Integrated analogical signs generator for testing mixed integrated circuits
This paper presents the design of a functional block for testing analog and mixed-signal integrated circuits. The objective is that this functional block is embedded into an integrated circuit, IC, to generate the stimuli of the analog functional blocks. The result is a simple block with the ability...
- Autores:
-
Simancas-García, José L.
Meléndez Pertuz, Farid A.
combita, harold
R. González, Ramón E.
Collazos-Morales, Carlos
- Tipo de recurso:
- Part of book
- Fecha de publicación:
- 2022
- Institución:
- Corporación Universidad de la Costa
- Repositorio:
- REDICUC - Repositorio CUC
- Idioma:
- eng
- OAI Identifier:
- oai:repositorio.cuc.edu.co:11323/9253
- Acceso en línea:
- https://hdl.handle.net/11323/9253
https://doi.org/10.1007/978-3-030-98404-5_45
https://repositorio.cuc.edu.co/
- Palabra clave:
- Integrated circuit
Testing
Analog and mixed-signal systems
- Rights
- embargoedAccess
- License
- © 2022 Springer Nature Switzerland AG
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Integrated analogical signs generator for testing mixed integrated circuits |
| title |
Integrated analogical signs generator for testing mixed integrated circuits |
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Integrated analogical signs generator for testing mixed integrated circuits Integrated circuit Testing Analog and mixed-signal systems |
| title_short |
Integrated analogical signs generator for testing mixed integrated circuits |
| title_full |
Integrated analogical signs generator for testing mixed integrated circuits |
| title_fullStr |
Integrated analogical signs generator for testing mixed integrated circuits |
| title_full_unstemmed |
Integrated analogical signs generator for testing mixed integrated circuits |
| title_sort |
Integrated analogical signs generator for testing mixed integrated circuits |
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Simancas-García, José L. Meléndez Pertuz, Farid A. combita, harold R. González, Ramón E. Collazos-Morales, Carlos |
| dc.contributor.author.spa.fl_str_mv |
Simancas-García, José L. Meléndez Pertuz, Farid A. combita, harold R. González, Ramón E. Collazos-Morales, Carlos |
| dc.subject.proposal.eng.fl_str_mv |
Integrated circuit Testing Analog and mixed-signal systems |
| topic |
Integrated circuit Testing Analog and mixed-signal systems |
| description |
This paper presents the design of a functional block for testing analog and mixed-signal integrated circuits. The objective is that this functional block is embedded into an integrated circuit, IC, to generate the stimuli of the analog functional blocks. The result is a simple block with the ability to generate analog stimuli, as evidenced in the simulations carried out. |
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2022 |
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2022-06-14T16:11:29Z |
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2022-06-14T16:11:29Z |
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2022-03-20 |
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Simancas-García, J.L., Meléndez-Pertuz, F.A., Combita-Niño, H., González, R.E.R., Collazos-Morales, C. (2022). Integrated Analogical Signs Generator for Testing Mixed Integrated Circuits. In: Kim, JH., Singh, M., Khan, J., Tiwary, U.S., Sur, M., Singh, D. (eds) Intelligent Human Computer Interaction. IHCI 2021. Lecture Notes in Computer Science, vol 13184. Springer, Cham. https://doi.org/10.1007/978-3-030-98404-5_45 |
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978-3-030-98403-8 |
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https://hdl.handle.net/11323/9253 |
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Corporación Universidad de la Costa |
