Using the Wolfe method, we calculated the procurement of optical constants. These constants, absorption coefficient (α), refraction index of (n) and thin film thickness (d ), are significant in the optical characterization of the material. We compared the Wolfe method with the method employed by R. Swanepoel. To estimate the optical constants of semiconductor thin films, we developed a constrained nonlinear programming model, based solely, on known transmission data. Ultimately, we presented a solution to this nonlinear programming model for quadratic programming. Through numerical experiments and transmittance spectral data of Cu3BiS3 thin films, we obtained values of a= 10378.34 cm−1, n = 2.4595, d =989.71 nm and Eg= 1.39 Ev, demonstrating the reliability of the proposed method.

• Autores: Mesa, F.; Unidad de Estudios Universitarios, Universidad del Rosario, Bogotá-Colombia; Ballesteros, V.; Dussan, A.
• Tipo de recurso: Article of journal
• Fecha de publicación: 2014
• Institución: Pontificia Universidad Javeriana
• Repositorio: Repositorio Universidad Javeriana
• Idioma: eng
• OAI Identifier: oai:repository.javeriana.edu.co:10554/31942
• Acceso en línea: http://revistas.javeriana.edu.co/index.php/scientarium/article/view/8396; http://hdl.handle.net/10554/31942
• Palabra clave: null; Cu3BiS3 thin films; optical constants; Wolfe method.; null
• Rights: openAccess
• License: Atribución-NoComercial-SinDerivadas 4.0 Internacional