Performance parameters estimation of Pockels high-voltage sensors by means of numerical optimization
In this paper, a method for performance parameters estimation of Pockels high-voltage sensors by means of numerical optimization is presented. The proposed method integrates a theoretical model for simulation of Pockels sensors, and the optimization algorithm Pattern Search to estimate the model par...
- Autores:
-
Velez Hoyos, Francisco javier
Aristizabal Tique, Victor hugo
Gómez Montoya, Nicolas Alberto
Salazar Escobar, Hernán de Jesús
Flórez Velasquez, Camilo Andrés
- Tipo de recurso:
- Article of journal
- Fecha de publicación:
- 2023
- Institución:
- Universidad Cooperativa de Colombia
- Repositorio:
- Repositorio UCC
- Idioma:
- OAI Identifier:
- oai:repository.ucc.edu.co:20.500.12494/50909
- Acceso en línea:
- https://doi.org/10.1109/TIM.2019.2912590
https://ieeexplore.ieee.org/document/8695761
https://hdl.handle.net/20.500.12494/50909
- Palabra clave:
- ELECTRIC POWER SYSTEM MEASUREMENT
HIGH VOLTAGE
HIGH VOLTAGE TECHNIQUES
NUMERICAL METHODS
NUMERICAL OPTIMIZATIONS
OPTICAL SENSORS
OPTIMIZATION
OPTIMIZATION METHOD
PARAMETER ESTIMATION
POCKELS EFFECT
- Rights
- openAccess
- License
- http://purl.org/coar/access_right/c_abf2
Summary: | In this paper, a method for performance parameters estimation of Pockels high-voltage sensors by means of numerical optimization is presented. The proposed method integrates a theoretical model for simulation of Pockels sensors, and the optimization algorithm Pattern Search to estimate the model parameters in order to minimize the difference between the experimental and theoretical peak-peak output voltage. Two Pockels cells were built and tested for validation of the method, where model parameters estimated by means of numerical optimization were substituted in the theoretical model and compared with the experimental data for the peak-peak output voltage and output voltage in function of time, presenting a high degree of agreement between them, showing that the optimization resulted in a good solution. © 1963-2012 IEEE. |
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