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Simancas-García, J.L., Meléndez-Pertuz, F.A., Combita-Niño, H., González, R.E.R., Collazos-Morales, C. (2022). Integrated Analogical Signs Generator for Testing Mixed Integrated Circuits. In: Kim, JH., Singh, M., Khan, J., Tiwary, U.S., Sur, M., Singh, D. (eds) Intelligent Human Computer Interaction. IHCI 2021. Lecture Notes in Computer Science, vol 13184. Springer, Cham. https://doi.org/10.1007/978-3-030-98404-5_45 978-3-030-98403-8 10.1007/978-3-030-98404-5_45 Corporación Universidad de la Costa REDICUC - Repositorio CUC 978-3-030-98404-5 |
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Lecture Notes in Computer Science; |
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Intelligent Human Computer Interaction. IHCI 2021. |
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Simancas-García, J.L.: Diagnóstico de Circuitos Integrados Analógicos y de Comunicaciones. INGE@UAN - Tendencias en la Ingeniería 1(2), 7–19 (2011) Zorian, Y.: System-chips test strategies. In: Design Automation Conference (35th: 1998: San Francisco), San Francisco, p. 6. ACM (1998) Hafed, M., Abaskharoun, N., Roberts, G.: A 4-GHz effective sample rate integrated test core for analog and mixed-signal circuits. IEEE J. Solid-State Circ. 37(4), 499–514 (2002) Rubio, A., et al.: Diseño de circuitos y sistemas integrados, p. 446. Alfaomega, Mexico (2005) Kundert, K., et al.: Design of mixed-signal systems-on-a-chip. IEEE Trans. Comput.-Aided Des. Integr. Circ. Syst. 19(12), 1561–1571 (2000) Hafed, M., Roberts, G.: A stand-alone integrated excitation/extraction systems for analog BIST application. In: IEEE Costum Integrated Circuit Conference, p. 4. IEEE (200) Hafed, M., Roberts, G.: Techniques for high-frequency integrated test and measurement. IEEE Trans. Instrum. Measur. 52(16), 1780–1786 (2003) Hawrysh, E., Roberts, G.: An integration of memory-based analog signal generation into current DFT architectures. IEEE Trans. Instrum. Measur. 47(3), 748–759 (1998) Simancas-García, J.L., Meléndez-Pertuz, F.A., González, R.E.R., Cárdenas, C.A., Collazos-Morales, C.A.: Digital analog converter for the extraction of test signals from mixed integrated circuits. In: Gervasi, Osvaldo, et al. (eds.) ICCSA 2021. LNCS, vol. 12949, pp. 207–223. Springer, Cham (2021). https://doi.org/10.1007/978-3-030-86653-2_15 Simancas-García, J.L., Caicedo-Ortiz, J.G.: Modelo computacional de un modulador ∑-∆ de 2° orden para la generación de señales de prueba en circuitos integrados analógicos. INGE@UAN - Tendencias en la Ingeniería 5(9), 43–55 (2014) Simancas-García, J.L.: Diseño de un Amplificador Operacional CMOS de Amplio Ancho de Banda y Alta Ganancia para Aplicaciones de Alta Velocidad. IngeCUC 9(1) (2013) Tokheim, R.: Principios digitales, 3 edn., p. 402. MacGraw-Hill, España (1995) Aziz, P., Sorensen, H., van der Spiegel, J.: An overview of sigma-delta converters: how a 1-bit ADC achieves more than 16-bit resolution. IEEE Signal Process. Mag. 61–84 (1996) LNCS. http://www.numerix-dsp.com/appsnotes/APR8-sigma-delta.pdf |
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Simancas-García, José L.Meléndez Pertuz, Farid A.combita, haroldR. González, Ramón E.Collazos-Morales, Carlos2022-06-14T16:11:29Z2022-06-14T16:11:29Z2022-03-20Simancas-García, J.L., Meléndez-Pertuz, F.A., Combita-Niño, H., González, R.E.R., Collazos-Morales, C. (2022). Integrated Analogical Signs Generator for Testing Mixed Integrated Circuits. In: Kim, JH., Singh, M., Khan, J., Tiwary, U.S., Sur, M., Singh, D. (eds) Intelligent Human Computer Interaction. IHCI 2021. Lecture Notes in Computer Science, vol 