/10.1007/978-3-030-98404-5_45 |
| dc.identifier.doi.spa.fl_str_mv |
10.1007/978-3-030-98404-5_45 |
| dc.identifier.instname.spa.fl_str_mv |
Corporación Universidad de la Costa |
| dc.identifier.reponame.spa.fl_str_mv |
REDICUC - Repositorio CUC |
| dc.identifier.repourl.spa.fl_str_mv |
https://repositorio.cuc.edu.co/ |
| dc.identifier.eisbn.spa.fl_str_mv |
978-3-030-98404-5 |
| identifier_str_mv |
Simancas-García, J.L., Meléndez-Pertuz, F.A., Combita-Niño, H., González, R.E.R., Collazos-Morales, C. (2022). Integrated Analogical Signs Generator for Testing Mixed Integrated Circuits. In: Kim, JH., Singh, M., Khan, J., Tiwary, U.S., Sur, M., Singh, D. (eds) Intelligent Human Computer Interaction. IHCI 2021. Lecture Notes in Computer Science, vol 13184. Springer, Cham. https://doi.org/10.1007/978-3-030-98404-5_45 978-3-030-98403-8 10.1007/978-3-030-98404-5_45 Corporación Universidad de la Costa REDICUC - Repositorio CUC 978-3-030-98404-5 |
| url |
https://hdl.handle.net/11323/9253 https://doi.org/10.1007/978-3-030-98404-5_45 https://repositorio.cuc.edu.co/ |
| dc.language.iso.none.fl_str_mv |
eng |
| language |
eng |
| dc.relation.ispartofseries.spa.fl_str_mv |
Lecture Notes in Computer Science; |
| dc.relation.ispartofbook.spa.fl_str_mv |
Intelligent Human Computer Interaction. IHCI 2021. |
| dc.relation.references.spa.fl_str_mv |
Simancas-García, J.L.: Diagnóstico de Circuitos Integrados Analógicos y de Comunicaciones. INGE@UAN - Tendencias en la Ingeniería 1(2), 7–19 (2011) Zorian, Y.: System-chips test strategies. In: Design Automation Conference (35th: 1998: San Francisco), San Francisco, p. 6. ACM (1998) Hafed, M., Abaskharoun, N., Roberts, G.: A 4-GHz effective sample rate integrated test core for analog and mixed-signal circuits. IEEE J. Solid-State Circ. 37(4), 499–514 (2002) Rubio, A., et al.: Diseño de circuitos y sistemas integrados, p. 446. Alfaomega, Mexico (2005) Kundert, K., et al.: Design of mixed-signal systems-on-a-chip. IEEE Trans. Comput.-Aided Des. Integr. Circ. Syst. 19(12), 1561–1571 (2000) Hafed, M., Roberts, G.: A stand-alone integrated excitation/extraction systems for analog BIST application. In: IEEE Costum Integrated Circuit Conference, p. 4. IEEE (200) Hafed, M., Roberts, G.: Techniques for high-frequency integrated test and measurement. IEEE Trans. Instrum. Measur. 52(16), 1780–1786 (2003) Hawrysh, E., Roberts, G.: An integration of memory-based analog signal generation into current DFT architectures. IEEE Trans. Instrum. Measur. 47(3), 748–759 (1998) Simancas-García, J.L., Meléndez-Pertuz, F.A., González, R.E.R., Cárdenas, C.A., Collazos-Morales, C.A.: Digital analog converter for the extraction of test signals from mixed integrated circuits. In: Gervasi, Osvaldo, et al. (eds.) ICCSA 2021. LNCS, vol. 12949, pp. 207–223. Springer, Cham (2021). https://doi.org/10.1007/978-3-030-86653-2_15 Simancas-García, J.L., Caicedo-Ortiz, J.G.: Modelo computacional de un modulador ∑-∆ de 2° orden para la generación de señales de prueba en circuitos integrados analógicos. INGE@UAN - Tendencias en la Ingeniería 5(9), 43–55 (2014) Simancas-García, J.L.: Diseño de un Amplificador Operacional CMOS de Amplio Ancho de Banda y Alta Ganancia para Aplicaciones de Alta Velocidad. IngeCUC 9(1) (2013) Tokheim, R.: Principios digitales, 3 edn., p. 402. MacGraw-Hill, España (1995) Aziz, P., Sorensen, H., van der Spiegel, J.: An overview of sigma-delta converters: how a 1-bit ADC achieves more than 16-bit resolution. IEEE Signal Process. Mag. 61–84 (1996) LNCS. http://www.numerix-dsp.com/appsnotes/APR8-sigma-delta.pdf |
| dc.relation.citationendpage.spa.fl_str_mv |
495 |
| dc.relation.citationstartpage.spa.fl_str_mv |
483 |
| dc.rights.spa.fl_str_mv |
© 2022 Springer Nature Switzerland AG Atribución-NoComercial-CompartirIgual 4.0 Internacional (CC BY-NC-SA 4.0) |
| dc.rights.uri.spa.fl_str_mv |
