Integrated analogical signs generator for testing mixed integrated circuits

This paper presents the design of a functional block for testing analog and mixed-signal integrated circuits. The objective is that this functional block is embedded into an integrated circuit, IC, to generate the stimuli of the analog functional blocks. The result is a simple block with the ability...

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Autores:
Simancas-García, José L.
Meléndez Pertuz, Farid A.
combita, harold
R. González, Ramón E.
Collazos-Morales, Carlos
Tipo de recurso:
Part of book
Fecha de publicación:
2022
Institución:
Corporación Universidad de la Costa
Repositorio:
REDICUC - Repositorio CUC
Idioma:
eng
OAI Identifier:
oai:repositorio.cuc.edu.co:11323/9253
Acceso en línea:
https://hdl.handle.net/11323/9253
https://doi.org/10.1007/978-3-030-98404-5_45
https://repositorio.cuc.edu.co/
Palabra clave:
Integrated circuit
Testing
Analog and mixed-signal systems
Rights
embargoedAccess
License
© 2022 Springer Nature Switzerland AG
Description
Summary:This paper presents the design of a functional block for testing analog and mixed-signal integrated circuits. The objective is that this functional block is embedded into an integrated circuit, IC, to generate the stimuli of the analog functional blocks. The result is a simple block with the ability to generate analog stimuli, as evidenced in the simulations carried out.