13184. Springer, Cham. https://doi.org/10.1007/978-3-030-98404-5_45978-3-030-98403-8https://hdl.handle.net/11323/9253https://doi.org/10.1007/978-3-030-98404-5_4510.1007/978-3-030-98404-5_45Corporación Universidad de la CostaREDICUC - Repositorio CUChttps://repositorio.cuc.edu.co/978-3-030-98404-5This paper presents the design of a functional block for testing analog and mixed-signal integrated circuits. The objective is that this functional block is embedded into an integrated circuit, IC, to generate the stimuli of the analog functional blocks. The result is a simple block with the ability to generate analog stimuli, as evidenced in the simulations carried out.13 páginasapplication/pdfengSpringer, ChamSwitzerlandLecture Notes in Computer Science;Intelligent Human Computer Interaction. IHCI 2021.Simancas-García, J.L.: Diagnóstico de Circuitos Integrados Analógicos y de Comunicaciones. INGE@UAN - Tendencias en la Ingeniería 1(2), 7–19 (2011)Zorian, Y.: System-chips test strategies. In: Design Automation Conference (35th: 1998: San Francisco), San Francisco, p. 6. ACM (1998)Hafed, M., Abaskharoun, N., Roberts, G.: A 4-GHz effective sample rate integrated test core for analog and mixed-signal circuits. IEEE J. Solid-State Circ. 37(4), 499–514 (2002)Rubio, A., et al.: Diseño de circuitos y sistemas integrados, p. 446. Alfaomega, Mexico (2005)Kundert, K., et al.: Design of mixed-signal systems-on-a-chip. IEEE Trans. Comput.-Aided Des. Integr. Circ. Syst. 19(12), 1561–1571 (2000)Hafed, M., Roberts, G.: A stand-alone integrated excitation/extraction systems for analog BIST application. In: IEEE Costum Integrated Circuit Conference, p. 4. IEEE (200)Hafed, M., Roberts, G.: Techniques for high-frequency integrated test and measurement. IEEE Trans. Instrum. Measur. 52(16), 1780–1786 (2003)Hawrysh, E., Roberts, G.: An integration of memory-based analog signal generation into current DFT architectures. IEEE Trans. Instrum. Measur. 47(3), 748–759 (1998)Simancas-García, J.L., Meléndez-Pertuz, F.A., González, R.E.R., Cárdenas, C.A., Collazos-Morales, C.A.: Digital analog converter for the extraction of test signals from mixed integrated circuits. In: Gervasi, Osvaldo, et al. (eds.) ICCSA 2021. LNCS, vol. 12949, pp. 207–223. Springer, Cham (2021). https://doi.org/10.1007/978-3-030-86653-2_15Simancas-García, J.L., Caicedo-Ortiz, J.G.: Modelo computacional de un modulador ∑-∆ de 2° orden para la generación de señales de prueba en circuitos integrados analógicos. INGE@UAN - Tendencias en la Ingeniería 5(9), 43–55 (2014)Simancas-García, J.L.: Diseño de un Amplificador Operacional CMOS de Amplio Ancho de Banda y Alta Ganancia para Aplicaciones de Alta Velocidad. IngeCUC 9(1) (2013)Tokheim, R.: Principios digitales, 3 edn., p. 402. MacGraw-Hill, España (1995)Aziz, P., Sorensen, H., van der Spiegel, J.: An overview of sigma-delta converters: how a 1-bit ADC achieves more than 16-bit resolution. IEEE Signal Process. Mag. 61–84 (1996)LNCS. http://www.numerix-dsp.com/appsnotes/APR8-sigma-delta.pdf495483© 2022 Springer Nature Switzerland AGAtribución-NoComercial-CompartirIgual 4.0 Internacional (CC BY-NC-SA 4.0)https://creativecommons.org/licenses/by-nc-sa/4.0/info:eu-repo/semantics/embargoedAccesshttp://purl.org/coar/access_right/c_f1cfIntegrated analogical signs generator for testing mixed integrated circuitsCapítulo - Parte de Librohttp://purl.org/coar/resource_type/c_3248Textinfo:eu-repo/semantics/bookParthttp://purl.org/redcol/resource_type/CAP_LIBhttp://purl.org/coar/version/c_b1a7d7d4d402bccehttps://link.springer.com/chapter/10.1007/978-3-030-98404-5_45Integrated circuitTestingAnalog and mixed-signal systemsPublicationORIGINALIntegrated analogical signs generator for testing mixed integrated circuits.pdfIntegrated analogical signs generator for testing mixed integrated 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