https://creativecommons.org/licenses/by-nc-sa/4.0/ |
| dc.rights.accessrights.spa.fl_str_mv |
info:eu-repo/semantics/embargoedAccess |
| dc.rights.coar.spa.fl_str_mv |
http://purl.org/coar/access_right/c_f1cf |
| rights_invalid_str_mv |
© 2022 Springer Nature Switzerland AG Atribución-NoComercial-CompartirIgual 4.0 Internacional (CC BY-NC-SA 4.0) https://creativecommons.org/licenses/by-nc-sa/4.0/ http://purl.org/coar/access_right/c_f1cf |
| eu_rights_str_mv |
embargoedAccess |
| dc.format.extent.spa.fl_str_mv |
13 páginas |
| dc.format.mimetype.spa.fl_str_mv |
application/pdf |
| dc.publisher.spa.fl_str_mv |
Springer, Cham |
| dc.publisher.place.spa.fl_str_mv |
Switzerland |
| institution |
Corporación Universidad de la Costa |
| dc.source.url.spa.fl_str_mv |
https://link.springer.com/chapter/10.1007/978-3-030-98404-5_45 |
| bitstream.url.fl_str_mv |
https://repositorio.cuc.edu.co/bitstream/11323/9253/1/Integrated%20analogical%20signs%20generator%20for%20testing%20mixed%20integrated%20circuits.pdf https://repositorio.cuc.edu.co/bitstream/11323/9253/2/license.txt https://repositorio.cuc.edu.co/bitstream/11323/9253/3/Integrated%20analogical%20signs%20generator%20for%20testing%20mixed%20integrated%20circuits.pdf.txt https://repositorio.cuc.edu.co/bitstream/11323/9253/4/Integrated%20analogical%20signs%20generator%20for%20testing%20mixed%20integrated%20circuits.pdf.jpg |
| bitstream.checksum.fl_str_mv |
57975272bf61fcad3a95151df7d503b4 e30e9215131d99561d40d6b0abbe9bad a3f0ed32542abf55e8ddfaaf7cd6755c f297622f4ed06d1368c276096f7eff2c |
| bitstream.checksumAlgorithm.fl_str_mv |
MD5 MD5 MD5 MD5 |
| repository.name.fl_str_mv |
Repositorio Universidad de La Costa |
| repository.mail.fl_str_mv |
bdigital@metabiblioteca.com |
| _version_ |
1808400094449369088 |
| spelling |
Simancas-García, José L.40c1a1801b6c368e0668e7f99e8f39f4600Meléndez Pertuz, Farid A.6de46df40030f809264c8cd1be76bb15combita, haroldac8fb40023dcde7d49e8c92bc9041335600R. González, Ramón E.474abacd97418734ff6cd5e3a5190ce4Collazos-Morales, Carlos5c92cb98ac4f20e4bdf10253eec8d24b6002022-06-14T16:11:29Z2022-06-14T16:11:29Z2022-03-20Simancas-García, J.L., Meléndez-Pertuz, F.A., Combita-Niño, H., González, R.E.R., Collazos-Morales, C. (2022). Integrated Analogical Signs Generator for Testing Mixed Integrated Circuits. In: Kim, JH., Singh, M., Khan, J., Tiwary, U.S., Sur, M., Singh, D. (eds) Intelligent Human Computer Interaction. IHCI 2021. Lecture Notes in Computer Science, vol 13184. Springer, Cham. https://doi.org/10.1007/978-3-030-98404-5_45978-3-030-98403-8https://hdl.handle.net/11323/9253https://doi.org/10.1007/978-3-030-98404-5_4510.1007/978-3-030-98404-5_45Corporación Universidad de la CostaREDICUC - Repositorio CUChttps://repositorio.cuc.edu.co/978-3-030-98404-5This paper presents the design of a functional block for testing analog and mixed-signal integrated circuits. The objective is that this functional block is embedded into an integrated circuit, IC, to generate the stimuli of the analog functional blocks. The result is a simple block with the ability to generate analog stimuli, as evidenced in the simulations carried out.13 páginasapplication/pdfengSpringer, ChamSwitzerlandLecture Notes in Computer Science;Intelligent Human Computer Interaction. IHCI 2021.Simancas-García, J.L.: Diagnóstico de Circuitos Integrados Analógicos y de Comunicaciones. INGE@UAN - Tendencias en la Ingeniería 1(2), 7–19 (2011)Zorian, Y.: System-chips test strategies. In: Design Automation Conference (35th: 1998: San Francisco), San Francisco, p. 6. ACM (1998)Hafed, M., Abaskharoun, N., Roberts, G.: A 4-GHz effective sample rate integrated test core for analog and mixed-signal circuits. IEEE J. Solid-State Circ. 37(4), 499–514 (2002)Rubio, A., et al.: Diseño de circuitos y sistemas integrados, p. 446. Alfaomega, Mexico (2005)Kundert, K., et al.: Design of mixed-signal systems-on-a-chip. IEEE Trans. Comput.-Aided Des. Integr. Circ. Syst. 19(12), 1561–1571 (2000)Hafed, M., Roberts, G.: A stand-alone integrated excitation/extraction systems for analog BIST application. In: IEEE Costum Integrated Circuit Conference, p. 4. IEEE (200)Hafed, M., Roberts, G.: Techniques for high-frequency integrated test and measurement. IEEE Trans. Instrum. Measur. 52(16), 1780–1786 (2003)Hawrysh, E., Roberts, G.: An integration of memory-based analog signal generation into current DFT architectures. IEEE Trans. Instrum. Measur. 47(3), 748–759 (1998)Simancas-García, J.L., Meléndez-Pertuz, F.A., González, R.E.R., Cárdenas, C.A., Collazos-Morales, C.A.: Digital analog converter for the extraction of test signals from mixed integrated circuits. In: Gervasi, Osvaldo, et al. (eds.) ICCSA 2021. LNCS, vol. 12949, pp. 207–223. Springer, Cham (2021). https://doi.org/10.1007/978-3-030-86653-2_15Simancas-García, J.L., Caicedo-Ortiz, J.G.: Modelo computacional de un modulador ∑-∆ de 2° orden para la generación de señales de prueba en circuitos integrados analógicos. INGE@UAN - Tendencias en la Ingeniería 5(9), 43–55 (2014)Simancas-García, J.L.: Diseño de un Amplificador Operacional CMOS de Amplio Ancho de Banda y Alta Ganancia para Aplicaciones de Alta Velocidad. IngeCUC 9(1) (2013)Tokheim, R.: Principios digitales, 3 edn., p. 402. MacGraw-Hill, España (1995)Aziz, P., Sorensen, H., van der Spiegel, J.: An overview of sigma-delta converters: how a 1-bit ADC achieves more than 16-bit resolution. IEEE Signal Process. Mag. 61–84 (1996)LNCS. http://www.numerix-dsp.com/appsnotes/APR8-sigma-delta.pdf495483© 2022 Springer Nature Switzerland AGAtribución-NoComercial-CompartirIgual 4.0 Internacional (CC BY-NC-SA 4.0)https://creativecommons.org/licenses/by-nc-sa/4.0/info:eu-repo/semantics/embargoedAccesshttp://purl.org/coar/access_right/c_f1cfIntegrated analogical signs generator for testing mixed integrated circuitsCapítulo - Parte de Librohttp://purl.org/coar/resource_type/c_3248Textinfo:eu-repo/semantics/bookParthttp://purl.org/redcol/resource_type/CAP_LIBhttp://purl.org/coar/version/c_b1a7d7d4d402bccehttps://link.springer.com/chapter/10.1007/978-3-030-98404-5_45Integrated circuitTestingAnalog and mixed-signal systemsORIGINALIntegrated analogical signs generator for testing mixed integrated circuits.pdfIntegrated analogical signs generator for testing mixed integrated circuits.pdfapplication/pdf42499https://repositorio.cuc.edu.co/bitstream/11323/9253/1/Integrated%20analogical%20signs%20generator%20for%20testing%20mixed%20integrated%20circuits.pdf57975272bf61fcad3a95151df7d503b4MD51open accessLICENSElicense.txtlicense.txttext/plain; charset=utf-83196https://repositorio.cuc.edu.co/bitstream/11323/9253/2/license.txte30e9215131d99561d40d6b0abbe9badMD52open accessTEXTIntegrated analogical signs generator for testing mixed integrated circuits.pdf.txtIntegrated analogical signs generator for testing mixed integrated circuits.pdf.txttext/plain546https://repositorio.cuc.edu.co/bitstream/11323/9253/3/Integrated%20analogical%20signs%20generator%20for%20testing%20mixed%20integrated%20circuits.pdf.txta3f0ed32542abf55e8ddfaaf7cd6755cMD53open accessTHUMBNAILIntegrated analogical signs generator for testing mixed integrated circuits.pdf.jpgIntegrated analogical signs generator for testing mixed integrated circuits.pdf.jpgimage/jpeg7781https://repositorio.cuc.edu.co/bitstream/11323/9253/4/Integrated%20analogical%20signs%20generator%20for%20testing%20mixed%20integrated%20circuits.pdf.jpgf297622f4ed06d1368c276096f7eff2cMD54open access11323/9253oai:repositorio.cuc.edu.co:11323/92532023-12-14 14:17:26.724An error occurred on the license name.|||https://creativecommons.org/licenses/by-nc-sa/4.0/open accessRepositorio Universidad de La Costabdigital@metabiblioteca.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 |